JP7632472B2 - 光学特性測定装置及び光学特性測定方法 - Google Patents

光学特性測定装置及び光学特性測定方法 Download PDF

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JP7632472B2
JP7632472B2 JP2022551858A JP2022551858A JP7632472B2 JP 7632472 B2 JP7632472 B2 JP 7632472B2 JP 2022551858 A JP2022551858 A JP 2022551858A JP 2022551858 A JP2022551858 A JP 2022551858A JP 7632472 B2 JP7632472 B2 JP 7632472B2
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illumination
measured
light
area
light receiving
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JPWO2022065038A1 (https=
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拓史 宇田
良隆 寺岡
賢治 金野
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Konica Minolta Inc
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Konica Minolta Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/504—Goniometric colour measurements, for example measurements of metallic or flake based paints
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1765—Method using an image detector and processing of image signal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/473—Compensating for unwanted scatter, e.g. reliefs, marks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4735—Solid samples, e.g. paper, glass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Mathematical Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2022551858A 2020-09-25 2021-09-09 光学特性測定装置及び光学特性測定方法 Active JP7632472B2 (ja)

Applications Claiming Priority (3)

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JP2020160338 2020-09-25
JP2020160338 2020-09-25
PCT/JP2021/033073 WO2022065038A1 (ja) 2020-09-25 2021-09-09 光学特性測定装置及び光学特性測定方法

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JP7632472B2 true JP7632472B2 (ja) 2025-02-19

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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003075257A (ja) 2001-09-04 2003-03-12 Minolta Co Ltd 反射特性測定装置
JP2008523521A (ja) 2004-12-14 2008-07-03 アクゾ ノーベル コーティングス インターナショナル ビー ヴィ 表面の外観特性の解析方法および解析装置
WO2011101893A1 (ja) 2010-02-17 2011-08-25 コニカミノルタホールディングス株式会社 可撓性を有する検査対象物の表面の傷を検査する方法および装置
WO2014134099A1 (en) 2013-02-26 2014-09-04 Axalta Coating Systems IP Co. LLC Process for matching color and appearance of coatings
US20190320094A1 (en) 2018-04-13 2019-10-17 Arius Technology Inc. Systems and methods for imaging fine art paintings
WO2020054381A1 (ja) 2018-09-14 2020-03-19 コニカミノルタ株式会社 表面特性測定用データの出力装置及び表面特性測定装置
WO2020145023A1 (ja) 2019-01-10 2020-07-16 コニカミノルタ株式会社 光学特性解析装置及びプログラム

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0755705A (ja) * 1993-08-09 1995-03-03 Toyota Motor Corp 塗装深み感の評価方法
JPH11211673A (ja) * 1998-01-27 1999-08-06 Honda Motor Co Ltd 表面性状評価装置および表面性状評価方法
JP5073996B2 (ja) * 2006-09-20 2012-11-14 オリンパス株式会社 画像処理装置
JP6506507B2 (ja) 2013-05-15 2019-04-24 キヤノン株式会社 測定装置およびその制御方法
JP6922482B2 (ja) 2016-07-04 2021-08-18 株式会社リコー 計測システム、反射率計算方法及びプログラム
JP7264688B2 (ja) 2019-03-27 2023-04-25 太陽ホールディングス株式会社 感光性樹脂組成物、ドライフィルム、硬化物、及び、電子部品

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003075257A (ja) 2001-09-04 2003-03-12 Minolta Co Ltd 反射特性測定装置
JP2008523521A (ja) 2004-12-14 2008-07-03 アクゾ ノーベル コーティングス インターナショナル ビー ヴィ 表面の外観特性の解析方法および解析装置
WO2011101893A1 (ja) 2010-02-17 2011-08-25 コニカミノルタホールディングス株式会社 可撓性を有する検査対象物の表面の傷を検査する方法および装置
WO2014134099A1 (en) 2013-02-26 2014-09-04 Axalta Coating Systems IP Co. LLC Process for matching color and appearance of coatings
US20190320094A1 (en) 2018-04-13 2019-10-17 Arius Technology Inc. Systems and methods for imaging fine art paintings
WO2020054381A1 (ja) 2018-09-14 2020-03-19 コニカミノルタ株式会社 表面特性測定用データの出力装置及び表面特性測定装置
WO2020145023A1 (ja) 2019-01-10 2020-07-16 コニカミノルタ株式会社 光学特性解析装置及びプログラム

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
SHRESTHA, R. et al.，Assessment of Two Fast Multispectral Systems for Imaging of a Cultural Heritage Artifact - A Russian Icon，2018 14th International Conference on Signal-Image Technology & Internet-Based Systems (SITIS)，2018年，pp.645-650，DOI: 10.1109/SITIS.2018.00104

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EP4220135A1 (en) 2023-08-02
EP4220135B1 (en) 2025-07-23
JPWO2022065038A1 (https=) 2022-03-31
EP4220135A4 (en) 2024-03-06
WO2022065038A1 (ja) 2022-03-31

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