JPS6296578U - - Google Patents
Info
- Publication number
- JPS6296578U JPS6296578U JP18758185U JP18758185U JPS6296578U JP S6296578 U JPS6296578 U JP S6296578U JP 18758185 U JP18758185 U JP 18758185U JP 18758185 U JP18758185 U JP 18758185U JP S6296578 U JPS6296578 U JP S6296578U
- Authority
- JP
- Japan
- Prior art keywords
- pin
- contact probe
- board
- conductor
- hole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 7
- 239000004020 conductor Substances 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Tests Of Electronic Circuits (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
第１図は、本考案によるコンタクトプローブの
拡大断面図、第２図は、本考案の他の実施例を示
す図、第３図は、既に提案されているコンタクト
プローブを使用した回路検査装置の要部を示す断
面図、第４図は、既に提案されているコンタクト
プローブの拡大断面図、第５図は、同上平面図で
ある。
２……ピンボード、３……コネクタ保持板、４
……接触プローブ、５……接地ピン、９，１０…
…導通ピン、１５，１６……アースピン、２０…
…導電体、２１……透孔、２２……シグナル接触
ピン。
FIG. 1 is an enlarged sectional view of a contact probe according to the present invention, FIG. 2 is a diagram showing another embodiment of the present invention, and FIG. 3 is a diagram of a circuit testing device using an already proposed contact probe. FIG. 4 is an enlarged sectional view of a contact probe that has already been proposed, and FIG. 5 is a plan view of the same. 2...Pin board, 3...Connector holding plate, 4
...Contact probe, 5...Ground pin, 9,10...
...Conduction pin, 15, 16...Earth pin, 20...
...Conductor, 21...Through hole, 22...Signal contact pin.
Claims (1)
有する導電体を設け、この導電体及びピンボード
に外筒導体を備えた接触プローブ及び接地ピンを
嵌装し、上記透孔の位置する上記ピンボードにシ
グナル接触ピンを嵌装したことを特徴とするコン
タクトプローブ。 ２ ピンボードの上面に導電回路、プリント基板
若しくは金属板を設けたことを特徴とする実用新
案登録請求の範囲第１項記載のコンタクトプロー
ブ。[Claims for Utility Model Registration] 1. A conductor having a through hole is provided on at least one side of an insulating pin board, and a contact probe with an outer cylindrical conductor and a ground pin are fitted to the conductor and the pin board. , A contact probe characterized in that a signal contact pin is fitted into the pin board where the through hole is located. 2. The contact probe according to claim 1, which is a registered utility model, characterized in that a conductive circuit, a printed circuit board, or a metal plate is provided on the upper surface of the pin board.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985187581U JPH0521020Y2 (en) | 1985-12-05 | 1985-12-05 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985187581U JPH0521020Y2 (en) | 1985-12-05 | 1985-12-05 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6296578U true JPS6296578U (en) | 1987-06-19 |
| JPH0521020Y2 JPH0521020Y2 (en) | 1993-05-31 |
Family
ID=31138170
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985187581U Expired - Lifetime JPH0521020Y2 (en) | 1985-12-05 | 1985-12-05 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0521020Y2 (en) |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02163952A (en) * | 1988-12-16 | 1990-06-25 | Sanyo Electric Co Ltd | Measuring apparatus of semiconductor device |
| WO2003067268A1 (en) * | 2002-02-07 | 2003-08-14 | Yokowo Co., Ltd. | Capacity load type probe, and test jig using the same |
| JP2004523757A (en) * | 2001-03-13 | 2004-08-05 | スリーエム イノベイティブ プロパティズ カンパニー | High bandwidth probe assembly |
| JP2007178163A (en) * | 2005-12-27 | 2007-07-12 | Yokowo Co Ltd | Inspection unit and outer sheath tube assembly for inspection probe used for it |
| JP2008145238A (en) * | 2006-12-08 | 2008-06-26 | Micronics Japan Co Ltd | Electrical connection apparatus and electric connection device using it |
| JP2008177554A (en) * | 2006-12-21 | 2008-07-31 | Ngk Spark Plug Co Ltd | Multilayer wiring board, and power supply structure to be embedded in multilayer wiring board |
| JP2011252766A (en) * | 2010-06-01 | 2011-12-15 | 3M Innovative Properties Co | Contact holder |
| WO2017060946A1 (en) * | 2015-10-05 | 2017-04-13 | ユニテクノ株式会社 | Inspection substrate |
| WO2020137863A1 (en) * | 2018-12-26 | 2020-07-02 | 株式会社日本マイクロニクス | Electrical connecting device |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5728379U (en) * | 1980-07-23 | 1982-02-15 | ||
| JPS5839574U (en) * | 1981-09-09 | 1983-03-15 | クラリオン株式会社 | Printed circuit board inspection jig |
| JPS58175273A (en) * | 1982-04-07 | 1983-10-14 | 沖電気工業株式会社 | Coaxial movable contact probe |
| JPS5974364U (en) * | 1982-11-12 | 1984-05-19 | 日本電気株式会社 | Adapter for continuity testing of circuit boards |
| JPS6082271U (en) * | 1983-11-09 | 1985-06-07 | 株式会社アドバンテスト | coaxial probe contact |
| JPS60160136U (en) * | 1984-04-04 | 1985-10-24 | 株式会社 みかど育種農場 | Covering material for plant cultivation |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| BE806098A (en) * | 1973-03-28 | 1974-02-01 | Siemens Ag | PROCESS FOR MANUFACTURING SILICON OR OTHER VERY PURE SEMI-CONDUCTIVE MATERIAL |
| GB1573154A (en) * | 1977-03-01 | 1980-08-13 | Pilkington Brothers Ltd | Coating glass |
-
1985
- 1985-12-05 JP JP1985187581U patent/JPH0521020Y2/ja not_active Expired - Lifetime
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5728379U (en) * | 1980-07-23 | 1982-02-15 | ||
| JPS5839574U (en) * | 1981-09-09 | 1983-03-15 | クラリオン株式会社 | Printed circuit board inspection jig |
| JPS58175273A (en) * | 1982-04-07 | 1983-10-14 | 沖電気工業株式会社 | Coaxial movable contact probe |
| JPS5974364U (en) * | 1982-11-12 | 1984-05-19 | 日本電気株式会社 | Adapter for continuity testing of circuit boards |
| JPS6082271U (en) * | 1983-11-09 | 1985-06-07 | 株式会社アドバンテスト | coaxial probe contact |
| JPS60160136U (en) * | 1984-04-04 | 1985-10-24 | 株式会社 みかど育種農場 | Covering material for plant cultivation |
Cited By (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02163952A (en) * | 1988-12-16 | 1990-06-25 | Sanyo Electric Co Ltd | Measuring apparatus of semiconductor device |
| JP2004523757A (en) * | 2001-03-13 | 2004-08-05 | スリーエム イノベイティブ プロパティズ カンパニー | High bandwidth probe assembly |
| WO2003067268A1 (en) * | 2002-02-07 | 2003-08-14 | Yokowo Co., Ltd. | Capacity load type probe, and test jig using the same |
| US7233156B2 (en) | 2002-02-07 | 2007-06-19 | Yokowo Co., Ltd. | Capacity load type probe, and test jig using the same |
| JP2007178163A (en) * | 2005-12-27 | 2007-07-12 | Yokowo Co Ltd | Inspection unit and outer sheath tube assembly for inspection probe used for it |
| JP2008145238A (en) * | 2006-12-08 | 2008-06-26 | Micronics Japan Co Ltd | Electrical connection apparatus and electric connection device using it |
| JP2008177554A (en) * | 2006-12-21 | 2008-07-31 | Ngk Spark Plug Co Ltd | Multilayer wiring board, and power supply structure to be embedded in multilayer wiring board |
| US8911266B2 (en) | 2010-06-01 | 2014-12-16 | 3M Innovative Properties Company | Contact holder |
| JP2011252766A (en) * | 2010-06-01 | 2011-12-15 | 3M Innovative Properties Co | Contact holder |
| WO2017060946A1 (en) * | 2015-10-05 | 2017-04-13 | ユニテクノ株式会社 | Inspection substrate |
| WO2020137863A1 (en) * | 2018-12-26 | 2020-07-02 | 株式会社日本マイクロニクス | Electrical connecting device |
| JP2020106296A (en) * | 2018-12-26 | 2020-07-09 | 株式会社日本マイクロニクス | Electrical connection device |
| TWI723698B (en) * | 2018-12-26 | 2021-04-01 | 日商日本麥克隆尼股份有限公司 | Electrically connecting device |
| KR20210095677A (en) * | 2018-12-26 | 2021-08-02 | 가부시키가이샤 니혼 마이크로닉스 | electrical connection device |
| CN113260868A (en) * | 2018-12-26 | 2021-08-13 | 日本麦可罗尼克斯股份有限公司 | Electrical connection device |
| US11828773B2 (en) | 2018-12-26 | 2023-11-28 | Kabushiki Kaisha Nihon Micronics | Electrical connecting device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0521020Y2 (en) | 1993-05-31 |