JPH0348468B2 - - Google Patents

Info

Publication number
JPH0348468B2
JPH0348468B2 JP57079422A JP7942282A JPH0348468B2 JP H0348468 B2 JPH0348468 B2 JP H0348468B2 JP 57079422 A JP57079422 A JP 57079422A JP 7942282 A JP7942282 A JP 7942282A JP H0348468 B2 JPH0348468 B2 JP H0348468B2
Authority
JP
Japan
Prior art keywords
test
oscillation
signal
terminal
external lead
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57079422A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58196469A (ja
Inventor
Fukuyoshi Watanabe
Hiroshi Kurihara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP57079422A priority Critical patent/JPS58196469A/ja
Publication of JPS58196469A publication Critical patent/JPS58196469A/ja
Publication of JPH0348468B2 publication Critical patent/JPH0348468B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP57079422A 1982-05-12 1982-05-12 集積回路のテスト方法 Granted JPS58196469A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57079422A JPS58196469A (ja) 1982-05-12 1982-05-12 集積回路のテスト方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57079422A JPS58196469A (ja) 1982-05-12 1982-05-12 集積回路のテスト方法

Publications (2)

Publication Number Publication Date
JPS58196469A JPS58196469A (ja) 1983-11-15
JPH0348468B2 true JPH0348468B2 (zh) 1991-07-24

Family

ID=13689422

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57079422A Granted JPS58196469A (ja) 1982-05-12 1982-05-12 集積回路のテスト方法

Country Status (1)

Country Link
JP (1) JPS58196469A (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61191973A (ja) * 1985-02-20 1986-08-26 Fujitsu Ltd 試験回路をそなえた半導体集積回路
EP0752657A3 (en) * 1995-07-03 1997-07-23 Ford Motor Co Access control circuit in test mode
JPH09171060A (ja) * 1995-12-21 1997-06-30 Nec Corp 半導体集積回路
JP5999597B2 (ja) * 2012-10-04 2016-09-28 セイコーＮｐｃ株式会社 発振器

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5629177A (en) * 1979-08-16 1981-03-23 Nec Corp Semiconductor integrated circuit device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5629177A (en) * 1979-08-16 1981-03-23 Nec Corp Semiconductor integrated circuit device

Also Published As

Publication number Publication date
JPS58196469A (ja) 1983-11-15

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