JPS63187073U - - Google Patents
Info
- Publication number
- JPS63187073U JPS63187073U JP7825387U JP7825387U JPS63187073U JP S63187073 U JPS63187073 U JP S63187073U JP 7825387 U JP7825387 U JP 7825387U JP 7825387 U JP7825387 U JP 7825387U JP S63187073 U JPS63187073 U JP S63187073U
- Authority
- JP
- Japan
- Prior art keywords
- jig
- support part
- probe
- supporting
- probing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 9
- 238000007689 inspection Methods 0.000 description 2
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Description
第1図は本考案の1実施例の斜視図。第2図は
同じく断面図、第3図は同じく方向を90°変え
た断面図である。また第4図は従来のプロービン
グ治具の例の斜視図であり、第5図はその断面図
である。第6図は本考案の別の実施例の断面図で
ある。
1……プローブ支持部、2……治具支持部、3
……ベース部、4……案内ピン、5……案内ブツ
シユ、6……プローブ支持部固定ねじ、7……位
置決め用ロツド棒、8……ピンプローブ、9……
検査対象物、10,11……検査対象物案内ピン
、12……電気特性検査機、13……位置決め用
案内ピン。
FIG. 1 is a perspective view of one embodiment of the present invention. FIG. 2 is a sectional view, and FIG. 3 is a sectional view with the direction changed by 90°. Further, FIG. 4 is a perspective view of an example of a conventional probing jig, and FIG. 5 is a sectional view thereof. FIG. 6 is a sectional view of another embodiment of the present invention. 1...Probe support part, 2...Jig support part, 3
... Base part, 4 ... Guide pin, 5 ... Guide bush, 6 ... Probe support fixing screw, 7 ... Positioning rod, 8 ... Pin probe, 9 ...
Inspection object, 10, 11... Inspection object guide pin, 12... Electric property testing machine, 13... Positioning guide pin.
Claims (1)
ビング治具において、検査対象を支持、位置決め
するベースと、ピンプローブを支持するプローブ
支持部と、該プローブ支持部を支持する治具支持
部の3つの部分から構成されることを特徴とする
プロービング治具の構造。 (2) 前記プロービング治具において、プローブ
支持部が、複数個あることを特徴とする実用新案
登録請求の範囲第1項記載のプロービング治具の
構造。 (3) 前記プロービング治具において、プローブ
支持部が、治具支持部と独立して、ベースと位置
決め出来ることを特徴とする実用新案登録請求の
範囲第1項記載のプロービング治具の構造。[Claims for Utility Model Registration] (1) A probing jig used for testing the electrical characteristics of circuit boards, etc., comprising a base for supporting and positioning the test object, a probe support part for supporting a pin probe, and a probe support part for supporting a pin probe. A structure of a probing jig characterized in that it is composed of three parts: a supporting jig support part. (2) The structure of the probing jig according to claim 1, wherein the probing jig includes a plurality of probe supporting parts. (3) The structure of the probing jig according to claim 1, wherein in the probing jig, the probe support part can be positioned with respect to the base independently of the jig support part.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7825387U JPS63187073U (en) | 1987-05-25 | 1987-05-25 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7825387U JPS63187073U (en) | 1987-05-25 | 1987-05-25 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63187073U true JPS63187073U (en) | 1988-11-30 |
Family
ID=30927022
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7825387U Pending JPS63187073U (en) | 1987-05-25 | 1987-05-25 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63187073U (en) |
-
1987
- 1987-05-25 JP JP7825387U patent/JPS63187073U/ja active Pending
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