JPH0325174U - - Google Patents

Info

Publication number
JPH0325174U
JPH0325174U JP8449989U JP8449989U JPH0325174U JP H0325174 U JPH0325174 U JP H0325174U JP 8449989 U JP8449989 U JP 8449989U JP 8449989 U JP8449989 U JP 8449989U JP H0325174 U JPH0325174 U JP H0325174U
Authority
JP
Japan
Prior art keywords
recess
edge
faces
lead terminal
probes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8449989U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8449989U priority Critical patent/JPH0325174U/ja
Publication of JPH0325174U publication Critical patent/JPH0325174U/ja
Pending legal-status Critical Current

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Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の実施例を示すIC用測定治具
の斜視図、第2図はIC用測定治具の使用状態を
示す斜視図である。 1…IC用測定治具、2…IC、4…凹部、5
…リード端子、6…縁部、7…プローブ用穴、8
…プローブ。
FIG. 1 is a perspective view of an IC measuring jig showing an embodiment of the present invention, and FIG. 2 is a perspective view showing the IC measuring jig in use. 1... IC measurement jig, 2... IC, 4... recess, 5
…Lead terminal, 6…Edge, 7…Probe hole, 8
…probe.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] IC2が位置決めできる凹部4と、この凹部4
を介して前記IC2に重ねられIC2のリード端
子5面に被さる縁部6とを備えて絶縁部材で形成
し、前記縁部6にIC2のリード端子5面ごとに
対応するプローブ8用穴7を設けてなることを特
徴とするIC用測定治具。
A recess 4 in which the IC 2 can be positioned, and this recess 4
It is formed of an insulating material and has an edge 6 that is stacked on the IC 2 and covers the 5 faces of the lead terminal of the IC 2 via the rim 6, and holes 7 for probes 8 are provided in the edge 6 to correspond to each of the 5 faces of the lead terminal of the IC 2. A measurement jig for IC characterized by comprising:
JP8449989U 1989-07-20 1989-07-20 Pending JPH0325174U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8449989U JPH0325174U (en) 1989-07-20 1989-07-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8449989U JPH0325174U (en) 1989-07-20 1989-07-20

Publications (1)

Publication Number Publication Date
JPH0325174U true JPH0325174U (en) 1991-03-14

Family

ID=31633026

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8449989U Pending JPH0325174U (en) 1989-07-20 1989-07-20

Country Status (1)

Country Link
JP (1) JPH0325174U (en)

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