TW202305383A - 插座 - Google Patents

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Publication number
TW202305383A
TW202305383A TW111121282A TW111121282A TW202305383A TW 202305383 A TW202305383 A TW 202305383A TW 111121282 A TW111121282 A TW 111121282A TW 111121282 A TW111121282 A TW 111121282A TW 202305383 A TW202305383 A TW 202305383A
Authority
TW
Taiwan
Prior art keywords
hole
taper
plunger
angle
taper angle
Prior art date
Application number
TW111121282A
Other languages
English (en)
Chinese (zh)
Inventor
細川大輔
Original Assignee
日商友華股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商友華股份有限公司 filed Critical 日商友華股份有限公司
Publication of TW202305383A publication Critical patent/TW202305383A/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
    • H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
    • H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
TW111121282A 2021-06-24 2022-06-08 插座 TW202305383A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021-104560 2021-06-24
JP2021104560A JP7734517B2 (ja) 2021-06-24 2021-06-24 ソケット

Publications (1)

Publication Number Publication Date
TW202305383A true TW202305383A (zh) 2023-02-01

Family

ID=84544282

Family Applications (1)

Application Number Title Priority Date Filing Date
TW111121282A TW202305383A (zh) 2021-06-24 2022-06-08 插座

Country Status (7)

Country Link
US (1) US20240295584A1 (enExample)
EP (1) EP4361646A1 (enExample)
JP (1) JP7734517B2 (enExample)
CN (1) CN117355754A (enExample)
PH (1) PH12023553267A1 (enExample)
TW (1) TW202305383A (enExample)
WO (1) WO2022270311A1 (enExample)

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5399982A (en) * 1989-11-13 1995-03-21 Mania Gmbh & Co. Printed circuit board testing device with foil adapter
JP3414593B2 (ja) * 1996-06-28 2003-06-09 日本発条株式会社 導電性接触子
US5952843A (en) * 1998-03-24 1999-09-14 Vinh; Nguyen T. Variable contact pressure probe
JP2006300581A (ja) * 2005-04-18 2006-11-02 Yokowo Co Ltd プローブの組付け構造
JP4757531B2 (ja) 2005-04-28 2011-08-24 日本発條株式会社 導電性接触子ホルダおよび導電性接触子ユニット
JP2010237133A (ja) * 2009-03-31 2010-10-21 Yokowo Co Ltd 検査ソケットおよびその製法
JP5361518B2 (ja) * 2009-04-27 2013-12-04 株式会社ヨコオ コンタクトプローブ及びソケット
JP5858781B2 (ja) 2011-12-29 2016-02-10 株式会社エンプラス プローブピン及び電気部品用ソケット
JP6475479B2 (ja) * 2014-11-27 2019-02-27 株式会社ヨコオ 検査ユニット
JP2018194411A (ja) * 2017-05-17 2018-12-06 株式会社ヨコオ コンタクトプローブ及び検査用治具
JP7063609B2 (ja) 2017-12-26 2022-05-09 株式会社エンプラス プローブピン及びソケット
JP2020165803A (ja) 2019-03-29 2020-10-08 山一電機株式会社 コンタクトプローブ及びこれを備えた検査用ソケット
TWM588248U (zh) * 2019-07-01 2019-12-21 技鼎股份有限公司 探針頭及其導電探針
JP7335507B2 (ja) * 2019-12-10 2023-08-30 山一電機株式会社 検査用ソケット
JP2021104560A (ja) 2019-12-26 2021-07-26 株式会社安永 ワイヤ放電加工装置及びこのワイヤ放電加工装置に用いられるシート
JP7602112B2 (ja) * 2020-11-17 2024-12-18 山一電機株式会社 検査用ソケット
CN118382811A (zh) * 2021-12-21 2024-07-23 株式会社友华 探头

Also Published As

Publication number Publication date
JP2023003466A (ja) 2023-01-17
JP7734517B2 (ja) 2025-09-05
US20240295584A1 (en) 2024-09-05
EP4361646A1 (en) 2024-05-01
PH12023553267A1 (en) 2024-04-22
CN117355754A (zh) 2024-01-05
WO2022270311A1 (ja) 2022-12-29

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