CN114787609B - 用于优化的干涉散射显微镜的方法和设备 - Google Patents

用于优化的干涉散射显微镜的方法和设备

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Publication number
CN114787609B
CN114787609B CN202080071106.4A CN202080071106A CN114787609B CN 114787609 B CN114787609 B CN 114787609B CN 202080071106 A CN202080071106 A CN 202080071106A CN 114787609 B CN114787609 B CN 114787609B
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China
Prior art keywords
signal
sample
detector
light
spatial filter
Prior art date
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Active
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CN202080071106.4A
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English (en)
Chinese (zh)
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CN114787609A (zh
Inventor
马蒂亚斯·卡尔·弗兰兹·兰霍斯特
丹尼尔·理查德·科尔
大卫·约翰·莱哈尔·格拉汉姆
菲利普·库库拉
李·普利斯特
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Raffiene Co ltd
Oxford University Innovation Ltd
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Raffiene Co ltd
Oxford University Innovation Ltd
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Publication of CN114787609A publication Critical patent/CN114787609A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/18—Arrangements with more than one light path, e.g. for comparing two specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H04N23/72—Combination of two or more compensation controls
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0092—Polarisation microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Multimedia (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN202080071106.4A 2019-10-10 2020-10-09 用于优化的干涉散射显微镜的方法和设备 Active CN114787609B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1914669.5A GB2588378A (en) 2019-10-10 2019-10-10 Methods and apparatus for optimised interferometric scattering microscopy
GB1914669.5 2019-10-10
PCT/GB2020/052522 WO2021069921A1 (en) 2019-10-10 2020-10-09 Methods and apparatus for optimised interferometric scattering microscopy

Publications (2)

Publication Number Publication Date
CN114787609A CN114787609A (zh) 2022-07-22
CN114787609B true CN114787609B (zh) 2025-09-09

Family

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Family Applications (1)

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CN202080071106.4A Active CN114787609B (zh) 2019-10-10 2020-10-09 用于优化的干涉散射显微镜的方法和设备

Country Status (7)

Country Link
US (1) US12111456B2 (https=)
EP (1) EP4042223B1 (https=)
JP (1) JP7624440B2 (https=)
CN (1) CN114787609B (https=)
ES (1) ES2985958T3 (https=)
GB (1) GB2588378A (https=)
WO (1) WO2021069921A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2593194B (en) * 2020-03-18 2022-09-07 Refeyn Ltd Methods and apparatus for optimised interferometric scattering microscopy
CN116297334B (zh) * 2023-01-22 2025-10-03 清华大学 一种高灵敏度的单分子显微成像方法及系统
WO2024186257A1 (en) * 2023-03-06 2024-09-12 Holtra Ab Interferometric microscopy
EP4528352A1 (en) 2023-09-20 2025-03-26 Ludwig-Maximilians-Universität München Interferometric scattering microscope with a drift stabilization system

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109477955A (zh) * 2016-07-13 2019-03-15 牛津大学科技创新有限公司 干涉散射显微镜

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JP2000249816A (ja) 1998-12-28 2000-09-14 Hitachi Zosen Corp 光学ミラーおよびこの光学ミラーを使用したレーザー投受光装置ならびにレーザー測距装置
EP1185302B1 (en) 1999-04-28 2013-07-24 Genencor International, Inc. Specifically targeted catalytic antagonists and uses thereof
US20060127010A1 (en) 1999-11-03 2006-06-15 Arkansas State University Optical fibers or other waveguide having one or more modeled tap structures for forming desired illumination patterns and method of making the same
JP2004505313A (ja) 2000-07-27 2004-02-19 ゼテティック・インスティチュート 差分干渉走査型の近接場共焦点顕微鏡検査法
JP2003098439A (ja) 2001-09-25 2003-04-03 Olympus Optical Co Ltd 観察切り替え可能な顕微鏡
US7557929B2 (en) 2001-12-18 2009-07-07 Massachusetts Institute Of Technology Systems and methods for phase measurements
US7223986B2 (en) * 2002-08-29 2007-05-29 Olympus Optical Co., Ltd. Laser scanning microscope
EP1595106A4 (en) 2003-02-13 2007-01-17 Zetetic Inst INTERFEROMETRIC TRANSVERS DIFFERENTIAL CONFOCAL MICROSCOPY
US8705040B2 (en) 2004-03-06 2014-04-22 Michael Trainer Methods and apparatus for determining particle characteristics by measuring scattered light
JP2008514900A (ja) 2004-07-30 2008-05-08 アデザ・バイオメデイカル・コーポレイシヨン 疾病および他の状態のマーカーとしての癌胎児性フィブロネクチンならびに癌胎児性フィブロネクチンの検出のための方法
JP2007225392A (ja) 2006-02-22 2007-09-06 Spectratech Inc 光干渉装置
US8115919B2 (en) 2007-05-04 2012-02-14 The General Hospital Corporation Methods, arrangements and systems for obtaining information associated with a sample using optical microscopy
JP5259154B2 (ja) * 2007-10-24 2013-08-07 オリンパス株式会社 走査型レーザ顕微鏡
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Also Published As

Publication number Publication date
JP2022552253A (ja) 2022-12-15
EP4042223C0 (en) 2024-05-29
JP7624440B2 (ja) 2025-01-30
GB2588378A (en) 2021-04-28
WO2021069921A1 (en) 2021-04-15
GB201914669D0 (en) 2019-11-27
ES2985958T3 (es) 2024-11-07
US12111456B2 (en) 2024-10-08
EP4042223A1 (en) 2022-08-17
EP4042223B1 (en) 2024-05-29
CN114787609A (zh) 2022-07-22
US20220365329A1 (en) 2022-11-17

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