JPH0217679U - - Google Patents
Info
- Publication number
- JPH0217679U JPH0217679U JP9607388U JP9607388U JPH0217679U JP H0217679 U JPH0217679 U JP H0217679U JP 9607388 U JP9607388 U JP 9607388U JP 9607388 U JP9607388 U JP 9607388U JP H0217679 U JPH0217679 U JP H0217679U
- Authority
- JP
- Japan
- Prior art keywords
- circuit board
- probe
- board inspection
- inspection device
- conductive rubber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 6
- 238000007689 inspection Methods 0.000 claims 5
- 239000011162 core material Substances 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
- 230000003014 reinforcing effect Effects 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Description
第1図はこの考案の一実施例を示した側面図、
第2図はこの考案の他の実施例を示した側面図で
ある。
図中、1は接続基板、2,2Aはプローブ、3
は被検査回路基板、4はIC、5は補強メンバー
である。
Figure 1 is a side view showing an embodiment of this invention.
FIG. 2 is a side view showing another embodiment of this invention. In the figure, 1 is a connection board, 2 and 2A are probes, and 3
1 is a circuit board to be inspected, 4 is an IC, and 5 is a reinforcing member.
Claims (1)
ーブを備えている回路基板検査装置において、 上記プローブは導電性を備えたゴム弾性体から
なることを特徴とする回路基板検査装置。 (2) 上記プローブは導電性ゴムからなる請求項
1記載の回路基板検査装置。 (3) 上記プローブは導電性の芯材を埋設してな
るゴムコネクタからなる請求項1記載の回路基板
検査装置。 (4) 上記プローブは少なくとも2つの測定ポイ
ントに跨るように形成されている請求項1記載の
回路基板検査装置。[Claims for Utility Model Registration] (1) A circuit board inspection device equipped with a probe that comes into contact with a predetermined part of a circuit board to be inspected, characterized in that the probe is made of a conductive rubber elastic body. Circuit board inspection equipment. (2) The circuit board inspection device according to claim 1, wherein the probe is made of conductive rubber. (3) The circuit board inspection device according to claim 1, wherein the probe comprises a rubber connector having a conductive core material embedded therein. (4) The circuit board inspection device according to claim 1, wherein the probe is formed so as to span at least two measurement points.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9607388U JPH0217679U (en) | 1988-07-20 | 1988-07-20 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9607388U JPH0217679U (en) | 1988-07-20 | 1988-07-20 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0217679U true JPH0217679U (en) | 1990-02-05 |
Family
ID=31320874
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9607388U Pending JPH0217679U (en) | 1988-07-20 | 1988-07-20 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0217679U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008241346A (en) * | 2007-03-26 | 2008-10-09 | Fujitsu Ltd | Probe and measuring instrument using it |
-
1988
- 1988-07-20 JP JP9607388U patent/JPH0217679U/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008241346A (en) * | 2007-03-26 | 2008-10-09 | Fujitsu Ltd | Probe and measuring instrument using it |
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