JPH0322686B2 - - Google Patents

Info

Publication number
JPH0322686B2
JPH0322686B2 JP9028682A JP9028682A JPH0322686B2 JP H0322686 B2 JPH0322686 B2 JP H0322686B2 JP 9028682 A JP9028682 A JP 9028682A JP 9028682 A JP9028682 A JP 9028682A JP H0322686 B2 JPH0322686 B2 JP H0322686B2
Authority
JP
Japan
Prior art keywords
film
mask
frame
patterned
ray exposure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP9028682A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58207048A (ja
Inventor
Seiichi Iwamatsu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP57090286A priority Critical patent/JPS58207048A/ja
Publication of JPS58207048A publication Critical patent/JPS58207048A/ja
Publication of JPH0322686B2 publication Critical patent/JPH0322686B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/22Masks or mask blanks for imaging by radiation of 100nm or shorter wavelength, e.g. X-ray masks, extreme ultraviolet [EUV] masks; Preparation thereof

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
JP57090286A 1982-05-27 1982-05-27 マスクの製造方法 Granted JPS58207048A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57090286A JPS58207048A (ja) 1982-05-27 1982-05-27 マスクの製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57090286A JPS58207048A (ja) 1982-05-27 1982-05-27 マスクの製造方法

Publications (2)

Publication Number Publication Date
JPS58207048A JPS58207048A (ja) 1983-12-02
JPH0322686B2 true JPH0322686B2 (en)van) 1991-03-27

Family

ID=13994275

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57090286A Granted JPS58207048A (ja) 1982-05-27 1982-05-27 マスクの製造方法

Country Status (1)

Country Link
JP (1) JPS58207048A (en)van)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100674991B1 (ko) 2005-09-02 2007-01-29 삼성전자주식회사 토폴로지를 갖는 보상층을 구비한 바이너리 포토 마스크 및그 제조방법
KR100734318B1 (ko) 2006-06-12 2007-07-02 삼성전자주식회사 포토 마스크의 cd 보정 방법 및 cd가 보정된 포토마스크

Also Published As

Publication number Publication date
JPS58207048A (ja) 1983-12-02

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