JP7624440B2 - 最適化された干渉散乱顕微鏡法のための方法および装置 - Google Patents

最適化された干渉散乱顕微鏡法のための方法および装置 Download PDF

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JP7624440B2
JP7624440B2 JP2022521213A JP2022521213A JP7624440B2 JP 7624440 B2 JP7624440 B2 JP 7624440B2 JP 2022521213 A JP2022521213 A JP 2022521213A JP 2022521213 A JP2022521213 A JP 2022521213A JP 7624440 B2 JP7624440 B2 JP 7624440B2
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signal
sample
detector
spatial filter
light
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JP2022552253A (ja
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ラングホースト，マティアス・カール・フランツ
コール，ダニエル・リチャード
グラハム，デビッド・ジョン・レハー
ククラ，フィリップ
プリースト，リー
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レフェイン・リミテッド
オックスフォード ユニヴァーシティ イノヴェーション リミテッド
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/18—Arrangements with more than one light path, e.g. for comparing two specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H04N23/72—Combination of two or more compensation controls
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0092—Polarisation microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements

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  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
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  • Optics & Photonics (AREA)
  • Multimedia (AREA)
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  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2022521213A 2019-10-10 2020-10-09 最適化された干渉散乱顕微鏡法のための方法および装置 Active JP7624440B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1914669.5A GB2588378A (en) 2019-10-10 2019-10-10 Methods and apparatus for optimised interferometric scattering microscopy
GB1914669.5 2019-10-10
PCT/GB2020/052522 WO2021069921A1 (en) 2019-10-10 2020-10-09 Methods and apparatus for optimised interferometric scattering microscopy

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JP2022552253A JP2022552253A (ja) 2022-12-15
JP2022552253A5 JP2022552253A5 (https=) 2023-09-20
JP7624440B2 true JP7624440B2 (ja) 2025-01-30

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US (1) US12111456B2 (https=)
EP (1) EP4042223B1 (https=)
JP (1) JP7624440B2 (https=)
CN (1) CN114787609B (https=)
ES (1) ES2985958T3 (https=)
GB (1) GB2588378A (https=)
WO (1) WO2021069921A1 (https=)

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Publication number Priority date Publication date Assignee Title
GB2593194B (en) * 2020-03-18 2022-09-07 Refeyn Ltd Methods and apparatus for optimised interferometric scattering microscopy
CN116297334B (zh) * 2023-01-22 2025-10-03 清华大学 一种高灵敏度的单分子显微成像方法及系统
WO2024186257A1 (en) * 2023-03-06 2024-09-12 Holtra Ab Interferometric microscopy
EP4528352A1 (en) 2023-09-20 2025-03-26 Ludwig-Maximilians-Universität München Interferometric scattering microscope with a drift stabilization system

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JP2015075340A (ja) 2013-10-07 2015-04-20 アストロデザイン株式会社 光学的距離計測装置
JP2015096943A (ja) 2013-10-11 2015-05-21 パナソニックＩｐマネジメント株式会社 走査型光学顕微鏡
JP2019520612A (ja) 2016-07-13 2019-07-18 オックスフォード ユニヴァーシティ イノヴェーション リミテッド 干渉散乱顕微鏡

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EP1185302B1 (en) 1999-04-28 2013-07-24 Genencor International, Inc. Specifically targeted catalytic antagonists and uses thereof
US20060127010A1 (en) 1999-11-03 2006-06-15 Arkansas State University Optical fibers or other waveguide having one or more modeled tap structures for forming desired illumination patterns and method of making the same
JP2004505313A (ja) 2000-07-27 2004-02-19 ゼテティック・インスティチュート 差分干渉走査型の近接場共焦点顕微鏡検査法
JP2003098439A (ja) 2001-09-25 2003-04-03 Olympus Optical Co Ltd 観察切り替え可能な顕微鏡
US7557929B2 (en) 2001-12-18 2009-07-07 Massachusetts Institute Of Technology Systems and methods for phase measurements
US7223986B2 (en) * 2002-08-29 2007-05-29 Olympus Optical Co., Ltd. Laser scanning microscope
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US8705040B2 (en) 2004-03-06 2014-04-22 Michael Trainer Methods and apparatus for determining particle characteristics by measuring scattered light
JP2008514900A (ja) 2004-07-30 2008-05-08 アデザ・バイオメデイカル・コーポレイシヨン 疾病および他の状態のマーカーとしての癌胎児性フィブロネクチンならびに癌胎児性フィブロネクチンの検出のための方法
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JP2015075340A (ja) 2013-10-07 2015-04-20 アストロデザイン株式会社 光学的距離計測装置
JP2015096943A (ja) 2013-10-11 2015-05-21 パナソニックＩｐマネジメント株式会社 走査型光学顕微鏡
JP2019520612A (ja) 2016-07-13 2019-07-18 オックスフォード ユニヴァーシティ イノヴェーション リミテッド 干渉散乱顕微鏡

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JP2022552253A (ja) 2022-12-15
EP4042223C0 (en) 2024-05-29
GB2588378A (en) 2021-04-28
CN114787609B (zh) 2025-09-09
WO2021069921A1 (en) 2021-04-15
GB201914669D0 (en) 2019-11-27
ES2985958T3 (es) 2024-11-07
US12111456B2 (en) 2024-10-08
EP4042223A1 (en) 2022-08-17
EP4042223B1 (en) 2024-05-29
CN114787609A (zh) 2022-07-22
US20220365329A1 (en) 2022-11-17

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