JPH02106858U - - Google Patents

Info

Publication number
JPH02106858U
JPH02106858U JP1513189U JP1513189U JPH02106858U JP H02106858 U JPH02106858 U JP H02106858U JP 1513189 U JP1513189 U JP 1513189U JP 1513189 U JP1513189 U JP 1513189U JP H02106858 U JPH02106858 U JP H02106858U
Authority
JP
Japan
Prior art keywords
region
printed wiring
contact probe
cutting
tested
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1513189U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1513189U priority Critical patent/JPH02106858U/ja
Publication of JPH02106858U publication Critical patent/JPH02106858U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案実施例の平面構造を示す図、第
2図は本考案実施例のテスト状態を示す斜視図、
第3図は従来例のテスト状態を示す斜視図である
。 1……元基板、2……製品基板、3……捨て基
板、4……コネクター端子、5……テストポイン
ト、6……銅箔回路パターン、7……切断箇所、
8……コンタクトプローブピン。
FIG. 1 is a diagram showing the planar structure of the embodiment of the present invention, and FIG. 2 is a perspective view showing the test state of the embodiment of the present invention.
FIG. 3 is a perspective view showing a test state of a conventional example. 1... Original board, 2... Product board, 3... Discarded board, 4... Connector terminal, 5... Test point, 6... Copper foil circuit pattern, 7... Cutting location,
8...Contact probe pin.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] テストの対象であるプリント配線回路を有する
第1の領域と、テスト用のコンタクトプローブピ
ンを接触させるテストポイントを有する第2の領
域とが共通の基材上に形成され、上記第1の領域
と第2の領域とを切断により分離可能な構造を有
する高密度実装用プリント配線基板。
A first region having a printed wiring circuit to be tested and a second region having test points for contacting contact probe pins for testing are formed on a common base material, and the first region and A printed wiring board for high-density mounting that has a structure that allows separation from a second region by cutting.
JP1513189U 1989-02-10 1989-02-10 Pending JPH02106858U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1513189U JPH02106858U (en) 1989-02-10 1989-02-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1513189U JPH02106858U (en) 1989-02-10 1989-02-10

Publications (1)

Publication Number Publication Date
JPH02106858U true JPH02106858U (en) 1990-08-24

Family

ID=31226918

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1513189U Pending JPH02106858U (en) 1989-02-10 1989-02-10

Country Status (1)

Country Link
JP (1) JPH02106858U (en)

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