JPS6053067U - Circuit board inspection equipment - Google Patents

Circuit board inspection equipment

Info

Publication number
JPS6053067U
JPS6053067U JP14898483U JP14898483U JPS6053067U JP S6053067 U JPS6053067 U JP S6053067U JP 14898483 U JP14898483 U JP 14898483U JP 14898483 U JP14898483 U JP 14898483U JP S6053067 U JPS6053067 U JP S6053067U
Authority
JP
Japan
Prior art keywords
circuit board
fixing plate
probe fixing
conductive contact
model registration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14898483U
Other languages
Japanese (ja)
Other versions
JPH048384Y2 (en
Inventor
秦 英二
真 斉藤
Original Assignee
株式会社富士通ゼネラル
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社富士通ゼネラル filed Critical 株式会社富士通ゼネラル
Priority to JP14898483U priority Critical patent/JPS6053067U/en
Publication of JPS6053067U publication Critical patent/JPS6053067U/en
Application granted granted Critical
Publication of JPH048384Y2 publication Critical patent/JPH048384Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案の一実施例を概略的に示した斜視図、
第2図および第3図はその作用を説明するための概略的
な側面図である。 図中、1は基台、2はガイド支柱、3はテーブル、4は
回路基板、5は摺動台、6はスプリング、7は軸受、8
はプローブ固定板、9は導電接触ピン、10はエアシリ
ンダ、15は揺動レバー、16は制御ガイド、16aは
第1のガイド溝、1.6bは第2のガイド溝である。 !16a 116a
FIG. 1 is a perspective view schematically showing an embodiment of this invention;
FIGS. 2 and 3 are schematic side views for explaining the operation. In the figure, 1 is a base, 2 is a guide column, 3 is a table, 4 is a circuit board, 5 is a sliding table, 6 is a spring, 7 is a bearing, 8
1 is a probe fixing plate, 9 is a conductive contact pin, 10 is an air cylinder, 15 is a swing lever, 16 is a control guide, 16a is a first guide groove, and 1.6b is a second guide groove. ! 16a 116a

Claims (5)

【実用新案登録請求の範囲】[Scope of utility model registration request] (1)X−Yテーブル等に載置されている回路基板の所
定部位に導電接触ピンを押し当ててその基板上に形成さ
れている回路の導電状態等を検査する回路基板の検査装
置において、 はぼ垂直に立設されたガイド支柱を有する基台と、前記
ガイド支柱に沿って上下動する摺動台と、該摺動台を上
方に向けて付勢するスプリングと、一端が前記摺動台に
枢支され、かつ、他端に前記導電接触ピンを有する°回
動可能なプローブ固定板と、該プローブ固定板を前記摺
動台とともに前記スプリングに抗して押下げて前記導電
接触ピンを前記回路基板上に当接させる駆動手段と、該
駆動手段の動作に関連して、前記導電接触ピンが前記回
路基板に対して接離する際には前記プローブ固定板を特
定角度位置に拘束して前記回路基板に対して前記導電接
触ピ、ンをほぼ垂直に保持するとともに、前記導電接触
ピンと回路基板とが所定距離はなされている場合におい
ては前記の拘束を解いて前記プローブ固定板を回動可能
とするロック手段とを備えていることを特徴とする回路
基板の検査装置。
(1) In a circuit board inspection device that presses a conductive contact pin against a predetermined portion of a circuit board placed on an X-Y table or the like to test the electrical conductivity of a circuit formed on the board, a base having a guide column erected approximately vertically; a slide table that moves up and down along the guide column; a spring that biases the slide table upward; a rotatable probe fixing plate that is pivoted on a stand and has the conductive contact pin at the other end; and the probe fixing plate is pushed down together with the sliding base against the spring to pin the conductive contact pin. a drive means for bringing the probe into contact with the circuit board; and in relation to the operation of the drive means, the probe fixing plate is restrained at a specific angular position when the conductive contact pin moves toward and away from the circuit board. and hold the conductive contact pins substantially perpendicularly to the circuit board, and if the conductive contact pins and the circuit board are separated by a predetermined distance, release the restraint and hold the probe fixing plate. A circuit board inspection device characterized by comprising a locking means that allows rotation.
(2)実用新案登録請求の範囲(1)において、前記駆
動手段は、1つのエアシリンダからなり、該エアシリン
ダは、前記プローブ固定板と、基台との間に介装されて
いることを特徴とする回路基板の検査装置。
(2) Utility model registration In claim (1), the driving means comprises one air cylinder, and the air cylinder is interposed between the probe fixing plate and the base. Features: Circuit board inspection equipment.
(3)実用新案登録請求の範囲(1)において、前記摺
動台には、前記プローブ固定板の前記特定角度位置を調
節するための調節手段が設けられていることを特徴とす
る回路基板の検査装置。
(3) Utility model registration The circuit board according to claim (1), wherein the sliding table is provided with an adjusting means for adjusting the specific angular position of the probe fixing plate. Inspection equipment.
(4)実用新案登録請求の範囲(1)において、前記ロ
ック手段は、前記摺動台に揺動可能に取付けられた揺動
レバーと、該揺動レバーの動作を制御する制御ガイドと
を含み、前記制御ガイドには、前記揺動レバーを前記プ
ローブ固定板に係止させる第1のガイド溝と、その係止
を解く第2のガイド溝とが形成されていることを特徴と
する回路基板の検査装置。
(4) Utility model registration Claim (1) In claim (1), the locking means includes a swinging lever swingably attached to the sliding base, and a control guide that controls the operation of the swinging lever. , wherein the control guide is formed with a first guide groove for locking the swing lever to the probe fixing plate and a second guide groove for releasing the lock. inspection equipment.
(5)実用新案登録請求の範囲(4)において、前記揺
動レバーの上端には鉤部が設けられるとともに、その下
端には前記制御ガイドの従動子が取付けられており、前
記プローブ固定板には前記鉤部と協働する係止孔が穿設
されていることを特徴とする回路基板の検査装置。
(5) Utility model registration In claim (4), a hook portion is provided at the upper end of the swing lever, a follower of the control guide is attached to the lower end of the hook portion, and the follower of the control guide is attached to the probe fixing plate. 2. A circuit board inspection device, characterized in that a locking hole is drilled to cooperate with the hook portion.
JP14898483U 1983-09-20 1983-09-20 Circuit board inspection equipment Granted JPS6053067U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14898483U JPS6053067U (en) 1983-09-20 1983-09-20 Circuit board inspection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14898483U JPS6053067U (en) 1983-09-20 1983-09-20 Circuit board inspection equipment

Publications (2)

Publication Number Publication Date
JPS6053067U true JPS6053067U (en) 1985-04-13
JPH048384Y2 JPH048384Y2 (en) 1992-03-03

Family

ID=30330849

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14898483U Granted JPS6053067U (en) 1983-09-20 1983-09-20 Circuit board inspection equipment

Country Status (1)

Country Link
JP (1) JPS6053067U (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01129672U (en) * 1988-02-19 1989-09-04
JPH0230066U (en) * 1988-04-04 1990-02-26
JP2016121963A (en) * 2014-12-25 2016-07-07 株式会社日本マイクロシステム Press device and in-circuit tester

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01129672U (en) * 1988-02-19 1989-09-04
JPH0230066U (en) * 1988-04-04 1990-02-26
JP2016121963A (en) * 2014-12-25 2016-07-07 株式会社日本マイクロシステム Press device and in-circuit tester

Also Published As

Publication number Publication date
JPH048384Y2 (en) 1992-03-03

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