GB2588378A - Methods and apparatus for optimised interferometric scattering microscopy - Google Patents

Methods and apparatus for optimised interferometric scattering microscopy Download PDF

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Publication number
GB2588378A
GB2588378A GB1914669.5A GB201914669A GB2588378A GB 2588378 A GB2588378 A GB 2588378A GB 201914669 A GB201914669 A GB 201914669A GB 2588378 A GB2588378 A GB 2588378A
Authority
GB
United Kingdom
Prior art keywords
signal
sample
spatial filter
light
backpropagating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB1914669.5A
Other languages
English (en)
Other versions
GB201914669D0 (en
Inventor
Karl Franz Langhorst Matthias
Richard Cole Daniel
John Lehar Graham David
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oxford University Innovation Ltd
Refeyn Ltd
Original Assignee
Oxford University Innovation Ltd
Refeyn Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oxford University Innovation Ltd, Refeyn Ltd filed Critical Oxford University Innovation Ltd
Priority to GB1914669.5A priority Critical patent/GB2588378A/en
Publication of GB201914669D0 publication Critical patent/GB201914669D0/en
Priority to CN202080071106.4A priority patent/CN114787609B/zh
Priority to US17/767,274 priority patent/US12111456B2/en
Priority to PCT/GB2020/052522 priority patent/WO2021069921A1/en
Priority to JP2022521213A priority patent/JP7624440B2/ja
Priority to ES20792704T priority patent/ES2985958T3/es
Priority to EP20792704.7A priority patent/EP4042223B1/en
Publication of GB2588378A publication Critical patent/GB2588378A/en
Withdrawn legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/18—Arrangements with more than one light path, e.g. for comparing two specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H04N23/72—Combination of two or more compensation controls
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0092—Polarisation microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Multimedia (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
GB1914669.5A 2019-10-10 2019-10-10 Methods and apparatus for optimised interferometric scattering microscopy Withdrawn GB2588378A (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
GB1914669.5A GB2588378A (en) 2019-10-10 2019-10-10 Methods and apparatus for optimised interferometric scattering microscopy
CN202080071106.4A CN114787609B (zh) 2019-10-10 2020-10-09 用于优化的干涉散射显微镜的方法和设备
US17/767,274 US12111456B2 (en) 2019-10-10 2020-10-09 Methods and apparatus for optimised interferometric scattering microscopy
PCT/GB2020/052522 WO2021069921A1 (en) 2019-10-10 2020-10-09 Methods and apparatus for optimised interferometric scattering microscopy
JP2022521213A JP7624440B2 (ja) 2019-10-10 2020-10-09 最適化された干渉散乱顕微鏡法のための方法および装置
ES20792704T ES2985958T3 (es) 2019-10-10 2020-10-09 Métodos y aparatos para microscopía de dispersión interferométrica optimizada
EP20792704.7A EP4042223B1 (en) 2019-10-10 2020-10-09 Methods and apparatus for optimised interferometric scattering microscopy

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1914669.5A GB2588378A (en) 2019-10-10 2019-10-10 Methods and apparatus for optimised interferometric scattering microscopy

Publications (2)

Publication Number Publication Date
GB201914669D0 GB201914669D0 (en) 2019-11-27
GB2588378A true GB2588378A (en) 2021-04-28

Family

ID=68619476

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1914669.5A Withdrawn GB2588378A (en) 2019-10-10 2019-10-10 Methods and apparatus for optimised interferometric scattering microscopy

Country Status (7)

Country Link
US (1) US12111456B2 (https=)
EP (1) EP4042223B1 (https=)
JP (1) JP7624440B2 (https=)
CN (1) CN114787609B (https=)
ES (1) ES2985958T3 (https=)
GB (1) GB2588378A (https=)
WO (1) WO2021069921A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2593194B (en) * 2020-03-18 2022-09-07 Refeyn Ltd Methods and apparatus for optimised interferometric scattering microscopy
CN116297334B (zh) * 2023-01-22 2025-10-03 清华大学 一种高灵敏度的单分子显微成像方法及系统
WO2024186257A1 (en) * 2023-03-06 2024-09-12 Holtra Ab Interferometric microscopy
EP4528352A1 (en) 2023-09-20 2025-03-26 Ludwig-Maximilians-Universität München Interferometric scattering microscope with a drift stabilization system

Citations (2)

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WO2018011591A1 (en) 2016-07-13 2018-01-18 Oxford University Innovation Limited Interferometric scattering microscopy
US20180329189A1 (en) * 2017-05-12 2018-11-15 Applied Materials, Inc. Flexible mode scanning optical microscopy and inspection system

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JP2000249816A (ja) 1998-12-28 2000-09-14 Hitachi Zosen Corp 光学ミラーおよびこの光学ミラーを使用したレーザー投受光装置ならびにレーザー測距装置
EP1185302B1 (en) 1999-04-28 2013-07-24 Genencor International, Inc. Specifically targeted catalytic antagonists and uses thereof
US20060127010A1 (en) 1999-11-03 2006-06-15 Arkansas State University Optical fibers or other waveguide having one or more modeled tap structures for forming desired illumination patterns and method of making the same
JP2004505313A (ja) 2000-07-27 2004-02-19 ゼテティック・インスティチュート 差分干渉走査型の近接場共焦点顕微鏡検査法
JP2003098439A (ja) 2001-09-25 2003-04-03 Olympus Optical Co Ltd 観察切り替え可能な顕微鏡
US7557929B2 (en) 2001-12-18 2009-07-07 Massachusetts Institute Of Technology Systems and methods for phase measurements
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EP1595106A4 (en) 2003-02-13 2007-01-17 Zetetic Inst INTERFEROMETRIC TRANSVERS DIFFERENTIAL CONFOCAL MICROSCOPY
US8705040B2 (en) 2004-03-06 2014-04-22 Michael Trainer Methods and apparatus for determining particle characteristics by measuring scattered light
JP2008514900A (ja) 2004-07-30 2008-05-08 アデザ・バイオメデイカル・コーポレイシヨン 疾病および他の状態のマーカーとしての癌胎児性フィブロネクチンならびに癌胎児性フィブロネクチンの検出のための方法
JP2007225392A (ja) 2006-02-22 2007-09-06 Spectratech Inc 光干渉装置
US8115919B2 (en) 2007-05-04 2012-02-14 The General Hospital Corporation Methods, arrangements and systems for obtaining information associated with a sample using optical microscopy
JP5259154B2 (ja) * 2007-10-24 2013-08-07 オリンパス株式会社 走査型レーザ顕微鏡
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US20180329189A1 (en) * 2017-05-12 2018-11-15 Applied Materials, Inc. Flexible mode scanning optical microscopy and inspection system

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ORTEGA ARROYO ET AL.: "Interferometric scattering microscopy (iSCAT): new frontiers in ultrafast and ultrasensitive optical microscopy", PHYSICAL CHEMISTRY CHEMICAL PHYSICS, vol. 14, 2012, pages 15625 - 15636

Also Published As

Publication number Publication date
JP2022552253A (ja) 2022-12-15
EP4042223C0 (en) 2024-05-29
JP7624440B2 (ja) 2025-01-30
CN114787609B (zh) 2025-09-09
WO2021069921A1 (en) 2021-04-15
GB201914669D0 (en) 2019-11-27
ES2985958T3 (es) 2024-11-07
US12111456B2 (en) 2024-10-08
EP4042223A1 (en) 2022-08-17
EP4042223B1 (en) 2024-05-29
CN114787609A (zh) 2022-07-22
US20220365329A1 (en) 2022-11-17

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