JPH0136118B2 - - Google Patents

Info

Publication number
JPH0136118B2
JPH0136118B2 JP55115032A JP11503280A JPH0136118B2 JP H0136118 B2 JPH0136118 B2 JP H0136118B2 JP 55115032 A JP55115032 A JP 55115032A JP 11503280 A JP11503280 A JP 11503280A JP H0136118 B2 JPH0136118 B2 JP H0136118B2
Authority
JP
Japan
Prior art keywords
signal line
display device
common signal
row
common
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55115032A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5738498A (en
Inventor
Shinji Morozumi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP11503280A priority Critical patent/JPS5738498A/ja
Publication of JPS5738498A publication Critical patent/JPS5738498A/ja
Publication of JPH0136118B2 publication Critical patent/JPH0136118B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Liquid Crystal (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
JP11503280A 1980-08-21 1980-08-21 Testing system for active matrix substrate Granted JPS5738498A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11503280A JPS5738498A (en) 1980-08-21 1980-08-21 Testing system for active matrix substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11503280A JPS5738498A (en) 1980-08-21 1980-08-21 Testing system for active matrix substrate

Publications (2)

Publication Number Publication Date
JPS5738498A JPS5738498A (en) 1982-03-03
JPH0136118B2 true JPH0136118B2 (enExample) 1989-07-28

Family

ID=14652517

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11503280A Granted JPS5738498A (en) 1980-08-21 1980-08-21 Testing system for active matrix substrate

Country Status (1)

Country Link
JP (1) JPS5738498A (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0711542B2 (ja) * 1982-07-31 1995-02-08 キヤノン株式会社 消費電力測定装置
DE3317865A1 (de) * 1983-05-17 1984-11-22 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Verteilfachstrecke fuer flache sendungen wie briefe
JPH0697380B2 (ja) * 1985-09-20 1994-11-30 シャープ株式会社 ドツト・マトリツクス方式表示装置
JPS63125986A (ja) * 1986-11-14 1988-05-30 松下電器産業株式会社 薄膜トランジスタアレイの検査法
JPH0792647B2 (ja) * 1987-01-23 1995-10-09 松下電器産業株式会社 液晶表示装置の欠陥検出方法
NL8700933A (nl) * 1987-04-21 1988-11-16 Philips Nv Testmethode voor lcd-elementen.
JP2558755B2 (ja) * 1987-11-13 1996-11-27 松下電器産業株式会社 液晶表示パネル用セグメントドライブｉｃ
JPH01241598A (ja) * 1988-03-23 1989-09-26 Matsushita Electron Corp 画像表示装置の検査方法
JPH0355570U (enExample) * 1989-10-05 1991-05-29
JP2728748B2 (ja) * 1989-10-30 1998-03-18 松下電子工業株式会社 画像表示装置およびその検査方法
JP2792634B2 (ja) * 1991-06-28 1998-09-03 シャープ株式会社 アクティブマトリクス基板の検査方法
KR100236687B1 (ko) 1995-02-01 2000-01-15 야스카와 히데아키 액정표시장치, 액정표시장치의 구동방법 및 액정표시장치의 검사방법
JP3707404B2 (ja) * 2001-08-03 2005-10-19 ソニー株式会社 検査方法、半導体装置、及び表示装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54111298A (en) * 1978-02-20 1979-08-31 Matsushita Electric Ind Co Ltd Driving circuit of liquid crystal display device

Also Published As

Publication number Publication date
JPS5738498A (en) 1982-03-03

Similar Documents

Publication Publication Date Title
JP2758103B2 (ja) アクティブマトリクス基板及びその製造方法
US7388397B2 (en) Testing method for array substrate
KR0163938B1 (ko) 박막 트랜지스터형 액정표시장치의 구동회로
US5377030A (en) Method for testing active matrix liquid crystal by measuring voltage due to charge in a supplemental capacitor
US4928095A (en) Active matrix-addressed picture display device
EP0491436B1 (en) Matrix display device with write-in facility
KR930001650B1 (ko) 매트릭스타입 디스플레이장치의 구동회로
CN100380183C (zh) 液晶显示设备、控制该设备的方法以及便携式终端
US20040032278A1 (en) Inspecting method, semiconductor device, and display
JP3465911B2 (ja) 電子式マトリックスアレイ装置
JPH01137293A (ja) デイスプレーのクロストーク減少方法と装置
EP0627722B1 (en) Light valve device with failure detection circuit
CN100456484C (zh) 光学传感器及其读取方法、和矩阵型光学传感器电路
JPH0136118B2 (enExample)
JPH09508219A (ja) 液晶ディスプレイを駆動する為の電子システム
US3388292A (en) Insulated gate field-effect transistor means for information gating and driving of solid state display panels
JPH055866A (ja) アクテイブマトリクス基板の検査方法
US4622590A (en) Method of driving a display device
US7227523B2 (en) Liquid crystal display device and inspecting method thereof
EP0257056A1 (en) Matrix addressable displays.
US5856666A (en) Multiplexer circuit
JP2728748B2 (ja) 画像表示装置およびその検査方法
JP2005321433A (ja) 画像表示装置およびその検査方法
JPH07199872A (ja) 液晶表示装置
JPH04251818A (ja) 液晶表示装置