JPS648672U - - Google Patents

Info

Publication number
JPS648672U
JPS648672U JP10364687U JP10364687U JPS648672U JP S648672 U JPS648672 U JP S648672U JP 10364687 U JP10364687 U JP 10364687U JP 10364687 U JP10364687 U JP 10364687U JP S648672 U JPS648672 U JP S648672U
Authority
JP
Japan
Prior art keywords
hole
electronic circuit
probe
support plate
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10364687U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10364687U priority Critical patent/JPS648672U/ja
Publication of JPS648672U publication Critical patent/JPS648672U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例を示す検査装置の斜
視図、第2図及び第3図は第1図装置の動作を説
明する第1図のA−B−C−D線に沿つた断面図
、第4図は従来の検査装置の斜視図、第5図は第
4図の断面図である。 1……基板、2……検査用触子、4……支持板
、5……透孔、8……被検装置、11……固定ブ
ロツク、12……可動押圧ブロツク。
Fig. 1 is a perspective view of an inspection device showing an embodiment of the present invention, and Figs. 2 and 3 are views taken along line A-B-C-D in Fig. 1 to explain the operation of the device shown in Fig. 1. 4 is a perspective view of a conventional inspection device, and FIG. 5 is a sectional view of FIG. 4. DESCRIPTION OF SYMBOLS 1...Substrate, 2...Touch for inspection, 4...Support plate, 5...Through hole, 8...Test device, 11...Fixed block, 12...Movable pressing block.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 透孔が穿設され、一方の透孔開口面を横切る位
置に固定ブロツク及び可動ブロツクを対向配置し
た支持板の他の面側に、検査用触子を突設した基
板を、触子遊端が透孔から突出退入自在に配置し
たことを特徴とする電子回路の検査装置。
On the other side of a support plate in which a through hole is bored and a fixed block and a movable block are arranged opposite to each other at a position crossing one of the through hole opening surfaces, a substrate with an inspection probe projecting thereon is placed at the free end of the probe. An electronic circuit inspection device characterized in that an electronic circuit is arranged such that it can protrude from and go in and out of a through hole.
JP10364687U 1987-07-06 1987-07-06 Pending JPS648672U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10364687U JPS648672U (en) 1987-07-06 1987-07-06

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10364687U JPS648672U (en) 1987-07-06 1987-07-06

Publications (1)

Publication Number Publication Date
JPS648672U true JPS648672U (en) 1989-01-18

Family

ID=31334668

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10364687U Pending JPS648672U (en) 1987-07-06 1987-07-06

Country Status (1)

Country Link
JP (1) JPS648672U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015045603A (en) * 2013-08-29 2015-03-12 日置電機株式会社 Circuit board inspection device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58197888A (en) * 1982-05-14 1983-11-17 Nippon Denso Co Ltd Module type solar battery provided with storage system
JPS58216476A (en) * 1982-06-11 1983-12-16 Hitachi Ltd Photoelectric-generating storage device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58197888A (en) * 1982-05-14 1983-11-17 Nippon Denso Co Ltd Module type solar battery provided with storage system
JPS58216476A (en) * 1982-06-11 1983-12-16 Hitachi Ltd Photoelectric-generating storage device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015045603A (en) * 2013-08-29 2015-03-12 日置電機株式会社 Circuit board inspection device

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