JPS6117671U - Printed board testing equipment - Google Patents

Printed board testing equipment

Info

Publication number
JPS6117671U
JPS6117671U JP10173984U JP10173984U JPS6117671U JP S6117671 U JPS6117671 U JP S6117671U JP 10173984 U JP10173984 U JP 10173984U JP 10173984 U JP10173984 U JP 10173984U JP S6117671 U JPS6117671 U JP S6117671U
Authority
JP
Japan
Prior art keywords
printed board
board testing
testing equipment
probe
probe pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10173984U
Other languages
Japanese (ja)
Other versions
JPH0416228Y2 (en
Inventor
一 田中
Original Assignee
富士通株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 富士通株式会社 filed Critical 富士通株式会社
Priority to JP10173984U priority Critical patent/JPS6117671U/en
Publication of JPS6117671U publication Critical patent/JPS6117671U/en
Application granted granted Critical
Publication of JPH0416228Y2 publication Critical patent/JPH0416228Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例を示す要部断面図、第2図は
従来のプリント板試験装置の構成図、第3図は要部断面
図を示す。 図において、1はプリント板、2は電子部品、3はテー
ブル、4はマスクボード、5は測定部、6は駆動部、7
は制御部、8は操作台、9はテストデータ、10は半田
、11はマトリックス、12,17はリフタボード、1
3はプローブビン、14はピン、15は線材、16は接
着剤、18′は座グリ孔をを示す。
FIG. 1 is a sectional view of a main part showing an embodiment of the present invention, FIG. 2 is a block diagram of a conventional printed board testing apparatus, and FIG. 3 is a sectional view of a main part. In the figure, 1 is a printed board, 2 is an electronic component, 3 is a table, 4 is a mask board, 5 is a measurement section, 6 is a drive section, 7
is a control unit, 8 is an operating table, 9 is test data, 10 is solder, 11 is a matrix, 12 and 17 are lifter boards, 1
3 is a probe bottle, 14 is a pin, 15 is a wire, 16 is an adhesive, and 18' is a counterbore hole.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 複数の貫通孔を有するマトリックスと、該貫通孔にスラ
イド可能に保持されたプローブピンと、該プローブビン
を突出させるピンを有するリフタボードとを備え、該リ
フタボードを移動させることにより被試験用プリント板
の所定箇所に該ブローブピンを当接させ、該プローブピ
ンを介して所定のテスト信号を人出するプリン1・板試
験装置であって、前記リフタボードの所定箇所には必要
に応じて前記ビンが増加できるよう座グリ孔が設けられ
て成ることを特徴とするプリント板試験装置。
The matrix includes a matrix having a plurality of through holes, a probe pin slidably held in the through hole, and a lifter board having a pin for protruding the probe bin, and by moving the lifter board, the printed board to be tested can be placed in a predetermined position. The probe pin is brought into contact with a location and a predetermined test signal is outputted through the probe pin. A printed board testing device characterized by being provided with a counterbore hole.
JP10173984U 1984-07-05 1984-07-05 Printed board testing equipment Granted JPS6117671U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10173984U JPS6117671U (en) 1984-07-05 1984-07-05 Printed board testing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10173984U JPS6117671U (en) 1984-07-05 1984-07-05 Printed board testing equipment

Publications (2)

Publication Number Publication Date
JPS6117671U true JPS6117671U (en) 1986-02-01
JPH0416228Y2 JPH0416228Y2 (en) 1992-04-10

Family

ID=30661154

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10173984U Granted JPS6117671U (en) 1984-07-05 1984-07-05 Printed board testing equipment

Country Status (1)

Country Link
JP (1) JPS6117671U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10838033B2 (en) 2018-03-19 2020-11-17 Toshiba Memory Corporation Tester calibration device and tester calibration method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10838033B2 (en) 2018-03-19 2020-11-17 Toshiba Memory Corporation Tester calibration device and tester calibration method

Also Published As

Publication number Publication date
JPH0416228Y2 (en) 1992-04-10

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