JPS57156571A - Testing circuit for random access memory - Google Patents

Testing circuit for random access memory

Info

Publication number
JPS57156571A
JPS57156571A JP56042102A JP4210281A JPS57156571A JP S57156571 A JPS57156571 A JP S57156571A JP 56042102 A JP56042102 A JP 56042102A JP 4210281 A JP4210281 A JP 4210281A JP S57156571 A JPS57156571 A JP S57156571A
Authority
JP
Japan
Prior art keywords
microprocessor
ram
instruction fetch
random access
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56042102A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0321936B2 (en, 2012
Inventor
Akihito Yonehara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP56042102A priority Critical patent/JPS57156571A/ja
Publication of JPS57156571A publication Critical patent/JPS57156571A/ja
Publication of JPH0321936B2 publication Critical patent/JPH0321936B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP56042102A 1981-03-23 1981-03-23 Testing circuit for random access memory Granted JPS57156571A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56042102A JPS57156571A (en) 1981-03-23 1981-03-23 Testing circuit for random access memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56042102A JPS57156571A (en) 1981-03-23 1981-03-23 Testing circuit for random access memory

Publications (2)

Publication Number Publication Date
JPS57156571A true JPS57156571A (en) 1982-09-27
JPH0321936B2 JPH0321936B2 (en, 2012) 1991-03-25

Family

ID=12626612

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56042102A Granted JPS57156571A (en) 1981-03-23 1981-03-23 Testing circuit for random access memory

Country Status (1)

Country Link
JP (1) JPS57156571A (en, 2012)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006300650A (ja) * 2005-04-19 2006-11-02 Renesas Technology Corp 集積回路

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5538630A (en) * 1978-09-05 1980-03-18 Nec Corp Memory diagnostic system of information processing system
JPS55113199A (en) * 1979-02-23 1980-09-01 Fujitsu Ltd Diagnostic system for memory unit
JPS561720A (en) * 1979-06-14 1981-01-09 Mitsubishi Electric Corp Gas insulated electric device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5538630A (en) * 1978-09-05 1980-03-18 Nec Corp Memory diagnostic system of information processing system
JPS55113199A (en) * 1979-02-23 1980-09-01 Fujitsu Ltd Diagnostic system for memory unit
JPS561720A (en) * 1979-06-14 1981-01-09 Mitsubishi Electric Corp Gas insulated electric device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006300650A (ja) * 2005-04-19 2006-11-02 Renesas Technology Corp 集積回路

Also Published As

Publication number Publication date
JPH0321936B2 (en, 2012) 1991-03-25

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