JP7509450B2 - 多重範囲材料測定における遷移効果を減少させるためのレンジングシステムおよび方法 - Google Patents

多重範囲材料測定における遷移効果を減少させるためのレンジングシステムおよび方法 Download PDF

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JP7509450B2
JP7509450B2 JP2022565606A JP2022565606A JP7509450B2 JP 7509450 B2 JP7509450 B2 JP 7509450B2 JP 2022565606 A JP2022565606 A JP 2022565606A JP 2022565606 A JP2022565606 A JP 2022565606A JP 7509450 B2 JP7509450 B2 JP 7509450B2
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JP2023516228A (ja
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ヒューストン フォートニー，
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レイク ショア クライオトロニクス インコーポレイテッド
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/1205—Multiplexed conversion systems
    • H03M1/121—Interleaved, i.e. using multiple converters or converter parts for one channel
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/02—Digital function generators
    • G06F1/022—Waveform generators, i.e. devices for generating periodical functions of time, e.g. direct digital synthesizers
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/20—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers
    • H03F3/21—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers with semiconductor devices only
    • H03F3/211—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers with semiconductor devices only using a combination of several amplifiers
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03G—CONTROL OF AMPLIFICATION
    • H03G3/00—Gain control in amplifiers or frequency changers
    • H03G3/001—Digital control of analog signals
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/08—Continuously compensating for, or preventing, undesired influence of physical parameters of noise
    • H03M1/0845—Continuously compensating for, or preventing, undesired influence of physical parameters of noise of power supply variations, e.g. ripple
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/18—Automatic control for modifying the range of signals the converter can handle, e.g. gain ranging
    • H03M1/188—Multi-path, i.e. having a separate analogue/digital converter for each possible range
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/662—Multiplexed conversion systems

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Analogue/Digital Conversion (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Amplifiers (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Steroid Compounds (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Reduction Or Emphasis Of Bandwidth Of Signals (AREA)
  • Transmission Systems Not Characterized By The Medium Used For Transmission (AREA)
JP2022565606A 2020-04-28 2021-04-27 多重範囲材料測定における遷移効果を減少させるためのレンジングシステムおよび方法 Active JP7509450B2 (ja)

Priority Applications (1)

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JP2024095793A JP2024111035A (ja) 2020-04-28 2024-06-13 多重範囲材料測定における遷移効果を減少させるためのレンジングシステムおよび方法

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
US202063016747P 2020-04-28 2020-04-28
US63/016,747 2020-04-28
US202063034052P 2020-06-03 2020-06-03
US63/034,052 2020-06-03
US202063057745P 2020-07-28 2020-07-28
US63/057,745 2020-07-28
PCT/US2021/029328 WO2021222197A1 (en) 2020-04-28 2021-04-27 Ranging systems and methods for decreasing transitive effects in multi-range materials measurements

Related Child Applications (1)

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JP2024095793A Division JP2024111035A (ja) 2020-04-28 2024-06-13 多重範囲材料測定における遷移効果を減少させるためのレンジングシステムおよび方法

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JP2023516228A JP2023516228A (ja) 2023-04-18
JP7509450B2 true JP7509450B2 (ja) 2024-07-02

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JP2022565606A Active JP7509450B2 (ja) 2020-04-28 2021-04-27 多重範囲材料測定における遷移効果を減少させるためのレンジングシステムおよび方法
JP2022565607A Pending JP2023524216A (ja) 2020-04-28 2021-04-27 同期的な正確な材料性質測定のための統合された測定システムおよび方法
JP2022565605A Active JP7667581B2 (ja) 2020-04-28 2021-04-27 ハイブリッドデジタルおよびアナログ信号発生システムおよび方法
JP2024095793A Pending JP2024111035A (ja) 2020-04-28 2024-06-13 多重範囲材料測定における遷移効果を減少させるためのレンジングシステムおよび方法
JP2024108053A Pending JP2024127991A (ja) 2020-04-28 2024-07-04 ハイブリッドデジタルおよびアナログ信号発生システムおよび方法
JP2025100127A Pending JP2025124921A (ja) 2020-04-28 2025-06-16 同期的な正確な材料性質測定のための統合された測定システムおよび方法

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JP2022565607A Pending JP2023524216A (ja) 2020-04-28 2021-04-27 同期的な正確な材料性質測定のための統合された測定システムおよび方法
JP2022565605A Active JP7667581B2 (ja) 2020-04-28 2021-04-27 ハイブリッドデジタルおよびアナログ信号発生システムおよび方法
JP2024095793A Pending JP2024111035A (ja) 2020-04-28 2024-06-13 多重範囲材料測定における遷移効果を減少させるためのレンジングシステムおよび方法
JP2024108053A Pending JP2024127991A (ja) 2020-04-28 2024-07-04 ハイブリッドデジタルおよびアナログ信号発生システムおよび方法
JP2025100127A Pending JP2025124921A (ja) 2020-04-28 2025-06-16 同期的な正確な材料性質測定のための統合された測定システムおよび方法

Country Status (8)

Country Link
US (7) US11762050B2 (https=)
EP (3) EP4143977A4 (https=)
JP (6) JP7509450B2 (https=)
KR (4) KR102947763B1 (https=)
CN (5) CN115667946A (https=)
IL (4) IL297747A (https=)
TW (4) TWI854120B (https=)
WO (3) WO2021222202A1 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2024111035A (ja) * 2020-04-28 2024-08-16 レイク ショア クライオトロニクス インコーポレイテッド 多重範囲材料測定における遷移効果を減少させるためのレンジングシステムおよび方法

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CN114371761B (zh) * 2021-12-13 2024-06-04 中电科思仪科技股份有限公司 任意波形发生器输出信号电压摆幅的自校准电路及方法
ES3056262T3 (en) 2022-03-21 2026-02-19 Kistler Holding Ag System for operating a physical measuring chain
US11609593B1 (en) * 2022-04-02 2023-03-21 Oleksandr Kokorin Fast LCR meter with leakage compensation
GB2634422A (en) * 2022-06-14 2025-04-09 Electro Rent Corp Systems, devices, and methods for asset usage and utilization measurement and monitoring
TWI839001B (zh) * 2022-12-05 2024-04-11 立積電子股份有限公司 直流偏移校正裝置及其直流偏移校正方法
CN121079606A (zh) * 2023-03-13 2025-12-05 量子谷投资基金有限合伙公司 磁共振系统的数字操作
CN116298450B (zh) * 2023-05-23 2023-08-15 深圳市鼎阳科技股份有限公司 一种用于数字示波器的探头设置方法和数字示波器
TWI898766B (zh) * 2024-08-07 2025-09-21 聯華電子股份有限公司 隨機亂數產生電路與方法
CN120908512B (zh) * 2025-10-11 2025-12-16 北京量子信息科学研究院 基于量子反常霍尔效应的量子电流测量方法及测量装置

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