JPH0421105Y2 - - Google Patents

Info

Publication number
JPH0421105Y2
JPH0421105Y2 JP1983149464U JP14946483U JPH0421105Y2 JP H0421105 Y2 JPH0421105 Y2 JP H0421105Y2 JP 1983149464 U JP1983149464 U JP 1983149464U JP 14946483 U JP14946483 U JP 14946483U JP H0421105 Y2 JPH0421105 Y2 JP H0421105Y2
Authority
JP
Japan
Prior art keywords
package
presser
guide
lead terminal
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1983149464U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6056285U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14946483U priority Critical patent/JPS6056285U/ja
Publication of JPS6056285U publication Critical patent/JPS6056285U/ja
Application granted granted Critical
Publication of JPH0421105Y2 publication Critical patent/JPH0421105Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP14946483U 1983-09-27 1983-09-27 半導体ｉｃ試験装置 Granted JPS6056285U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14946483U JPS6056285U (ja) 1983-09-27 1983-09-27 半導体ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14946483U JPS6056285U (ja) 1983-09-27 1983-09-27 半導体ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPS6056285U JPS6056285U (ja) 1985-04-19
JPH0421105Y2 true JPH0421105Y2 (zh) 1992-05-14

Family

ID=30331781

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14946483U Granted JPS6056285U (ja) 1983-09-27 1983-09-27 半導体ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JPS6056285U (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0636390B2 (ja) * 1989-03-22 1994-05-11 山一電機工業株式会社 Ｉｃソケット
JP4785190B2 (ja) * 2006-03-15 2011-10-05 大西電子株式会社 半導体デバイス用検査ソケット

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6034031A (ja) * 1983-08-05 1985-02-21 Tokyo Seimitsu Co Ltd 半導体素子の測定装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6034031A (ja) * 1983-08-05 1985-02-21 Tokyo Seimitsu Co Ltd 半導体素子の測定装置

Also Published As

Publication number Publication date
JPS6056285U (ja) 1985-04-19

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