JP7734517B2 - ソケット - Google Patents

ソケット

Info

Publication number
JP7734517B2
JP7734517B2 JP2021104560A JP2021104560A JP7734517B2 JP 7734517 B2 JP7734517 B2 JP 7734517B2 JP 2021104560 A JP2021104560 A JP 2021104560A JP 2021104560 A JP2021104560 A JP 2021104560A JP 7734517 B2 JP7734517 B2 JP 7734517B2
Authority
JP
Japan
Prior art keywords
hole
tapered portion
plunger
taper angle
horizontal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2021104560A
Other languages
English (en)
Japanese (ja)
Other versions
JP2023003466A (ja
JP2023003466A5 (enExample
Inventor
大輔 細川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokowo Co Ltd
Original Assignee
Yokowo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP2021104560A priority Critical patent/JP7734517B2/ja
Application filed by Yokowo Co Ltd filed Critical Yokowo Co Ltd
Priority to CN202280037582.3A priority patent/CN117355754A/zh
Priority to TW111121282A priority patent/TW202305383A/zh
Priority to EP22828228.1A priority patent/EP4361646A1/en
Priority to PH1/2023/553267A priority patent/PH12023553267A1/en
Priority to US18/571,734 priority patent/US20240295584A1/en
Priority to PCT/JP2022/023122 priority patent/WO2022270311A1/ja
Publication of JP2023003466A publication Critical patent/JP2023003466A/ja
Publication of JP2023003466A5 publication Critical patent/JP2023003466A5/ja
Application granted granted Critical
Publication of JP7734517B2 publication Critical patent/JP7734517B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
    • H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
    • H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
JP2021104560A 2021-06-24 2021-06-24 ソケット Active JP7734517B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2021104560A JP7734517B2 (ja) 2021-06-24 2021-06-24 ソケット
TW111121282A TW202305383A (zh) 2021-06-24 2022-06-08 插座
EP22828228.1A EP4361646A1 (en) 2021-06-24 2022-06-08 Socket
PH1/2023/553267A PH12023553267A1 (en) 2021-06-24 2022-06-08 Socket
CN202280037582.3A CN117355754A (zh) 2021-06-24 2022-06-08 插座
US18/571,734 US20240295584A1 (en) 2021-06-24 2022-06-08 Socket
PCT/JP2022/023122 WO2022270311A1 (ja) 2021-06-24 2022-06-08 ソケット

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2021104560A JP7734517B2 (ja) 2021-06-24 2021-06-24 ソケット

Publications (3)

Publication Number Publication Date
JP2023003466A JP2023003466A (ja) 2023-01-17
JP2023003466A5 JP2023003466A5 (enExample) 2024-06-06
JP7734517B2 true JP7734517B2 (ja) 2025-09-05

Family

ID=84544282

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021104560A Active JP7734517B2 (ja) 2021-06-24 2021-06-24 ソケット

Country Status (7)

Country Link
US (1) US20240295584A1 (enExample)
EP (1) EP4361646A1 (enExample)
JP (1) JP7734517B2 (enExample)
CN (1) CN117355754A (enExample)
PH (1) PH12023553267A1 (enExample)
TW (1) TW202305383A (enExample)
WO (1) WO2022270311A1 (enExample)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013140058A (ja) 2011-12-29 2013-07-18 Enplas Corp プローブピン及び電気部品用ソケット
WO2019131438A1 (ja) 2017-12-26 2019-07-04 株式会社エンプラス プローブピン及びソケット
WO2020202735A1 (ja) 2019-03-29 2020-10-08 山一電機株式会社 コンタクトプローブ及びこれを備えた検査用ソケット

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5399982A (en) * 1989-11-13 1995-03-21 Mania Gmbh & Co. Printed circuit board testing device with foil adapter
JP3414593B2 (ja) * 1996-06-28 2003-06-09 日本発条株式会社 導電性接触子
US5952843A (en) * 1998-03-24 1999-09-14 Vinh; Nguyen T. Variable contact pressure probe
JP2006300581A (ja) * 2005-04-18 2006-11-02 Yokowo Co Ltd プローブの組付け構造
JP4757531B2 (ja) 2005-04-28 2011-08-24 日本発條株式会社 導電性接触子ホルダおよび導電性接触子ユニット
JP2010237133A (ja) * 2009-03-31 2010-10-21 Yokowo Co Ltd 検査ソケットおよびその製法
JP5361518B2 (ja) * 2009-04-27 2013-12-04 株式会社ヨコオ コンタクトプローブ及びソケット
JP6475479B2 (ja) * 2014-11-27 2019-02-27 株式会社ヨコオ 検査ユニット
JP2018194411A (ja) * 2017-05-17 2018-12-06 株式会社ヨコオ コンタクトプローブ及び検査用治具
TWM588248U (zh) * 2019-07-01 2019-12-21 技鼎股份有限公司 探針頭及其導電探針
JP7335507B2 (ja) * 2019-12-10 2023-08-30 山一電機株式会社 検査用ソケット
JP2021104560A (ja) 2019-12-26 2021-07-26 株式会社安永 ワイヤ放電加工装置及びこのワイヤ放電加工装置に用いられるシート
JP7602112B2 (ja) * 2020-11-17 2024-12-18 山一電機株式会社 検査用ソケット
CN118382811A (zh) * 2021-12-21 2024-07-23 株式会社友华 探头

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013140058A (ja) 2011-12-29 2013-07-18 Enplas Corp プローブピン及び電気部品用ソケット
WO2019131438A1 (ja) 2017-12-26 2019-07-04 株式会社エンプラス プローブピン及びソケット
WO2020202735A1 (ja) 2019-03-29 2020-10-08 山一電機株式会社 コンタクトプローブ及びこれを備えた検査用ソケット

Also Published As

Publication number Publication date
JP2023003466A (ja) 2023-01-17
US20240295584A1 (en) 2024-09-05
EP4361646A1 (en) 2024-05-01
TW202305383A (zh) 2023-02-01
PH12023553267A1 (en) 2024-04-22
CN117355754A (zh) 2024-01-05
WO2022270311A1 (ja) 2022-12-29

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