KR102947763B1 - 다중-범위 재료 측정들에서 천이 효과들을 감소시키기 위한 레인징 시스템들 및 방법들 - Google Patents

다중-범위 재료 측정들에서 천이 효과들을 감소시키기 위한 레인징 시스템들 및 방법들

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Publication number
KR102947763B1
KR102947763B1 KR1020237043493A KR20237043493A KR102947763B1 KR 102947763 B1 KR102947763 B1 KR 102947763B1 KR 1020237043493 A KR1020237043493 A KR 1020237043493A KR 20237043493 A KR20237043493 A KR 20237043493A KR 102947763 B1 KR102947763 B1 KR 102947763B1
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South Korea
Prior art keywords
gain
range
adc
adcs
input signal
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Korean (ko)
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KR20230173752A (ko
Inventor
휴스턴 포트니
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레이크 쇼어 크라이오트로닉스 인코포레이티드
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/02—Digital function generators
    • G06F1/022—Waveform generators, i.e. devices for generating periodical functions of time, e.g. direct digital synthesizers
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/20—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers
    • H03F3/21—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers with semiconductor devices only
    • H03F3/211—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers with semiconductor devices only using a combination of several amplifiers
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03G—CONTROL OF AMPLIFICATION
    • H03G3/00—Gain control in amplifiers or frequency changers
    • H03G3/001—Digital control of analog signals
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/08—Continuously compensating for, or preventing, undesired influence of physical parameters of noise
    • H03M1/0845—Continuously compensating for, or preventing, undesired influence of physical parameters of noise of power supply variations, e.g. ripple
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/1205—Multiplexed conversion systems
    • H03M1/121—Interleaved, i.e. using multiple converters or converter parts for one channel
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/18—Automatic control for modifying the range of signals the converter can handle, e.g. gain ranging
    • H03M1/188—Multi-path, i.e. having a separate analogue/digital converter for each possible range
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/662—Multiplexed conversion systems

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Analogue/Digital Conversion (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Amplifiers (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Steroid Compounds (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Reduction Or Emphasis Of Bandwidth Of Signals (AREA)
  • Transmission Systems Not Characterized By The Medium Used For Transmission (AREA)
KR1020237043493A 2020-04-28 2021-04-27 다중-범위 재료 측정들에서 천이 효과들을 감소시키기 위한 레인징 시스템들 및 방법들 Active KR102947763B1 (ko)

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
US202063016747P 2020-04-28 2020-04-28
US63/016,747 2020-04-28
US202063034052P 2020-06-03 2020-06-03
US63/034,052 2020-06-03
US202063057745P 2020-07-28 2020-07-28
US63/057,745 2020-07-28
KR1020227041608A KR102619757B1 (ko) 2020-04-28 2021-04-27 다중-범위 재료 측정들에서 천이 효과들을 감소시키기 위한 레인징 시스템들 및 방법들
PCT/US2021/029328 WO2021222197A1 (en) 2020-04-28 2021-04-27 Ranging systems and methods for decreasing transitive effects in multi-range materials measurements

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
KR1020227041608A Division KR102619757B1 (ko) 2020-04-28 2021-04-27 다중-범위 재료 측정들에서 천이 효과들을 감소시키기 위한 레인징 시스템들 및 방법들

Publications (2)

Publication Number Publication Date
KR20230173752A KR20230173752A (ko) 2023-12-27
KR102947763B1 true KR102947763B1 (ko) 2026-04-02

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ID=78222102

Family Applications (4)

Application Number Title Priority Date Filing Date
KR1020237043493A Active KR102947763B1 (ko) 2020-04-28 2021-04-27 다중-범위 재료 측정들에서 천이 효과들을 감소시키기 위한 레인징 시스템들 및 방법들
KR1020227041609A Active KR102747727B1 (ko) 2020-04-28 2021-04-27 하이브리드 디지털 및 아날로그 신호 생성 시스템들 및 방법들
KR1020227041608A Active KR102619757B1 (ko) 2020-04-28 2021-04-27 다중-범위 재료 측정들에서 천이 효과들을 감소시키기 위한 레인징 시스템들 및 방법들
KR1020227041610A Active KR102841784B1 (ko) 2020-04-28 2021-04-27 동기식의 정확한 재료 특성 측정을 위한 통합 측정 시스템 및 방법

Family Applications After (3)

Application Number Title Priority Date Filing Date
KR1020227041609A Active KR102747727B1 (ko) 2020-04-28 2021-04-27 하이브리드 디지털 및 아날로그 신호 생성 시스템들 및 방법들
KR1020227041608A Active KR102619757B1 (ko) 2020-04-28 2021-04-27 다중-범위 재료 측정들에서 천이 효과들을 감소시키기 위한 레인징 시스템들 및 방법들
KR1020227041610A Active KR102841784B1 (ko) 2020-04-28 2021-04-27 동기식의 정확한 재료 특성 측정을 위한 통합 측정 시스템 및 방법

Country Status (8)

Country Link
US (7) US11762050B2 (https=)
EP (3) EP4143977A4 (https=)
JP (6) JP7509450B2 (https=)
KR (4) KR102947763B1 (https=)
CN (5) CN115667946A (https=)
IL (4) IL297747A (https=)
TW (4) TWI854120B (https=)
WO (3) WO2021222202A1 (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102947763B1 (ko) 2020-04-28 2026-04-02 레이크 쇼어 크라이오트로닉스 인코포레이티드 다중-범위 재료 측정들에서 천이 효과들을 감소시키기 위한 레인징 시스템들 및 방법들
CN114371761B (zh) * 2021-12-13 2024-06-04 中电科思仪科技股份有限公司 任意波形发生器输出信号电压摆幅的自校准电路及方法
ES3056262T3 (en) 2022-03-21 2026-02-19 Kistler Holding Ag System for operating a physical measuring chain
US11609593B1 (en) * 2022-04-02 2023-03-21 Oleksandr Kokorin Fast LCR meter with leakage compensation
GB2634422A (en) * 2022-06-14 2025-04-09 Electro Rent Corp Systems, devices, and methods for asset usage and utilization measurement and monitoring
TWI839001B (zh) * 2022-12-05 2024-04-11 立積電子股份有限公司 直流偏移校正裝置及其直流偏移校正方法
CN121079606A (zh) * 2023-03-13 2025-12-05 量子谷投资基金有限合伙公司 磁共振系统的数字操作
CN116298450B (zh) * 2023-05-23 2023-08-15 深圳市鼎阳科技股份有限公司 一种用于数字示波器的探头设置方法和数字示波器
TWI898766B (zh) * 2024-08-07 2025-09-21 聯華電子股份有限公司 隨機亂數產生電路與方法
CN120908512B (zh) * 2025-10-11 2025-12-16 北京量子信息科学研究院 基于量子反常霍尔效应的量子电流测量方法及测量装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150188556A1 (en) * 2012-08-13 2015-07-02 University Of South Australia System and Method for Analog to Digital Conversion

Family Cites Families (138)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3293556A (en) 1959-07-06 1966-12-20 Kenneth L Kotzebue Phase-locked amplifier
US3424981A (en) 1964-11-12 1969-01-28 Keithley Instruments Low level d.c. voltage apparatus employing a balanced modulator and filter means to remove spurious signals
US3509558A (en) 1965-10-22 1970-04-28 Nasa Wide range data compression system
US3467958A (en) 1965-12-29 1969-09-16 Martin Marietta Corp Analog to digital converter using a plurality of radix amplifiers
US3855589A (en) 1969-11-25 1974-12-17 Sylvania Electric Prod Analog to digital converter with variable quantization and dynamic range
US3626252A (en) 1970-01-21 1971-12-07 Keithley Instruments Temperature equalization for printed circuits
US3654560A (en) 1970-06-26 1972-04-04 Keithley Instruments Drift compensated circuit
US3757241A (en) 1971-11-24 1973-09-04 Keithley Instruments A c amplifier having d c bias stabilization
US3757216A (en) 1971-12-13 1973-09-04 Keithley Instruments Electrical test instrument
US3820112A (en) 1973-10-01 1974-06-25 A Roth High speed analog-to-digital conversion system
US3979642A (en) 1973-12-27 1976-09-07 Keithley Instruments, Inc. Electronic protective circuit
US3875506A (en) 1973-12-27 1975-04-01 Keithley Instruments Electronic protective circuit
US4129864A (en) 1976-03-03 1978-12-12 The United States Of America As Represented By The Secretary Of Commerce High speed, wide dynamic range analog-to-digital conversion
US4069479A (en) 1976-03-03 1978-01-17 The United States Of America As Represented By The Secretary Of Commerce High speed, wide dynamic range analog-to-digital conversion
US4127811A (en) 1976-09-03 1978-11-28 Hewlett-Packard Company Auto-calibrating voltmeter
FR2441956A1 (fr) 1978-11-17 1980-06-13 Inst Francais Du Petrole Methode d'amplification de signaux multiplexes et dispositif de mise en oeuvre
US4383247A (en) 1981-06-25 1983-05-10 The United States Of America As Represented By The Secretary Of The Navy Gain-step companding analog to digital converter
US4544917A (en) 1982-09-16 1985-10-01 Westinghouse Electric Corp. A/D converter having digitally controlled subranging and self-alignment apparatus for use therein
US4652882A (en) 1982-09-30 1987-03-24 Raytheon Company Receiver with wide dynamic range
US4564018A (en) 1982-10-28 1986-01-14 Storz Instrument Company Ultrasonic system for obtaining ocular measurements
US4542346A (en) 1982-12-07 1985-09-17 The United States Of America As Represented By The United States Department Of Energy Wide-range lock-in amplifier
GB8304618D0 (en) 1983-02-18 1983-03-23 Faulkner E A Lock-in amplifier
US4674062A (en) 1984-04-20 1987-06-16 General Electric Company Apparatus and method to increase dynamic range of digital measurements
US4598253A (en) 1984-09-17 1986-07-01 Keithley Instruments, Inc. JFET ohmic differential amplifier
US4807146A (en) 1986-02-19 1989-02-21 Louisiana State University Digital lock-in amplifier
US4733217A (en) 1986-05-08 1988-03-22 Rca Corporation Subranging analog to digital converter
DE3627610A1 (de) 1986-08-14 1988-02-25 Max Planck Gesellschaft Synchronisierter messverstaerker
JPH0738585B2 (ja) * 1986-10-21 1995-04-26 日本電気株式会社 デジタル／アナログ変換装置
US4823129A (en) 1987-02-24 1989-04-18 Bison Instruments, Inc. Analog-to-digital converter
EP0310960A3 (en) 1987-10-05 1990-04-25 Advantest Corporation Digital lock-in amplifier
US5023552A (en) 1989-01-27 1991-06-11 U.S. Philips Corp. Magnetic resonance device with a selectable gain signal amplifier
JPH02246943A (ja) 1989-03-20 1990-10-02 Matsushita Electric Ind Co Ltd 超音波診断装置用ａ／ｄ変換装置
JPH065819B2 (ja) 1989-06-29 1994-01-19 ヤマハ株式会社 Ａ／ｄ変換装置
US5015963A (en) 1989-09-29 1991-05-14 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Synchronous demodulator
US5144154A (en) 1990-05-21 1992-09-01 Keithley Instruments, Inc. Range changing using N and P channel FETS
US5039934A (en) 1990-05-22 1991-08-13 Keithley Instruments, Inc. Control for voltage/current source with current/voltage limiting
US5138319A (en) 1990-08-30 1992-08-11 Harris Corporation Two stage a/d converter utilizing dual multiplexed converters with a common converter
US5111202A (en) 1991-03-28 1992-05-05 Itt Corporation Extended dynamic range quadrature detector with parallel channel arrangement
US5353027A (en) 1991-11-01 1994-10-04 U.S. Philips Corporation Multistep analog-to-digital converter with error correction
US5250948A (en) 1991-12-19 1993-10-05 Eastman Kodak Company High level resolution enhancement for dual-range A/D conversion
US5382956A (en) 1992-04-30 1995-01-17 Hewlett Packard Co Integrated circuit for physiological signal measurement
US5210484A (en) 1992-05-15 1993-05-11 Louis R. Fantozzi Lock-in amplifier
JP3094314B2 (ja) * 1992-09-28 2000-10-03 日本光電工業株式会社 Ａ／ｄコンバータ
US5386188A (en) 1993-01-15 1995-01-31 Keithley Instruments, Inc. In-circuit current measurement
US5422643A (en) 1993-02-24 1995-06-06 Antel Optronics Inc. High dynamic range digitizer
US5414348A (en) 1993-02-26 1995-05-09 Niemann; James A. Measurement device with common mode current cancellation
US5491548A (en) * 1994-03-18 1996-02-13 Tektronix, Inc. Optical signal measurement instrument and wide dynamic range optical receiver for use therein
DE19502047C2 (de) * 1995-01-12 1996-12-05 Stage Tec Gmbh Verfahren zur Analog-Digital-Wandlung von Signalen
DK0707383T3 (da) 1994-06-14 2002-08-19 Stage Tec Entwicklungsgesellsc Koblingsindretning til analog-digital-omskiftning af signaler
US5490325A (en) 1994-09-30 1996-02-13 Keithley Instruments Guarded printed circuit board islands
US5684480A (en) 1995-01-30 1997-11-04 Telefonaktiebolaget Lm Ericsson Wide dynamic range analog to digital conversion
KR0142467B1 (ko) 1995-05-26 1998-10-01 김광호 지연된 보호 회로 기능을 갖는 피드백 회로
JPH09166491A (ja) 1995-10-14 1997-06-24 Horiba Ltd インターフェログラムの処理方法および処理回路
US5807272A (en) * 1995-10-31 1998-09-15 Worcester Polytechnic Institute Impedance spectroscopy system for ischemia monitoring and detection
US5777569A (en) 1995-11-30 1998-07-07 Victor Company Of Japan, Ltd. Analog-to-digital conversion apparatus and method related thereto
DE19629555C1 (de) 1996-07-22 1997-11-13 Cosmos Mestechnik Gmbh Lock-In-Verstärker mit wählbarer Phasenselektivität
JP3471550B2 (ja) 1997-01-30 2003-12-02 松下電器産業株式会社 Ａ／ｄ変換装置
JP3171141B2 (ja) * 1997-06-06 2001-05-28 日本電気株式会社 移動体通信用送信機およびその制御方法
JP3304826B2 (ja) 1997-06-24 2002-07-22 ヤマハ株式会社 フローティング型ａ／ｄ変換器
US5999002A (en) 1997-08-15 1999-12-07 Keithley Instruments, Inc. Contact check for remote sensed measurement
US5886530A (en) 1997-08-15 1999-03-23 Keithley Instruments, Inc. Test contact connection checking method and circuit
US6069484A (en) 1997-09-25 2000-05-30 Keithley Instruments, Inc. Source measure unit current preamplifier
US6031478A (en) 1998-02-19 2000-02-29 Nortel Networks Corporation Dynamic range extension of wideband receiver
US6333707B1 (en) 1998-02-19 2001-12-25 Nortel Networks Limited Dynamic range extension of wideband receiver
US6636319B1 (en) 1998-08-10 2003-10-21 Gerald Auth Spectrometer with dual digitizer for high-dynamic range spectroscopic data collection
US6271780B1 (en) * 1998-10-08 2001-08-07 Cirrus Logic, Inc. Gain ranging analog-to-digital converter with error correction
US6317065B1 (en) 1999-07-01 2001-11-13 Cisco Technology, Inc. Multiple A to D converters for enhanced dynamic range
US6489797B1 (en) 1999-07-15 2002-12-03 Ltx Corporation Test system including a test head with integral device for generating and measuring output having variable current or voltage characteristics
US6501255B2 (en) 2000-11-21 2002-12-31 Lake Shore Cryotronics, Inc. Differential current source with active common mode reduction
US6445328B1 (en) 2001-03-22 2002-09-03 The United States Of America As Represented By The Secretary Of The Army Large dynamic range digitizing apparatus and method
US6621433B1 (en) 2001-06-22 2003-09-16 Fonar Corporation Adaptive dynamic range receiver for MRI
EP1415400A2 (en) 2001-07-17 2004-05-06 Honeywell International Inc. Dual analog-to-digital converter system for increased dynamic range
US6993291B2 (en) 2001-10-11 2006-01-31 Nokia Corporation Method and apparatus for continuously controlling the dynamic range from an analog-to-digital converter
US7167655B2 (en) 2002-03-04 2007-01-23 Exfo Electro-Optical Engineering Inc. Measurement system for wide dynamic range optical power meter
US6977502B1 (en) * 2002-11-04 2005-12-20 Fonar Corporation Configurable matrix receiver for MRI
US7123894B2 (en) 2002-12-16 2006-10-17 Harris Corporation Dynamic range extension system and method
US20040162694A1 (en) 2003-02-13 2004-08-19 Ricca Paolo Dalla Programmable digital interface for analog test equipment systems
US6949734B2 (en) 2003-04-22 2005-09-27 Itt Manufacturing Enterprises, Inc. Active remote sensing using a spectral lock-in technique
US7253680B2 (en) 2003-05-21 2007-08-07 World Energy Labs (2), Inc. Amplifier system with current-mode servo feedback
US20050060109A1 (en) * 2003-09-17 2005-03-17 Analog Devices, Inc. Measuring circuit and a method for determining a characteristic of the impedance of a complex impedance element for facilitating characterization of the impedance thereof
US7257383B2 (en) * 2004-03-08 2007-08-14 Broadcom Corporation Method and system for improving dynamic range for communication systems using upstream analog information
US20050218971A1 (en) 2004-03-30 2005-10-06 B.P. Elfman & A.B. Pollard Properties Llc System and method for an auto-tracking, self-calibrating voltage generator
US7590196B2 (en) 2004-05-04 2009-09-15 Spectra Analysis, Inc. Chiral mixture detection system using double reference lock-in detector
US8160824B2 (en) * 2005-01-27 2012-04-17 Electro Industries/Gauge Tech Intelligent electronic device with enhanced power quality monitoring and communication capabilities
JP4372111B2 (ja) 2005-03-04 2009-11-25 三洋電機株式会社 アナログデジタル変換器
DE102005015942A1 (de) * 2005-04-07 2006-10-12 Abb Patent Gmbh Einrichtung zur Energieversorgung von Messsensoren und Übertragung eins synchronen Taktsignals an diese
DE602005014863D1 (de) 2005-08-10 2009-07-23 Emma Mixed Signal Cv Analog/Digital - Wandler mit dynamischer Bereichserweiterung
US7636386B2 (en) * 2005-11-15 2009-12-22 Panasonic Corporation Method of continuously calibrating the gain for a multi-path angle modulator
US7676208B2 (en) 2005-12-09 2010-03-09 Electronics And Telecommunications Research Institute Automatic gain control device having variable gain control interval and method thereof
US7388366B2 (en) 2006-02-03 2008-06-17 Keithley Instruments, Inc. Test system connection system with triaxial cables
WO2008112635A1 (en) 2007-03-09 2008-09-18 Dxtech, Llc Multi-channel lock-in amplifier system and method
US7796971B2 (en) * 2007-03-15 2010-09-14 Analog Devices, Inc. Mixer/DAC chip and method
DE102007015913A1 (de) 2007-04-02 2008-11-13 Siemens Ag Lock-In-Verstärker und Verfahren zum Filtern eines Messsignals mittels eines solchen Verstärkers
US7903008B2 (en) 2007-11-08 2011-03-08 National Instruments Corporation Source-measure unit based on digital control loop
JP4470995B2 (ja) 2007-12-19 2010-06-02 セイコーエプソン株式会社 Ａ／ｄ変換回路及び電子機器
US7923985B2 (en) 2008-05-01 2011-04-12 Keithley Instruments, Inc. Active autoranging current sensing circuit
US8507802B1 (en) 2008-05-01 2013-08-13 Keithley Instruments, Inc. Ultra-low current printed circuit board
WO2009143635A1 (en) 2008-05-27 2009-12-03 Flavio Heer Apparatus for lock-in amplifying an input signal and method for generating a reference signal for a lock-in amplifier
US8194250B2 (en) 2008-05-30 2012-06-05 Alcatel Lucent Wideband RF detection
US8009075B2 (en) 2008-08-29 2011-08-30 Broadcom Corporation Analog to digital converter (ADC) with extended dynamic input range
US7911368B2 (en) * 2008-10-24 2011-03-22 Olympus Ndt Sample error minimization for high dynamic range digitization systems
US9423440B2 (en) * 2009-10-21 2016-08-23 Advantest Corporation Test device and test method for measuring a phase noise of a test signal
US8027112B2 (en) * 2009-10-30 2011-09-27 Hitachi Asia Ltd. Low frequency booster for RV/shock/friction disturbance rejection
US8841964B2 (en) 2010-03-10 2014-09-23 Zurich Instruments Ag Apparatus and method for demodulating an input signal
US9244103B1 (en) 2010-05-03 2016-01-26 Intermodulation Products Ab Intermodulation lock-in
US8212697B2 (en) 2010-06-15 2012-07-03 Csr Technology Inc. Methods of and arrangements for offset compensation of an analog-to-digital converter
US8462035B2 (en) * 2011-05-13 2013-06-11 Infineon Technologies Ag Digital-to-analog conversion arrangement with power range dependent D/A converter selection
US8797025B2 (en) 2011-06-06 2014-08-05 National Instruments Corporation Compensation methods for digital source-measure-units (SMUs)
US8884666B2 (en) * 2011-08-02 2014-11-11 Ps4 Luxco S.A.R.L. Clock generator
US9829520B2 (en) 2011-08-22 2017-11-28 Keithley Instruments, Llc Low frequency impedance measurement with source measure units
US8736479B2 (en) 2011-10-03 2014-05-27 Agilent Technologies, Inc. Reducing metastability in analog to digital conversion
US9778666B2 (en) 2012-04-27 2017-10-03 Keithley Instruments, Llc Dynamic current limit apparatus and method
GB201208841D0 (en) * 2012-05-18 2012-07-04 Micromass Ltd Calibrating dual adc acquisition system
US8571152B1 (en) * 2012-05-22 2013-10-29 Issc Technologies Corp. Power-saving apparatus used for wireless communication receiver and system, and method using the same
US9645193B2 (en) * 2012-10-23 2017-05-09 Keithley Instruments, Llc Impedance source ranging apparatus and method
US8860505B2 (en) 2013-02-04 2014-10-14 Zurich Instruments Ag Lock-in amplifier with phase-synchronous processing
US9077301B2 (en) 2013-05-30 2015-07-07 Keithley Instruments, Inc. Nanovolt amplifier design
US9007250B1 (en) 2013-10-22 2015-04-14 L-3 Communications Corp. Time-interleaved and sub-band reconstruction approaches to digital-to-analog conversion for high sample rate waveform generation
US10175334B2 (en) 2013-12-13 2019-01-08 National Instruments Corporation Self-calibration of source-measure unit via capacitor
US9294118B2 (en) * 2014-01-29 2016-03-22 Analog Devices, Inc. Multi-input analog-to-digital converter
US9323878B2 (en) 2014-02-07 2016-04-26 Freescale Semiconductor, Inc. Method of optimizing the design of an electronic device with respect to electromagnetic emissions based on frequency spreading introduced by data post-processing, computer program product for carrying out the method and associated article of manufacture
US10284217B1 (en) 2014-03-05 2019-05-07 Cirrus Logic, Inc. Multi-path analog front end and analog-to-digital converter for a signal processing system
US9628098B2 (en) 2014-03-28 2017-04-18 Stmicroelectronics S.R.L. Multichannel transducer devices and methods of operation thereof
US9575105B1 (en) 2014-06-25 2017-02-21 Maxim Integrated Products, Inc. Systems and methods for low power time-domain measurement of complex impedance
US9590648B2 (en) * 2014-11-07 2017-03-07 John Howard La Grou Multi-path digital-to-analog converter
US10338185B2 (en) 2014-12-19 2019-07-02 Keithley Instruments, Llc Method for self calibration of measurement nonlinearity
US10103050B2 (en) * 2015-02-16 2018-10-16 Infineon Technologies Ag System reference with compensation of electrical and mechanical stress and life-time drift effects
WO2016133751A1 (en) 2015-02-16 2016-08-25 Sound Devices Llc High dynamic range analog-to-digital conversion with selective regression based data repair
US9407280B1 (en) * 2015-04-27 2016-08-02 Tektronix, Inc. Harmonic time domain interleave to extend arbitrary waveform generator bandwidth and sample rate
US10135459B2 (en) * 2016-10-25 2018-11-20 Analog Devices, Inc. ADC with capacitive difference circuit and digital sigma-delta feedback
NL2018166B1 (en) * 2017-01-13 2018-07-25 Univ Delft Tech Intrinsically linear, digital power amplifier employing nonlinearly-sized rf-dac, multiphase driver, and overdrive voltage control
SE540898C2 (en) 2017-03-15 2018-12-11 Synktek Ab Multiple channel lock-in amplifier
EP3508865B1 (en) * 2018-01-08 2022-07-20 Delta Electronics (Thailand) Public Co., Ltd. Method for estimating a signal property
US11119063B2 (en) * 2018-06-19 2021-09-14 Samsung Electronics Co., Ltd. Apparatus and method measuring bioimpedance and impedance
US10305498B1 (en) * 2018-09-28 2019-05-28 Cadence Design Systems, Inc. Frequency and phase measurement circuit
US11009552B2 (en) 2018-12-19 2021-05-18 Rohde & Schwarz Gmbh & Co. Kg Oscilloscope and method for testing a device under test
US11146298B2 (en) * 2018-12-31 2021-10-12 Tektronix, Inc. Split frequency band signal paths for signal sources
KR102947763B1 (ko) 2020-04-28 2026-04-02 레이크 쇼어 크라이오트로닉스 인코포레이티드 다중-범위 재료 측정들에서 천이 효과들을 감소시키기 위한 레인징 시스템들 및 방법들

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150188556A1 (en) * 2012-08-13 2015-07-02 University Of South Australia System and Method for Analog to Digital Conversion

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