JPH0325768B2 - - Google Patents
Info
- Publication number
- JPH0325768B2 JPH0325768B2 JP58047364A JP4736483A JPH0325768B2 JP H0325768 B2 JPH0325768 B2 JP H0325768B2 JP 58047364 A JP58047364 A JP 58047364A JP 4736483 A JP4736483 A JP 4736483A JP H0325768 B2 JPH0325768 B2 JP H0325768B2
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- film
- photomask
- opaque
- pinhole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/72—Repair or correction of mask defects
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Thermal Transfer Or Thermal Recording In General (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58047364A JPS59172646A (ja) | 1983-03-22 | 1983-03-22 | フオト・マスク及びその製造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58047364A JPS59172646A (ja) | 1983-03-22 | 1983-03-22 | フオト・マスク及びその製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59172646A JPS59172646A (ja) | 1984-09-29 |
| JPH0325768B2 true JPH0325768B2 (enExample) | 1991-04-08 |
Family
ID=12773051
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58047364A Granted JPS59172646A (ja) | 1983-03-22 | 1983-03-22 | フオト・マスク及びその製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59172646A (enExample) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55163541A (en) * | 1979-06-07 | 1980-12-19 | Mitsubishi Electric Corp | Photo mask and its defect correcting method |
-
1983
- 1983-03-22 JP JP58047364A patent/JPS59172646A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59172646A (ja) | 1984-09-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI396933B (zh) | 光罩、曝光方法、光罩之製造方法、半透相移光罩之製造方法 | |
| KR101245468B1 (ko) | 포토마스크 블랭크의 제조 방법 | |
| TWI762878B (zh) | 遮罩基底、轉印遮罩以及半導體元件之製造方法 | |
| US6709791B1 (en) | Halftone phase shift photomask and blanks for halftone phase shift photomask for it and pattern forming method using this | |
| KR100706731B1 (ko) | 위상 시프트 마스크 | |
| JPS5846055B2 (ja) | ホトマスクの欠陥修正法 | |
| DE68926659T2 (de) | Photomaske und Herstellungsverfahren | |
| JP3071324B2 (ja) | 位相シフトマスクの修正方法 | |
| JPH04125642A (ja) | フォトマスクの欠陥修正方法 | |
| JPH0325768B2 (enExample) | ||
| JP3440338B2 (ja) | ハーフトーン型位相シフトフオトマスク | |
| JPH04165353A (ja) | ホトマスク修正方法 | |
| TW200412478A (en) | Method of repairing attenuate phase shift mask | |
| JPS60245135A (ja) | ホトマスク修正方法 | |
| US6627358B1 (en) | Mask repair in resist image | |
| JPS6053872B2 (ja) | 遮光性マスクの修正方法 | |
| JPS63218959A (ja) | ホトマスクパタ−ンの修正方法 | |
| JPS6163029A (ja) | クロムマスクの修正方法 | |
| JPS6046556A (ja) | フォトマスクの製造方法 | |
| JPH0728227A (ja) | シフター凸欠陥修正方法 | |
| JPH02193149A (ja) | エマルジョンマスク等の欠陥部修正方法 | |
| JPS60152027A (ja) | パタ−ン欠陥修正方法 | |
| JPH0363734B2 (enExample) | ||
| JPS6057927A (ja) | 欠陥修正方法 | |
| JPH07271014A (ja) | フォトマスクブランク及びその製造方法、並びにこのフォトマスクブランクを使用して製造したフォトマスク |