US4536855A
(en)
*
|
1982-12-23 |
1985-08-20 |
International Telephone And Telegraph Corporation |
Impedance restoration for fast carry propagation
|
JPS6068713A
(ja)
*
|
1983-09-26 |
1985-04-19 |
Nec Corp |
タイミング調整回路
|
US4593207A
(en)
*
|
1984-04-05 |
1986-06-03 |
The United States Of America As Represented By The Secretary Of The Army |
Synchronizer circuit for synchronizing the scan of a device with an externally received triggering signal
|
JPS60229521A
(ja)
*
|
1984-04-27 |
1985-11-14 |
Sony Tektronix Corp |
デジタル信号遅延回路
|
JPS6139619A
(ja)
*
|
1984-07-30 |
1986-02-25 |
Nec Corp |
クロツクパルス分配回路
|
US5027315A
(en)
*
|
1984-09-28 |
1991-06-25 |
Advanced Micro Devices, Inc. |
Programmable logic array using internally generated dynamic logic signals as selection signals for controlling its functions
|
US4737670A
(en)
*
|
1984-11-09 |
1988-04-12 |
Lsi Logic Corporation |
Delay control circuit
|
US4686458A
(en)
*
|
1985-05-31 |
1987-08-11 |
Hughes Aircraft Company |
Pulse alignment system
|
US4658161A
(en)
*
|
1985-08-13 |
1987-04-14 |
Hewlett-Packard Company |
Split phase loop
|
US4660197A
(en)
*
|
1985-11-01 |
1987-04-21 |
Teradyne, Inc. |
Circuitry for synchronizing a multiple channel circuit tester
|
JPS62171315A
(ja)
*
|
1986-01-16 |
1987-07-28 |
タンデム コンピユ−タ−ズ インコ−ポレ−テツド |
遅延調整回路
|
JPH0681018B2
(ja)
*
|
1986-03-31 |
1994-10-12 |
三菱電機株式会社 |
半導体集積回路
|
US4812769A
(en)
*
|
1986-04-30 |
1989-03-14 |
Tektronix, Inc. |
Programmable sampling time base circuit
|
US4745310A
(en)
*
|
1986-08-04 |
1988-05-17 |
Motorola, Inc. |
Programmable delay circuit
|
US4922141A
(en)
*
|
1986-10-07 |
1990-05-01 |
Western Digital Corporation |
Phase-locked loop delay line
|
JPH0627108Y2
(ja)
*
|
1986-11-05 |
1994-07-27 |
マミヤ・オーピー株式会社 |
両軸受リ−ル
|
US4748348A
(en)
*
|
1986-12-29 |
1988-05-31 |
Tektronix, Inc. |
Multi-level pattern detector for a single signal
|
JPH01144719A
(ja)
*
|
1987-11-30 |
1989-06-07 |
Toshiba Corp |
リトリガブル・マルチバイブレータ
|
US5087842A
(en)
*
|
1988-01-06 |
1992-02-11 |
Digital Equipment Corporation |
Delay circuit having one of a plurality of delay lines which may be selected to provide an operation of a ring oscillator
|
US4868430A
(en)
*
|
1988-02-11 |
1989-09-19 |
Ncr Corporation |
Self-correcting digitally controlled timing circuit
|
JPH02130126U
(GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
*
|
1988-08-06 |
1990-10-26 |
|
|
US5013944A
(en)
*
|
1989-04-20 |
1991-05-07 |
International Business Machines Corporation |
Programmable delay line utilizing measured actual delays to provide a highly accurate delay
|
JPH02296410A
(ja)
*
|
1989-05-11 |
1990-12-07 |
Mitsubishi Electric Corp |
遅延回路
|
US5140202A
(en)
*
|
1989-06-05 |
1992-08-18 |
Hewlett-Packard Company |
Delay circuit which maintains its delay in a given relationship to a reference time interval
|
US5258660A
(en)
*
|
1990-01-16 |
1993-11-02 |
Cray Research, Inc. |
Skew-compensated clock distribution system
|
US5118975A
(en)
*
|
1990-03-05 |
1992-06-02 |
Thinking Machines Corporation |
Digital clock buffer circuit providing controllable delay
|
US5192886A
(en)
*
|
1990-03-15 |
1993-03-09 |
Hewlett-Packard Company |
Sub-nanosecond calibrated delay line structure
|
US5175453A
(en)
*
|
1990-08-15 |
1992-12-29 |
Lsi Logic Corporation |
Configurable pulse generator, especially for implementing signal delays in semiconductor devices
|
US5237224A
(en)
*
|
1990-10-11 |
1993-08-17 |
International Business Machines Corporation |
Variable self-correcting digital delay circuit
|
JPH04157379A
(ja)
*
|
1990-10-20 |
1992-05-29 |
Fujitsu Ltd |
遅延測定方式
|
US5175452A
(en)
*
|
1991-09-30 |
1992-12-29 |
Data Delay Devices, Inc. |
Programmable compensated digital delay circuit
|
US5214680A
(en)
*
|
1991-11-01 |
1993-05-25 |
Hewlett-Packard Company |
CMOS pseudo-NMOS programmable capacitance time vernier and method of calibration
|
US5283631A
(en)
*
|
1991-11-01 |
1994-02-01 |
Hewlett-Packard Co. |
Programmable capacitance delay element having inverters controlled by adjustable voltage to offset temperature and voltage supply variations
|
US5233637A
(en)
*
|
1991-11-01 |
1993-08-03 |
Hewlett-Packard Company |
System for generating an analog regulating voltage
|
US5243227A
(en)
*
|
1991-11-01 |
1993-09-07 |
Hewlett-Packard Company |
Fine/coarse wired-or tapped delay line
|
JP3605122B2
(ja)
*
|
1991-12-13 |
2004-12-22 |
テキサス インスツルメンツ インコーポレイテツド |
補償回路と遅延を補償する方法
|
US5180937A
(en)
*
|
1992-02-28 |
1993-01-19 |
Lsi Logic Corporation |
Delay compensator and monitor circuit having timing generator and sequencer
|
JPH0613857A
(ja)
*
|
1992-06-25 |
1994-01-21 |
Fujitsu Ltd |
ディレイ調整回路
|
US5289060A
(en)
*
|
1992-09-16 |
1994-02-22 |
Texas Instruments Incorporated |
Programmable glitch filter
|
US5394024A
(en)
*
|
1992-12-17 |
1995-02-28 |
Vlsi Technology, Inc. |
Circuit for eliminating off-chip to on-chip clock skew
|
US5900761A
(en)
*
|
1995-01-24 |
1999-05-04 |
Advantest Corporation |
Timing generating circuit and method
|
US5789969A
(en)
*
|
1996-03-15 |
1998-08-04 |
Adaptec, Inc. |
Digital delay circuit and method
|
EP0817200B1
(en)
*
|
1996-06-28 |
2003-03-19 |
STMicroelectronics S.r.l. |
Clock circuit for reading a multilevel non volatile memory cells device
|
US5859553A
(en)
*
|
1997-01-08 |
1999-01-12 |
Microchip Technology Incorporated |
System and method for a glitchless transition between differing delay paths
|
US6275085B1
(en)
*
|
1999-05-24 |
2001-08-14 |
Micron Technology, Inc. |
Comparator for determining process variations
|
US6441666B1
(en)
|
2000-07-20 |
2002-08-27 |
Silicon Graphics, Inc. |
System and method for generating clock signals
|
US7185239B2
(en)
*
|
2003-09-29 |
2007-02-27 |
Stmicroelectronics Pvt. Ltd. |
On-chip timing characterizer
|
DE102004021163A1
(de)
*
|
2004-04-29 |
2005-08-11 |
Infineon Technologies Ag |
Verfahren und Messsystem zum Messen einer Verzögerungszeit eines Verzögerungselementes in einer integrierten Schaltung
|
US7254505B2
(en)
*
|
2005-06-29 |
2007-08-07 |
Avago Technologies General Ip (Singapore) Pte. Ltd. |
Method and apparatus for calibrating delay lines
|
JP2007235908A
(ja)
*
|
2006-02-02 |
2007-09-13 |
Sharp Corp |
リング発振回路、遅延時間測定回路、テスト回路、クロック発生回路、イメージセンサ、パルス発生回路、半導体集積回路、及び、そのテスト方法
|
JP5292243B2
(ja)
*
|
2009-09-28 |
2013-09-18 |
株式会社日立製作所 |
半導体集積回路
|
US11835580B2
(en)
*
|
2020-12-01 |
2023-12-05 |
Mediatek Singapore Pte. Ltd. |
Circuit and method to measure simulation to silicon timing correlation
|