JPH0228255B2 - - Google Patents
Info
- Publication number
- JPH0228255B2 JPH0228255B2 JP60030161A JP3016185A JPH0228255B2 JP H0228255 B2 JPH0228255 B2 JP H0228255B2 JP 60030161 A JP60030161 A JP 60030161A JP 3016185 A JP3016185 A JP 3016185A JP H0228255 B2 JPH0228255 B2 JP H0228255B2
- Authority
- JP
- Japan
- Prior art keywords
- gate
- layer
- sio
- type
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/113—Isolations within a component, i.e. internal isolations
- H10D62/115—Dielectric isolations, e.g. air gaps
- H10D62/116—Dielectric isolations, e.g. air gaps adjoining the input or output regions of field-effect devices, e.g. adjoining source or drain regions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/20—Electrodes characterised by their shapes, relative sizes or dispositions
- H10D64/27—Electrodes not carrying the current to be rectified, amplified, oscillated or switched, e.g. gates
- H10D64/311—Gate electrodes for field-effect devices
- H10D64/411—Gate electrodes for field-effect devices for FETs
Landscapes
- Junction Field-Effect Transistors (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60030161A JPS61190985A (ja) | 1985-02-20 | 1985-02-20 | 半導体装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60030161A JPS61190985A (ja) | 1985-02-20 | 1985-02-20 | 半導体装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61190985A JPS61190985A (ja) | 1986-08-25 |
JPH0228255B2 true JPH0228255B2 (enrdf_load_stackoverflow) | 1990-06-22 |
Family
ID=12296030
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60030161A Granted JPS61190985A (ja) | 1985-02-20 | 1985-02-20 | 半導体装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61190985A (enrdf_load_stackoverflow) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4700462A (en) * | 1986-10-08 | 1987-10-20 | Hughes Aircraft Company | Process for making a T-gated transistor |
JPH02126628A (ja) * | 1988-11-07 | 1990-05-15 | Canon Inc | 位置合わせ装置及びその方法 |
US5139968A (en) * | 1989-03-03 | 1992-08-18 | Mitsubishi Denki Kabushiki Kaisha | Method of producing a t-shaped gate electrode |
JP3093487B2 (ja) * | 1992-10-28 | 2000-10-03 | 松下電子工業株式会社 | 半導体装置およびその製造方法 |
JP3170141B2 (ja) * | 1993-07-27 | 2001-05-28 | 株式会社東芝 | 半導体装置 |
JP2000138237A (ja) * | 1998-11-02 | 2000-05-16 | Nec Corp | 感光性有機膜を有する半導体装置及びその製造方法 |
KR100574911B1 (ko) * | 1999-01-18 | 2006-04-28 | 삼성전자주식회사 | 반도체 소자의 도전성 배선층 형성방법 |
-
1985
- 1985-02-20 JP JP60030161A patent/JPS61190985A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS61190985A (ja) | 1986-08-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP2778600B2 (ja) | 半導体装置の製造方法 | |
JPH0228255B2 (enrdf_load_stackoverflow) | ||
JP3189779B2 (ja) | 半導体装置の製造方法 | |
JP2003100775A (ja) | 半導体装置およびその製造方法 | |
JPH0472381B2 (enrdf_load_stackoverflow) | ||
JP3144089B2 (ja) | 電界効果トランジスタの製造方法 | |
JPH07122737A (ja) | 半導体装置及びその製造方法 | |
JP2591162B2 (ja) | 半導体装置の製造方法及びそれにより製造された半導体装置 | |
JPH0346239A (ja) | 半導体装置の製造方法 | |
JPS6129557B2 (enrdf_load_stackoverflow) | ||
JP2591436B2 (ja) | 電界効果トランジスタの製造方法 | |
JP2709055B2 (ja) | 半導体装置の製造方法 | |
JP2555950B2 (ja) | 半導体装置の製造方法 | |
JPH04212428A (ja) | 半導体装置の製造方法 | |
JPH03145738A (ja) | ゲート電極形成方法 | |
JPH11135477A (ja) | 化合物半導体装置の製造方法 | |
JPH0734440B2 (ja) | 半導体装置における配線形成方法 | |
JPH0260213B2 (enrdf_load_stackoverflow) | ||
JPH04321237A (ja) | 電界効果型トランジスタの製造方法 | |
JPH0491438A (ja) | 電界効果型トランジスタの製造方法 | |
JPS62195146A (ja) | 半導体装置の製造方法 | |
JPH05218100A (ja) | 半導体装置の製造方法 | |
JPH04298047A (ja) | 高周波用半導体装置 | |
JPH033337A (ja) | 半導体装置の製造方法 | |
JPS6039875A (ja) | 半導体装置の製造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |