JPH0416228Y2 - - Google Patents
Info
- Publication number
- JPH0416228Y2 JPH0416228Y2 JP10173984U JP10173984U JPH0416228Y2 JP H0416228 Y2 JPH0416228 Y2 JP H0416228Y2 JP 10173984 U JP10173984 U JP 10173984U JP 10173984 U JP10173984 U JP 10173984U JP H0416228 Y2 JPH0416228 Y2 JP H0416228Y2
- Authority
- JP
- Japan
- Prior art keywords
- board
- pin
- lifter
- pins
- printed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 22
- 239000000523 sample Substances 0.000 claims description 17
- 239000011159 matrix material Substances 0.000 claims description 3
- 239000000853 adhesive Substances 0.000 description 7
- 230000001070 adhesive effect Effects 0.000 description 7
- 230000000694 effects Effects 0.000 description 3
- 238000005476 soldering Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000003754 machining Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 229910000679 solder Inorganic materials 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10173984U JPS6117671U (ja) | 1984-07-05 | 1984-07-05 | プリント板試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10173984U JPS6117671U (ja) | 1984-07-05 | 1984-07-05 | プリント板試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6117671U JPS6117671U (ja) | 1986-02-01 |
| JPH0416228Y2 true JPH0416228Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1992-04-10 |
Family
ID=30661154
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10173984U Granted JPS6117671U (ja) | 1984-07-05 | 1984-07-05 | プリント板試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6117671U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7037398B2 (ja) | 2018-03-19 | 2022-03-16 | キオクシア株式会社 | テスタ校正装置およびテスタ校正方法 |
-
1984
- 1984-07-05 JP JP10173984U patent/JPS6117671U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6117671U (ja) | 1986-02-01 |