JP2022552253A5 - - Google Patents
Info
- Publication number
- JP2022552253A5 JP2022552253A5 JP2022521213A JP2022521213A JP2022552253A5 JP 2022552253 A5 JP2022552253 A5 JP 2022552253A5 JP 2022521213 A JP2022521213 A JP 2022521213A JP 2022521213 A JP2022521213 A JP 2022521213A JP 2022552253 A5 JP2022552253 A5 JP 2022552253A5
- Authority
- JP
- Japan
- Prior art keywords
- signal
- sample
- detector
- spatial filter
- intensity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB1914669.5A GB2588378A (en) | 2019-10-10 | 2019-10-10 | Methods and apparatus for optimised interferometric scattering microscopy |
| GB1914669.5 | 2019-10-10 | ||
| PCT/GB2020/052522 WO2021069921A1 (en) | 2019-10-10 | 2020-10-09 | Methods and apparatus for optimised interferometric scattering microscopy |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2022552253A JP2022552253A (ja) | 2022-12-15 |
| JP2022552253A5 true JP2022552253A5 (https=) | 2023-09-20 |
| JP7624440B2 JP7624440B2 (ja) | 2025-01-30 |
Family
ID=68619476
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022521213A Active JP7624440B2 (ja) | 2019-10-10 | 2020-10-09 | 最適化された干渉散乱顕微鏡法のための方法および装置 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US12111456B2 (https=) |
| EP (1) | EP4042223B1 (https=) |
| JP (1) | JP7624440B2 (https=) |
| CN (1) | CN114787609B (https=) |
| ES (1) | ES2985958T3 (https=) |
| GB (1) | GB2588378A (https=) |
| WO (1) | WO2021069921A1 (https=) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2593194B (en) * | 2020-03-18 | 2022-09-07 | Refeyn Ltd | Methods and apparatus for optimised interferometric scattering microscopy |
| CN116297334B (zh) * | 2023-01-22 | 2025-10-03 | 清华大学 | 一种高灵敏度的单分子显微成像方法及系统 |
| WO2024186257A1 (en) * | 2023-03-06 | 2024-09-12 | Holtra Ab | Interferometric microscopy |
| EP4528352A1 (en) | 2023-09-20 | 2025-03-26 | Ludwig-Maximilians-Universität München | Interferometric scattering microscope with a drift stabilization system |
Family Cites Families (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3117450B2 (ja) | 1990-05-10 | 2000-12-11 | 日本分光工業株式会社 | 半透鏡 |
| JP2000249816A (ja) | 1998-12-28 | 2000-09-14 | Hitachi Zosen Corp | 光学ミラーおよびこの光学ミラーを使用したレーザー投受光装置ならびにレーザー測距装置 |
| EP1185302B1 (en) | 1999-04-28 | 2013-07-24 | Genencor International, Inc. | Specifically targeted catalytic antagonists and uses thereof |
| US20060127010A1 (en) | 1999-11-03 | 2006-06-15 | Arkansas State University | Optical fibers or other waveguide having one or more modeled tap structures for forming desired illumination patterns and method of making the same |
| JP2004505313A (ja) | 2000-07-27 | 2004-02-19 | ゼテティック・インスティチュート | 差分干渉走査型の近接場共焦点顕微鏡検査法 |
| JP2003098439A (ja) | 2001-09-25 | 2003-04-03 | Olympus Optical Co Ltd | 観察切り替え可能な顕微鏡 |
| US7557929B2 (en) | 2001-12-18 | 2009-07-07 | Massachusetts Institute Of Technology | Systems and methods for phase measurements |
| US7223986B2 (en) * | 2002-08-29 | 2007-05-29 | Olympus Optical Co., Ltd. | Laser scanning microscope |
| EP1595106A4 (en) | 2003-02-13 | 2007-01-17 | Zetetic Inst | INTERFEROMETRIC TRANSVERS DIFFERENTIAL CONFOCAL MICROSCOPY |
| US8705040B2 (en) | 2004-03-06 | 2014-04-22 | Michael Trainer | Methods and apparatus for determining particle characteristics by measuring scattered light |
| JP2008514900A (ja) | 2004-07-30 | 2008-05-08 | アデザ・バイオメデイカル・コーポレイシヨン | 疾病および他の状態のマーカーとしての癌胎児性フィブロネクチンならびに癌胎児性フィブロネクチンの検出のための方法 |
| JP2007225392A (ja) | 2006-02-22 | 2007-09-06 | Spectratech Inc | 光干渉装置 |
| US8115919B2 (en) | 2007-05-04 | 2012-02-14 | The General Hospital Corporation | Methods, arrangements and systems for obtaining information associated with a sample using optical microscopy |
| JP5259154B2 (ja) * | 2007-10-24 | 2013-08-07 | オリンパス株式会社 | 走査型レーザ顕微鏡 |
| WO2011059833A2 (en) | 2009-10-29 | 2011-05-19 | California Institute Of Technology | Dual-mode raster point scanning/light sheet illumination microscope |
| US8873027B2 (en) | 2010-04-23 | 2014-10-28 | Hamamatsu Photonics K.K. | Cell observation device and cell observation method |
| FR2960291B1 (fr) * | 2010-05-18 | 2015-04-03 | Lltech Man | Methode et dispositif de microscopie interferentielle plein champ a haute resolution |
| JP5492796B2 (ja) | 2011-01-20 | 2014-05-14 | 株式会社日立製作所 | 光学装置 |
| JP5611149B2 (ja) | 2011-08-23 | 2014-10-22 | 株式会社日立ハイテクノロジーズ | 光学顕微鏡装置及びこれを備えた検査装置 |
| US9316536B2 (en) | 2013-06-24 | 2016-04-19 | ASTRODESIGN, Inc. | Spatial frequency reproducing apparatus and optical distance measuring apparatus |
| JP6230358B2 (ja) | 2013-10-07 | 2017-11-15 | アストロデザイン株式会社 | 光学的距離計測装置 |
| US9170411B2 (en) | 2013-10-11 | 2015-10-27 | Panasonic Intellectual Property Management Co., Ltd. | Scanning optical microscope |
| GB201318919D0 (en) | 2013-10-25 | 2013-12-11 | Isis Innovation | Compact microscope |
| GB2552195A (en) * | 2016-07-13 | 2018-01-17 | Univ Oxford Innovation Ltd | Interferometric scattering microscopy |
| EP3276389A1 (en) | 2016-07-27 | 2018-01-31 | Fundació Institut de Ciències Fotòniques | A common-path interferometric scattering imaging system and a method of using common-path interferometric scattering imaging to detect an object |
| US10422984B2 (en) * | 2017-05-12 | 2019-09-24 | Applied Materials, Inc. | Flexible mode scanning optical microscopy and inspection system |
-
2019
- 2019-10-10 GB GB1914669.5A patent/GB2588378A/en not_active Withdrawn
-
2020
- 2020-10-09 EP EP20792704.7A patent/EP4042223B1/en active Active
- 2020-10-09 CN CN202080071106.4A patent/CN114787609B/zh active Active
- 2020-10-09 JP JP2022521213A patent/JP7624440B2/ja active Active
- 2020-10-09 WO PCT/GB2020/052522 patent/WO2021069921A1/en not_active Ceased
- 2020-10-09 ES ES20792704T patent/ES2985958T3/es active Active
- 2020-10-09 US US17/767,274 patent/US12111456B2/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2022552253A5 (https=) | ||
| TWI683098B (zh) | 用於執行光學度量之系統 | |
| JP2017219826A (ja) | 波面制御器を用いた３次元屈折率映像撮影および蛍光構造化照明顕微鏡システムと、これを利用した方法 | |
| JP2019504325A (ja) | ハイパースペクトルイメージング計量システム及び方法 | |
| JP2011507040A (ja) | 顕微鏡 | |
| US20150124073A1 (en) | Illumination optical system and microscope | |
| JP2022509599A5 (https=) | ||
| US9715096B2 (en) | Microscope apparatus | |
| CN103018173B (zh) | 结构光照明层析显微成像系统 | |
| JPS61198012A (ja) | 表面検査装置 | |
| US20230143639A1 (en) | Speckle-reduced illumination for improved scattering-based microscopy | |
| US8764241B2 (en) | Ring light source system for interferometer with adjustable ring radius and ring radial width | |
| US10983055B2 (en) | Sample observation apparatus | |
| US11500187B2 (en) | Systems, methods, and structures for broadband phase shifting for quantitative phase microscopy | |
| TW202204970A (zh) | 用於最佳化對比度以與模糊成像系統一起使用的方法及裝置 | |
| CN117607114A (zh) | 一种基于偏振干涉的结构光照明多通道层析成像系统 | |
| RU2608012C2 (ru) | Двухканальный дифракционный фазовый микроскоп | |
| KR100372322B1 (ko) | 검사장치 | |
| JP7762411B2 (ja) | 光干渉光学系および光干渉測定システム | |
| RU2400667C1 (ru) | Осветительная система | |
| US12210175B2 (en) | All-optical volumetric imaging via spectral sweep by means of a transmissive bragg grating featuring a radially dependent plane of diffraction | |
| RU2464608C1 (ru) | Оптическая система голографической видеокамеры | |
| KR20020049493A (ko) | 대면적 홀로그래픽 회절격자 생성방법 및 장치 | |
| KR100798085B1 (ko) | 반사형 디지털 홀로그래피 현미경 시스템에서 조사면적 및재생면적의 확대 시스템 및 방법 | |
| US9170414B2 (en) | Method and apparatus for producing a super-magnified wide-field image |