JPH03183957A - 自動分析装置 - Google Patents

自動分析装置

Info

Publication number
JPH03183957A
JPH03183957A JP32479389A JP32479389A JPH03183957A JP H03183957 A JPH03183957 A JP H03183957A JP 32479389 A JP32479389 A JP 32479389A JP 32479389 A JP32479389 A JP 32479389A JP H03183957 A JPH03183957 A JP H03183957A
Authority
JP
Japan
Prior art keywords
sample
rack
inspected
emergency
return
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP32479389A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0570113B2 (enExample
Inventor
Hiroharu Tanimizu
弘治 谷水
Toshimi Kadota
門田 俊美
Masao Kobayashi
木林 昌男
Norihiro Sato
佐藤 教博
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP32479389A priority Critical patent/JPH03183957A/ja
Publication of JPH03183957A publication Critical patent/JPH03183957A/ja
Publication of JPH0570113B2 publication Critical patent/JPH0570113B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00594Quality control, including calibration or testing of components of the analyser
    • G01N35/00603Reinspection of samples

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP32479389A 1989-12-13 1989-12-13 自動分析装置 Granted JPH03183957A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP32479389A JPH03183957A (ja) 1989-12-13 1989-12-13 自動分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP32479389A JPH03183957A (ja) 1989-12-13 1989-12-13 自動分析装置

Publications (2)

Publication Number Publication Date
JPH03183957A true JPH03183957A (ja) 1991-08-09
JPH0570113B2 JPH0570113B2 (enExample) 1993-10-04

Family

ID=18169745

Family Applications (1)

Application Number Title Priority Date Filing Date
JP32479389A Granted JPH03183957A (ja) 1989-12-13 1989-12-13 自動分析装置

Country Status (1)

Country Link
JP (1) JPH03183957A (enExample)

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10213586A (ja) * 1997-01-29 1998-08-11 Hitachi Ltd 自動分析装置
JP2001074754A (ja) * 1999-09-07 2001-03-23 Olympus Optical Co Ltd 自動分析装置
US6290907B1 (en) * 1997-09-11 2001-09-18 Hitachi, Ltd. Sample handling system
US6588625B2 (en) * 2001-04-24 2003-07-08 Abbott Laboratories Sample handling system
JP2004279357A (ja) * 2003-03-19 2004-10-07 Hitachi High-Technologies Corp 自動分析装置
JP2008185597A (ja) * 2008-04-28 2008-08-14 Hitachi High-Technologies Corp 自動分析装置
US7458483B2 (en) 2001-04-24 2008-12-02 Abbott Laboratories, Inc. Assay testing diagnostic analyzer
WO2010073502A1 (ja) * 2008-12-25 2010-07-01 株式会社 日立ハイテクノロジーズ 自動分析装置
JP2012189586A (ja) * 2011-02-24 2012-10-04 Toshiba Corp 自動分析装置
EP2098868A3 (en) * 2008-03-07 2015-03-25 Sysmex Corporation Analyzer, sample transportation method, and computer program product
US9057714B2 (en) 2005-05-04 2015-06-16 Abbott Laboratories Reagent and sample handling device for automatic testing system
JP2016048255A (ja) * 2013-06-17 2016-04-07 株式会社日立ハイテクノロジーズ 自動分析装置
WO2020166611A1 (ja) * 2019-02-13 2020-08-20 富士レビオ株式会社 分析装置
EP4365601A3 (en) * 2013-03-15 2024-08-21 Abbott Laboratories Automated diagnostic analyzers having rear accessible track systems and related methods

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3801349B2 (ja) * 1998-04-20 2006-07-26 株式会社日立製作所 検体処理システム
JP3390352B2 (ja) * 1999-01-12 2003-03-24 アロカ株式会社 ラック搬送装置
JP4642954B2 (ja) * 1999-09-30 2011-03-02 東芝医用システムエンジニアリング株式会社 自動分析装置
JP3801547B2 (ja) * 2002-08-12 2006-07-26 株式会社日立製作所 生化学分析装置
JP4643733B2 (ja) * 2009-08-14 2011-03-02 東芝医用システムエンジニアリング株式会社 自動分析装置
JP6034051B2 (ja) * 2012-04-25 2016-11-30 東芝メディカルシステムズ株式会社 自動分析装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6340861A (ja) * 1986-08-06 1988-02-22 Toshiba Corp 自動化学分析装置
JPS6385460A (ja) * 1986-09-30 1988-04-15 Toshiba Corp 自動化学分析装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6340861A (ja) * 1986-08-06 1988-02-22 Toshiba Corp 自動化学分析装置
JPS6385460A (ja) * 1986-09-30 1988-04-15 Toshiba Corp 自動化学分析装置

Cited By (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0856736A3 (en) * 1997-01-29 1999-07-28 Hitachi, Ltd. Automatic analyzing apparatus
US6117392A (en) * 1997-01-29 2000-09-12 Hitachi, Ltd. Automatic analyzing apparatus
JPH10213586A (ja) * 1997-01-29 1998-08-11 Hitachi Ltd 自動分析装置
US6290907B1 (en) * 1997-09-11 2001-09-18 Hitachi, Ltd. Sample handling system
JP2001074754A (ja) * 1999-09-07 2001-03-23 Olympus Optical Co Ltd 自動分析装置
US9656266B2 (en) 2001-04-24 2017-05-23 Abbott Laboratories Assay testing diagnostic analyzer
US6588625B2 (en) * 2001-04-24 2003-07-08 Abbott Laboratories Sample handling system
US8535624B2 (en) 2001-04-24 2013-09-17 Abbott Laboratories Assay testing diagnostic analyzer
US7458483B2 (en) 2001-04-24 2008-12-02 Abbott Laboratories, Inc. Assay testing diagnostic analyzer
JP2004279357A (ja) * 2003-03-19 2004-10-07 Hitachi High-Technologies Corp 自動分析装置
US10191072B2 (en) 2005-05-04 2019-01-29 Abbott Laboratories Reagent and sample handling device for automatic testing system
US9057714B2 (en) 2005-05-04 2015-06-16 Abbott Laboratories Reagent and sample handling device for automatic testing system
EP2098868A3 (en) * 2008-03-07 2015-03-25 Sysmex Corporation Analyzer, sample transportation method, and computer program product
JP2008185597A (ja) * 2008-04-28 2008-08-14 Hitachi High-Technologies Corp 自動分析装置
DE112009003793B4 (de) * 2008-12-25 2013-07-25 Hitachi High-Technologies Corp. Automatische Analysevorrichtung
US9063104B2 (en) 2008-12-25 2015-06-23 Hitachi High-Technologies Corporation Automatic analyzer
JP2010151569A (ja) * 2008-12-25 2010-07-08 Hitachi High-Technologies Corp 自動分析装置
WO2010073502A1 (ja) * 2008-12-25 2010-07-01 株式会社 日立ハイテクノロジーズ 自動分析装置
JP2012189586A (ja) * 2011-02-24 2012-10-04 Toshiba Corp 自動分析装置
EP4365601A3 (en) * 2013-03-15 2024-08-21 Abbott Laboratories Automated diagnostic analyzers having rear accessible track systems and related methods
JP2016048255A (ja) * 2013-06-17 2016-04-07 株式会社日立ハイテクノロジーズ 自動分析装置
JP2016183984A (ja) * 2013-06-17 2016-10-20 株式会社日立ハイテクノロジーズ 自動分析装置
JP2017067794A (ja) * 2013-06-17 2017-04-06 株式会社日立ハイテクノロジーズ 自動分析装置
JP2017067795A (ja) * 2013-06-17 2017-04-06 株式会社日立ハイテクノロジーズ 自動分析装置
WO2020166611A1 (ja) * 2019-02-13 2020-08-20 富士レビオ株式会社 分析装置

Also Published As

Publication number Publication date
JPH0570113B2 (enExample) 1993-10-04

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees