JPWO2022065038A1 - - Google Patents

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Publication number
JPWO2022065038A1
JPWO2022065038A1 JP2022551858A JP2022551858A JPWO2022065038A1 JP WO2022065038 A1 JPWO2022065038 A1 JP WO2022065038A1 JP 2022551858 A JP2022551858 A JP 2022551858A JP 2022551858 A JP2022551858 A JP 2022551858A JP WO2022065038 A1 JPWO2022065038 A1 JP WO2022065038A1
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2022551858A
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Japanese (ja)
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JP7632472B2 (ja
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Publication of JPWO2022065038A1 publication Critical patent/JPWO2022065038A1/ja
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Publication of JP7632472B2 publication Critical patent/JP7632472B2/ja
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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/8422Investigating thin films, e.g. matrix isolation method
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/504Goniometric colour measurements, for example measurements of metallic or flake based paints
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1765Method using an image detector and processing of image signal
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N2021/4704Angular selective
    • G01N2021/4711Multiangle measurement
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N2021/473Compensating for unwanted scatter, e.g. reliefs, marks
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N2021/4735Solid samples, e.g. paper, glass
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/8422Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427Coatings

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Mathematical Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2022551858A 2020-09-25 2021-09-09 光学特性測定装置及び光学特性測定方法 Active JP7632472B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020160338 2020-09-25
JP2020160338 2020-09-25
PCT/JP2021/033073 WO2022065038A1 (ja) 2020-09-25 2021-09-09 光学特性測定装置及び光学特性測定方法

Publications (2)

Publication Number Publication Date
JPWO2022065038A1 true JPWO2022065038A1 (https=) 2022-03-31
JP7632472B2 JP7632472B2 (ja) 2025-02-19

Family

ID=80845195

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022551858A Active JP7632472B2 (ja) 2020-09-25 2021-09-09 光学特性測定装置及び光学特性測定方法

Country Status (3)

Country Link
EP (1) EP4220135B1 (https=)
JP (1) JP7632472B2 (https=)
WO (1) WO2022065038A1 (https=)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0755705A (ja) * 1993-08-09 1995-03-03 Toyota Motor Corp 塗装深み感の評価方法
JP2003075257A (ja) * 2001-09-04 2003-03-12 Minolta Co Ltd 反射特性測定装置
JP2008523521A (ja) * 2004-12-14 2008-07-03 アクゾ ノーベル コーティングス インターナショナル ビー ヴィ 表面の外観特性の解析方法および解析装置
WO2011101893A1 (ja) * 2010-02-17 2011-08-25 コニカミノルタホールディングス株式会社 可撓性を有する検査対象物の表面の傷を検査する方法および装置
WO2014134099A1 (en) * 2013-02-26 2014-09-04 Axalta Coating Systems IP Co. LLC Process for matching color and appearance of coatings
US20190320094A1 (en) * 2018-04-13 2019-10-17 Arius Technology Inc. Systems and methods for imaging fine art paintings
WO2020054381A1 (ja) * 2018-09-14 2020-03-19 コニカミノルタ株式会社 表面特性測定用データの出力装置及び表面特性測定装置
WO2020145023A1 (ja) * 2019-01-10 2020-07-16 コニカミノルタ株式会社 光学特性解析装置及びプログラム

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11211673A (ja) * 1998-01-27 1999-08-06 Honda Motor Co Ltd 表面性状評価装置および表面性状評価方法
JP5073996B2 (ja) * 2006-09-20 2012-11-14 オリンパス株式会社 画像処理装置
JP6506507B2 (ja) 2013-05-15 2019-04-24 キヤノン株式会社 測定装置およびその制御方法
JP6922482B2 (ja) 2016-07-04 2021-08-18 株式会社リコー 計測システム、反射率計算方法及びプログラム
JP7264688B2 (ja) 2019-03-27 2023-04-25 太陽ホールディングス株式会社 感光性樹脂組成物、ドライフィルム、硬化物、及び、電子部品

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0755705A (ja) * 1993-08-09 1995-03-03 Toyota Motor Corp 塗装深み感の評価方法
JP2003075257A (ja) * 2001-09-04 2003-03-12 Minolta Co Ltd 反射特性測定装置
JP2008523521A (ja) * 2004-12-14 2008-07-03 アクゾ ノーベル コーティングス インターナショナル ビー ヴィ 表面の外観特性の解析方法および解析装置
WO2011101893A1 (ja) * 2010-02-17 2011-08-25 コニカミノルタホールディングス株式会社 可撓性を有する検査対象物の表面の傷を検査する方法および装置
WO2014134099A1 (en) * 2013-02-26 2014-09-04 Axalta Coating Systems IP Co. LLC Process for matching color and appearance of coatings
US20190320094A1 (en) * 2018-04-13 2019-10-17 Arius Technology Inc. Systems and methods for imaging fine art paintings
WO2020054381A1 (ja) * 2018-09-14 2020-03-19 コニカミノルタ株式会社 表面特性測定用データの出力装置及び表面特性測定装置
WO2020145023A1 (ja) * 2019-01-10 2020-07-16 コニカミノルタ株式会社 光学特性解析装置及びプログラム

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
SHRESTHA, R. ET AL.: "Assessment of Two Fast Multispectral Systems for Imaging of a Cultural Heritage Artifact - A Russian", 2018 14TH INTERNATIONAL CONFERENCE ON SIGNAL-IMAGE TECHNOLOGY & INTERNET-BASED SYSTEMS (SITIS), JPN6024035843, 2018, pages 645 - 650, ISSN: 0005412751 *

Also Published As

Publication number Publication date
EP4220135A1 (en) 2023-08-02
EP4220135B1 (en) 2025-07-23
JP7632472B2 (ja) 2025-02-19
EP4220135A4 (en) 2024-03-06
WO2022065038A1 (ja) 2022-03-31

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