JPH0321936B2 - - Google Patents

Info

Publication number
JPH0321936B2
JPH0321936B2 JP56042102A JP4210281A JPH0321936B2 JP H0321936 B2 JPH0321936 B2 JP H0321936B2 JP 56042102 A JP56042102 A JP 56042102A JP 4210281 A JP4210281 A JP 4210281A JP H0321936 B2 JPH0321936 B2 JP H0321936B2
Authority
JP
Japan
Prior art keywords
test
random access
circuit
ram
access memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56042102A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57156571A (en
Inventor
Akihito Yonehara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP56042102A priority Critical patent/JPS57156571A/ja
Publication of JPS57156571A publication Critical patent/JPS57156571A/ja
Publication of JPH0321936B2 publication Critical patent/JPH0321936B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP56042102A 1981-03-23 1981-03-23 Testing circuit for random access memory Granted JPS57156571A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56042102A JPS57156571A (en) 1981-03-23 1981-03-23 Testing circuit for random access memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56042102A JPS57156571A (en) 1981-03-23 1981-03-23 Testing circuit for random access memory

Publications (2)

Publication Number Publication Date
JPS57156571A JPS57156571A (en) 1982-09-27
JPH0321936B2 true JPH0321936B2 (en, 2012) 1991-03-25

Family

ID=12626612

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56042102A Granted JPS57156571A (en) 1981-03-23 1981-03-23 Testing circuit for random access memory

Country Status (1)

Country Link
JP (1) JPS57156571A (en, 2012)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006300650A (ja) * 2005-04-19 2006-11-02 Renesas Technology Corp 集積回路

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5538630A (en) * 1978-09-05 1980-03-18 Nec Corp Memory diagnostic system of information processing system
JPS5916360B2 (ja) * 1979-02-23 1984-04-14 富士通株式会社 記憶装置の診断方式
JPS561720A (en) * 1979-06-14 1981-01-09 Mitsubishi Electric Corp Gas insulated electric device

Also Published As

Publication number Publication date
JPS57156571A (en) 1982-09-27

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