JP2537892Y2 - Ic試験装置 - Google Patents
Ic試験装置Info
- Publication number
- JP2537892Y2 JP2537892Y2 JP1990060799U JP6079990U JP2537892Y2 JP 2537892 Y2 JP2537892 Y2 JP 2537892Y2 JP 1990060799 U JP1990060799 U JP 1990060799U JP 6079990 U JP6079990 U JP 6079990U JP 2537892 Y2 JP2537892 Y2 JP 2537892Y2
- Authority
- JP
- Japan
- Prior art keywords
- connector
- motherboard
- contact
- pin card
- zero insertion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1990060799U JP2537892Y2 (ja) | 1990-06-08 | 1990-06-08 | Ic試験装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1990060799U JP2537892Y2 (ja) | 1990-06-08 | 1990-06-08 | Ic試験装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0421881U JPH0421881U (fr) | 1992-02-24 |
JP2537892Y2 true JP2537892Y2 (ja) | 1997-06-04 |
Family
ID=31588481
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1990060799U Expired - Lifetime JP2537892Y2 (ja) | 1990-06-08 | 1990-06-08 | Ic試験装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2537892Y2 (fr) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11237439A (ja) * | 1998-02-20 | 1999-08-31 | Advantest Corp | テストフィクスチャ |
US6476628B1 (en) * | 1999-06-28 | 2002-11-05 | Teradyne, Inc. | Semiconductor parallel tester |
US20070057682A1 (en) * | 2005-09-15 | 2007-03-15 | Mctigue Michael T | Signal probe and probe assembly |
JPWO2008062579A1 (ja) * | 2006-11-22 | 2010-03-04 | パナソニック株式会社 | 半導体検査装置 |
KR101250844B1 (ko) * | 2008-11-04 | 2013-04-09 | 가부시키가이샤 아드반테스트 | 커넥터 착탈장치 및 테스트헤드 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5960269A (ja) * | 1982-09-29 | 1984-04-06 | Nec Corp | 汎用フイクスチヤ− |
JPS62120289U (fr) * | 1986-01-22 | 1987-07-30 | ||
JPH0627782B2 (ja) * | 1986-12-18 | 1994-04-13 | アジアエレクトロニクス株式会社 | 集積回路測定用接続装置 |
-
1990
- 1990-06-08 JP JP1990060799U patent/JP2537892Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0421881U (fr) | 1992-02-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20050622 |
|
A131 | Notification of reasons for refusal |
Effective date: 20050705 Free format text: JAPANESE INTERMEDIATE CODE: A131 |
|
A521 | Written amendment |
Effective date: 20050902 Free format text: JAPANESE INTERMEDIATE CODE: A523 |
|
A02 | Decision of refusal |
Effective date: 20051004 Free format text: JAPANESE INTERMEDIATE CODE: A02 |