JPH0217679U - - Google Patents

Info

Publication number
JPH0217679U
JPH0217679U JP9607388U JP9607388U JPH0217679U JP H0217679 U JPH0217679 U JP H0217679U JP 9607388 U JP9607388 U JP 9607388U JP 9607388 U JP9607388 U JP 9607388U JP H0217679 U JPH0217679 U JP H0217679U
Authority
JP
Japan
Prior art keywords
circuit board
probe
board inspection
inspection device
conductive rubber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9607388U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9607388U priority Critical patent/JPH0217679U/ja
Publication of JPH0217679U publication Critical patent/JPH0217679U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案の一実施例を示した側面図、
第2図はこの考案の他の実施例を示した側面図で
ある。 図中、1は接続基板、2,2Aはプローブ、3
は被検査回路基板、4はIC、5は補強メンバー
である。
Figure 1 is a side view showing an embodiment of this invention.
FIG. 2 is a side view showing another embodiment of this invention. In the figure, 1 is a connection board, 2 and 2A are probes, and 3
1 is a circuit board to be inspected, 4 is an IC, and 5 is a reinforcing member.

Claims (1)

【実用新案登録請求の範囲】 (1) 被検査回路基板の所定部位に接触するプロ
ーブを備えている回路基板検査装置において、 上記プローブは導電性を備えたゴム弾性体から
なることを特徴とする回路基板検査装置。 (2) 上記プローブは導電性ゴムからなる請求項
1記載の回路基板検査装置。 (3) 上記プローブは導電性の芯材を埋設してな
るゴムコネクタからなる請求項1記載の回路基板
検査装置。 (4) 上記プローブは少なくとも2つの測定ポイ
ントに跨るように形成されている請求項1記載の
回路基板検査装置。
[Claims for Utility Model Registration] (1) A circuit board inspection device equipped with a probe that comes into contact with a predetermined part of a circuit board to be inspected, characterized in that the probe is made of a conductive rubber elastic body. Circuit board inspection equipment. (2) The circuit board inspection device according to claim 1, wherein the probe is made of conductive rubber. (3) The circuit board inspection device according to claim 1, wherein the probe comprises a rubber connector having a conductive core material embedded therein. (4) The circuit board inspection device according to claim 1, wherein the probe is formed so as to span at least two measurement points.
JP9607388U 1988-07-20 1988-07-20 Pending JPH0217679U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9607388U JPH0217679U (en) 1988-07-20 1988-07-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9607388U JPH0217679U (en) 1988-07-20 1988-07-20

Publications (1)

Publication Number Publication Date
JPH0217679U true JPH0217679U (en) 1990-02-05

Family

ID=31320874

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9607388U Pending JPH0217679U (en) 1988-07-20 1988-07-20

Country Status (1)

Country Link
JP (1) JPH0217679U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008241346A (en) * 2007-03-26 2008-10-09 Fujitsu Ltd Probe and measuring instrument using it

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008241346A (en) * 2007-03-26 2008-10-09 Fujitsu Ltd Probe and measuring instrument using it

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