JPH01118369U - - Google Patents
Info
- Publication number
- JPH01118369U JPH01118369U JP1142788U JP1142788U JPH01118369U JP H01118369 U JPH01118369 U JP H01118369U JP 1142788 U JP1142788 U JP 1142788U JP 1142788 U JP1142788 U JP 1142788U JP H01118369 U JPH01118369 U JP H01118369U
- Authority
- JP
- Japan
- Prior art keywords
- terminal
- probe
- insulator
- utility
- scope
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 13
- 239000012212 insulator Substances 0.000 claims description 3
- 238000005259 measurement Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Measuring Leads Or Probes (AREA)
Description
第1図は本考案の一実施例の図、第2図は、第
1図の実施例のプローブを実装した場合の断面図
、第3図は、実施例2の図、第4図は、第3図の
実施例のプローブを実装した場合の断面図である
。
1……プローブ端子(ICと接続される部分)
、2……プローブ端子(計測器と接続される部分
)、3……絶縁体、4……ソケツト端子、5……
IC端子、6……プローブ端子(ICと接続され
る部分)、7……プローブ端子(計測器と接続さ
れる部分)、8……ソケツト、9……プローブ端
子(ICと接続される部分)、10……プローブ
端子(計測器と接続する部分)、11……絶縁体
、12……ソケツト端子、13……IC端子、1
4……プローブ端子(ICと接続する部分)、1
5……プローブ端子(計測器と接続する部分)、
16……プローブ端子(隣のプローブ)。
Fig. 1 is a diagram of one embodiment of the present invention, Fig. 2 is a sectional view when the probe of the embodiment of Fig. 1 is mounted, Fig. 3 is a diagram of Embodiment 2, and Fig. 4 is: FIG. 4 is a sectional view when the probe of the embodiment shown in FIG. 3 is mounted; 1...Probe terminal (part connected to IC)
, 2...Probe terminal (part connected to measuring instrument), 3...Insulator, 4...Socket terminal, 5...
IC terminal, 6... Probe terminal (part connected to IC), 7... Probe terminal (part connected to measuring instrument), 8... Socket, 9... Probe terminal (part connected to IC) , 10...Probe terminal (portion connected to measuring instrument), 11...Insulator, 12...Socket terminal, 13...IC terminal, 1
4... Probe terminal (portion connected to IC), 1
5... Probe terminal (the part that connects to the measuring instrument),
16... Probe terminal (adjacent probe).
Claims (1)
ツト端子と、IC端子との間に挿入可能な形状を
もつことを特徴とする計測用プローブ。 A measurement probe characterized in that it is connected at equal intervals by an insulator and has a shape that can be inserted between an IC socket terminal and an IC terminal.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1142788U JPH01118369U (en) | 1988-01-29 | 1988-01-29 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1142788U JPH01118369U (en) | 1988-01-29 | 1988-01-29 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01118369U true JPH01118369U (en) | 1989-08-10 |
Family
ID=31219970
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1142788U Pending JPH01118369U (en) | 1988-01-29 | 1988-01-29 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01118369U (en) |
-
1988
- 1988-01-29 JP JP1142788U patent/JPH01118369U/ja active Pending