JPS6197773U - - Google Patents
Info
- Publication number
- JPS6197773U JPS6197773U JP18299084U JP18299084U JPS6197773U JP S6197773 U JPS6197773 U JP S6197773U JP 18299084 U JP18299084 U JP 18299084U JP 18299084 U JP18299084 U JP 18299084U JP S6197773 U JPS6197773 U JP S6197773U
- Authority
- JP
- Japan
- Prior art keywords
- contact
- contact pin
- selection plate
- printed circuit
- circuit board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 claims description 5
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
第１図は本考案の一実施例を示すプリント回路
基板の検査装置の一部切欠き側面図、第２図はそ
の一部切欠き正面図、第３図はコンタクトピン退
入時の要部拡大断面図、第４図はコンタクトピン
突出時の要部拡大断面図、第５図は別実施例の要
部拡大断面図である。
２……プリント回路基板、３…プリント回路基
板の枠体、１０…コンタクトピン取付台、１３…
コンタクトピン、１７…可動枠、２１…コンタク
トピン選択プレート、２３…接触子、２５…穴。
Fig. 1 is a partially cutaway side view of a printed circuit board inspection device showing an embodiment of the present invention, Fig. 2 is a partially cutaway front view thereof, and Fig. 3 is the main part of the contact pin when it is retracted. FIG. 4 is an enlarged sectional view of the main part when the contact pin is protruding, and FIG. 5 is an enlarged sectional view of the main part of another embodiment. 2... Printed circuit board, 3... Frame of printed circuit board, 10... Contact pin mounting base, 13...
Contact pin, 17... Movable frame, 21... Contact pin selection plate, 23... Contact, 25... Hole.
Claims (1)
れを支持した枠体３を前後左右に位置決めして保
持する基板保持手段の下方に、コンタクトピン取
付台１０を固定配置し、コンタクトピン取付台１
０には多数のコンタクトピン１３を前後左右に所
定ピツチで配列装備するとともに、各コンタクト
ピン１３を上下方向に出退自在にかつ下方退入付
勢状態に取付け、コンタクトピン取付台１０の下
方には駆動昇降される可動枠１７を配備するとと
もに、この可動枠１７に、前記コンタクトピン１
３群のうちの所定のコンタクトピン１３の下端に
接当して電気的に接続される接触子２３を備えた
コンタクトピン選択プレート２１を着脱自在に取
付け、かつ、接解子２３が対応するコンタクトピ
ン１３を接当して突き上げ上昇させた状態におい
て他のコンタクトピン１３群とコンタクトピン選
択プレート２１とが接触するのを回避する空間を
形成してあるプリント回路基板の検査装置。 (2) 前記接触回避用の空間がコンタクトピン選
択プレート２１に穿設した穴２５として構成され
ている実用新案登録請求の範囲第１項記載のプリ
ント回路基板の検査装置。 (3) 前記接触回避用の空間が、コンタクトピン
選択プレート２１上に突設された接触子２３の上
端と、選択プレート２１の上面との間の段差空間
として構成されている実用新案登録請求の範囲第
１項記載のプリント回路基板の検査装置。 (4) 接触子２３の上端２３ａを尖鋭な凹凸形状
にしてある実用新案登録請求の範囲第１項ないし
第３項のうちいずれかに記載のプリント回路基板
の検査装置。[Claims for Utility Model Registration] (1) A contact pin mount 10 is fixedly disposed below a board holding means that positions and holds the printed circuit board 2 alone or the frame 3 supporting it in the front, back, left, and right directions. and contact pin mounting base 1
0 is equipped with a large number of contact pins 13 arranged at a predetermined pitch in the front, rear, left, and right directions, and each contact pin 13 is installed so that it can move in and out in the vertical direction and is biased toward downward retraction. is equipped with a movable frame 17 that is driven up and down, and the contact pin 1 is attached to this movable frame 17.
A contact pin selection plate 21 equipped with a contact 23 that comes into contact with the lower end of a predetermined contact pin 13 of the three groups to be electrically connected is removably attached, and the contact pin 23 corresponds to the contact pin selection plate 21. This is a printed circuit board inspection device in which a space is formed to avoid contact between another group of contact pins 13 and a contact pin selection plate 21 when the pins 13 are brought into contact and pushed up. (2) The printed circuit board inspection device according to claim 1, wherein the contact avoidance space is configured as a hole 25 formed in the contact pin selection plate 21. (3) The space for avoiding contact is configured as a stepped space between the upper end of the contactor 23 protrudingly provided on the contact pin selection plate 21 and the upper surface of the selection plate 21. A printed circuit board inspection device according to scope 1. (4) The printed circuit board inspection device according to any one of claims 1 to 3, wherein the upper end 23a of the contactor 23 has a sharp uneven shape.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18299084U JPS6197773U (en) | 1984-11-30 | 1984-11-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18299084U JPS6197773U (en) | 1984-11-30 | 1984-11-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6197773U true JPS6197773U (en) | 1986-06-23 |
Family
ID=30740512
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18299084U Pending JPS6197773U (en) | 1984-11-30 | 1984-11-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6197773U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH043364U (en) * | 1990-04-25 | 1992-01-13 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5666768A (en) * | 1979-11-02 | 1981-06-05 | Hitachi Ltd | Tool for in-circuit tester |
| JPS59120968A (en) * | 1982-12-28 | 1984-07-12 | Fujitsu Ltd | Fixture device for test of parts |
-
1984
- 1984-11-30 JP JP18299084U patent/JPS6197773U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5666768A (en) * | 1979-11-02 | 1981-06-05 | Hitachi Ltd | Tool for in-circuit tester |
| JPS59120968A (en) * | 1982-12-28 | 1984-07-12 | Fujitsu Ltd | Fixture device for test of parts |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH043364U (en) * | 1990-04-25 | 1992-01-13 |
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