JPS6117671U - Printed board testing equipment - Google Patents
Printed board testing equipmentInfo
- Publication number
- JPS6117671U JPS6117671U JP10173984U JP10173984U JPS6117671U JP S6117671 U JPS6117671 U JP S6117671U JP 10173984 U JP10173984 U JP 10173984U JP 10173984 U JP10173984 U JP 10173984U JP S6117671 U JPS6117671 U JP S6117671U
- Authority
- JP
- Japan
- Prior art keywords
- printed board
- board testing
- testing equipment
- probe
- probe pin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図は本考案の一実施例を示す要部断面図、第2図は
従来のプリント板試験装置の構成図、第3図は要部断面
図を示す。
図において、1はプリント板、2は電子部品、3はテー
ブル、4はマスクボード、5は測定部、6は駆動部、7
は制御部、8は操作台、9はテストデータ、10は半田
、11はマトリックス、12,17はリフタボード、1
3はプローブビン、14はピン、15は線材、16は接
着剤、18′は座グリ孔をを示す。FIG. 1 is a sectional view of a main part showing an embodiment of the present invention, FIG. 2 is a block diagram of a conventional printed board testing apparatus, and FIG. 3 is a sectional view of a main part. In the figure, 1 is a printed board, 2 is an electronic component, 3 is a table, 4 is a mask board, 5 is a measurement section, 6 is a drive section, 7
is a control unit, 8 is an operating table, 9 is test data, 10 is solder, 11 is a matrix, 12 and 17 are lifter boards, 1
3 is a probe bottle, 14 is a pin, 15 is a wire, 16 is an adhesive, and 18' is a counterbore hole.
Claims (1)
イド可能に保持されたプローブピンと、該プローブビン
を突出させるピンを有するリフタボードとを備え、該リ
フタボードを移動させることにより被試験用プリント板
の所定箇所に該ブローブピンを当接させ、該プローブピ
ンを介して所定のテスト信号を人出するプリン1・板試
験装置であって、前記リフタボードの所定箇所には必要
に応じて前記ビンが増加できるよう座グリ孔が設けられ
て成ることを特徴とするプリント板試験装置。The matrix includes a matrix having a plurality of through holes, a probe pin slidably held in the through hole, and a lifter board having a pin for protruding the probe bin, and by moving the lifter board, the printed board to be tested can be placed in a predetermined position. The probe pin is brought into contact with a location and a predetermined test signal is outputted through the probe pin. A printed board testing device characterized by being provided with a counterbore hole.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10173984U JPS6117671U (en) | 1984-07-05 | 1984-07-05 | Printed board testing equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10173984U JPS6117671U (en) | 1984-07-05 | 1984-07-05 | Printed board testing equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6117671U true JPS6117671U (en) | 1986-02-01 |
JPH0416228Y2 JPH0416228Y2 (en) | 1992-04-10 |
Family
ID=30661154
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10173984U Granted JPS6117671U (en) | 1984-07-05 | 1984-07-05 | Printed board testing equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6117671U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10838033B2 (en) | 2018-03-19 | 2020-11-17 | Toshiba Memory Corporation | Tester calibration device and tester calibration method |
-
1984
- 1984-07-05 JP JP10173984U patent/JPS6117671U/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10838033B2 (en) | 2018-03-19 | 2020-11-17 | Toshiba Memory Corporation | Tester calibration device and tester calibration method |
Also Published As
Publication number | Publication date |
---|---|
JPH0416228Y2 (en) | 1992-04-10 |
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