FR2960291B1 - Methode et dispositif de microscopie interferentielle plein champ a haute resolution - Google Patents

Methode et dispositif de microscopie interferentielle plein champ a haute resolution

Info

Publication number
FR2960291B1
FR2960291B1 FR1053833A FR1053833A FR2960291B1 FR 2960291 B1 FR2960291 B1 FR 2960291B1 FR 1053833 A FR1053833 A FR 1053833A FR 1053833 A FR1053833 A FR 1053833A FR 2960291 B1 FR2960291 B1 FR 2960291B1
Authority
FR
France
Prior art keywords
field
full
resolution
microscopy
interferential
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1053833A
Other languages
English (en)
Other versions
FR2960291A1 (fr
Inventor
Albert Claude Boccara
Fabrice Harms
Conte Chrestien De Poly Bertrand Le
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
LLTECH MANAGEMENT
Original Assignee
LLTECH MANAGEMENT
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by LLTECH MANAGEMENT filed Critical LLTECH MANAGEMENT
Priority to FR1053833A priority Critical patent/FR2960291B1/fr
Priority to PCT/EP2011/057997 priority patent/WO2011144632A1/fr
Priority to ES11723374.2T priority patent/ES2553599T3/es
Priority to US13/698,738 priority patent/US9025150B2/en
Priority to EP11723374.2A priority patent/EP2572157B1/fr
Publication of FR2960291A1 publication Critical patent/FR2960291A1/fr
Application granted granted Critical
Publication of FR2960291B1 publication Critical patent/FR2960291B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02062—Active error reduction, i.e. varying with time
    • G01B9/02067—Active error reduction, i.e. varying with time by electronic control systems, i.e. using feedback acting on optics or light
    • G01B9/02068—Auto-alignment of optical elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
    • G01B9/02082—Caused by speckles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/04—Measuring microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0056—Optical details of the image generation based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/06—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the phase of light

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FR1053833A 2010-05-18 2010-05-18 Methode et dispositif de microscopie interferentielle plein champ a haute resolution Active FR2960291B1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR1053833A FR2960291B1 (fr) 2010-05-18 2010-05-18 Methode et dispositif de microscopie interferentielle plein champ a haute resolution
PCT/EP2011/057997 WO2011144632A1 (fr) 2010-05-18 2011-05-17 Procédé et dispositif pour microscopie à interférence à champ total de haute définition
ES11723374.2T ES2553599T3 (es) 2010-05-18 2011-05-17 Método y dispositivo para microscopía interferencial de campo completo de alta resolución
US13/698,738 US9025150B2 (en) 2010-05-18 2011-05-17 Method and device for high resolution full field interference microscopy
EP11723374.2A EP2572157B1 (fr) 2010-05-18 2011-05-17 Procédé et dispositif pour microscopie à interférence à champ total de haute définition

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1053833A FR2960291B1 (fr) 2010-05-18 2010-05-18 Methode et dispositif de microscopie interferentielle plein champ a haute resolution

Publications (2)

Publication Number Publication Date
FR2960291A1 FR2960291A1 (fr) 2011-11-25
FR2960291B1 true FR2960291B1 (fr) 2015-04-03

Family

ID=43033426

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1053833A Active FR2960291B1 (fr) 2010-05-18 2010-05-18 Methode et dispositif de microscopie interferentielle plein champ a haute resolution

Country Status (5)

Country Link
US (1) US9025150B2 (fr)
EP (1) EP2572157B1 (fr)
ES (1) ES2553599T3 (fr)
FR (1) FR2960291B1 (fr)
WO (1) WO2011144632A1 (fr)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8731272B2 (en) * 2011-01-24 2014-05-20 The Board Of Trustees Of The University Of Illinois Computational adaptive optics for interferometric synthetic aperture microscopy and other interferometric imaging
US9677869B2 (en) 2012-12-05 2017-06-13 Perimeter Medical Imaging, Inc. System and method for generating a wide-field OCT image of a portion of a sample
JP2014160211A (ja) * 2013-02-20 2014-09-04 Canon Inc ミラーユニットおよび画像取得装置
US9230656B2 (en) 2013-06-26 2016-01-05 Sandisk Technologies Inc. System for maintaining back gate threshold voltage in three dimensional NAND memory
JP6231958B2 (ja) * 2014-08-20 2017-11-15 株式会社日立エルジーデータストレージ 光画像計測装置
JP6413076B2 (ja) * 2014-10-01 2018-10-31 パナソニックＩｐマネジメント株式会社 内層測定方法及び装置
FR3034858B1 (fr) * 2015-04-10 2017-05-26 Lltech Man Procede et systeme d'imagerie par microscopie interferentielle plein champ
CN105158888B (zh) * 2015-09-29 2020-09-11 南京理工大学 基于lcd液晶面板的可编程显微镜聚光镜装置及其成像方法
WO2019014767A1 (fr) 2017-07-18 2019-01-24 Perimeter Medical Imaging, Inc. Récipient d'échantillon pour stabiliser et aligner des échantillons de tissu biologique excisés pour analyse ex vivo
US10219700B1 (en) * 2017-12-15 2019-03-05 Hi Llc Systems and methods for quasi-ballistic photon optical coherence tomography in diffusive scattering media using a lock-in camera detector
US10368752B1 (en) 2018-03-08 2019-08-06 Hi Llc Devices and methods to convert conventional imagers into lock-in cameras
WO2019183291A1 (fr) * 2018-03-20 2019-09-26 Cornell University Imagerie par tomographie par cohérence optique (oct) à diverses aberrations pour supprimer le bruit de diffusion optique
TWI677705B (zh) * 2018-04-09 2019-11-21 國立臺北科技大學 使用薩爾瓦稜鏡為剪切元件的剪切干涉顯微鏡
FR3084172B1 (fr) * 2018-07-19 2021-07-02 Centre Nat Rech Scient Procedes et systemes de caracterisation optique non invasive d'un milieu heterogene
CN111426654B (zh) * 2019-01-09 2022-10-11 中国科学院上海光学精密机械研究所 反射式散射光场成像中的背向干扰滤除方法及成像系统

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6480285B1 (en) * 1997-01-28 2002-11-12 Zetetic Institute Multiple layer confocal interference microscopy using wavenumber domain reflectometry and background amplitude reduction and compensation
FR2817030B1 (fr) 2000-11-17 2003-03-28 Centre Nat Rech Scient Procede et dispositif d'imagerie microscopique interferentielle d'un objet a haute cadence
US7394549B2 (en) * 2002-12-18 2008-07-01 Koninklijke Philips Electronics N.V. Method and arrangement for optical coherence tomography
US7623908B2 (en) * 2003-01-24 2009-11-24 The Board Of Trustees Of The University Of Illinois Nonlinear interferometric vibrational imaging
US8054468B2 (en) * 2003-01-24 2011-11-08 The General Hospital Corporation Apparatus and method for ranging and noise reduction of low coherence interferometry LCI and optical coherence tomography OCT signals by parallel detection of spectral bands
FR2865370B1 (fr) * 2004-01-22 2006-04-28 Centre Nat Rech Scient Systeme et procede de tomographie in vivo a haute resolution laterale et axiale de la retine humaine
ATE449319T1 (de) * 2004-08-11 2009-12-15 Max Planck Gesellschaft Verfahren und vorrichtung zur messung von wellenfronten

Also Published As

Publication number Publication date
EP2572157A1 (fr) 2013-03-27
ES2553599T3 (es) 2015-12-10
WO2011144632A1 (fr) 2011-11-24
US20130107268A1 (en) 2013-05-02
EP2572157B1 (fr) 2015-07-15
US9025150B2 (en) 2015-05-05
FR2960291A1 (fr) 2011-11-25

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