JP7403238B2 - 電子回路およびセンサシステム - Google Patents

電子回路およびセンサシステム Download PDF

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Publication number
JP7403238B2
JP7403238B2 JP2019102665A JP2019102665A JP7403238B2 JP 7403238 B2 JP7403238 B2 JP 7403238B2 JP 2019102665 A JP2019102665 A JP 2019102665A JP 2019102665 A JP2019102665 A JP 2019102665A JP 7403238 B2 JP7403238 B2 JP 7403238B2
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Japan
Prior art keywords
circuit
power supply
electronic circuit
voltage
current
Prior art date
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Application number
JP2019102665A
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English (en)
Japanese (ja)
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JP2020198499A (ja
JP2020198499A5 (cg-RX-API-DMAC7.html
Inventor
樹生 中川
尭生 佐藤
晃 小田部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Astemo Ltd
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Hitachi Astemo Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Astemo Ltd filed Critical Hitachi Astemo Ltd
Priority to JP2019102665A priority Critical patent/JP7403238B2/ja
Priority to PCT/JP2020/015264 priority patent/WO2020241046A1/ja
Priority to DE112020002140.8T priority patent/DE112020002140T5/de
Priority to US17/595,051 priority patent/US12047062B2/en
Priority to CN202080034215.9A priority patent/CN113796009B/zh
Publication of JP2020198499A publication Critical patent/JP2020198499A/ja
Publication of JP2020198499A5 publication Critical patent/JP2020198499A5/ja
Application granted granted Critical
Publication of JP7403238B2 publication Critical patent/JP7403238B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
    • H03K17/6871—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors the output circuit comprising more than one controlled field-effect transistor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/54—Testing for continuity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2829—Testing of circuits in sensor or actuator systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Logic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Electronic Switches (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP2019102665A 2019-05-31 2019-05-31 電子回路およびセンサシステム Active JP7403238B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2019102665A JP7403238B2 (ja) 2019-05-31 2019-05-31 電子回路およびセンサシステム
PCT/JP2020/015264 WO2020241046A1 (ja) 2019-05-31 2020-04-03 電子回路およびセンサシステム
DE112020002140.8T DE112020002140T5 (de) 2019-05-31 2020-04-03 Elektronische schaltung und sensorsystem
US17/595,051 US12047062B2 (en) 2019-05-31 2020-04-03 Electronic circuit and sensor system
CN202080034215.9A CN113796009B (zh) 2019-05-31 2020-04-03 电子电路和传感器系统

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019102665A JP7403238B2 (ja) 2019-05-31 2019-05-31 電子回路およびセンサシステム

Publications (3)

Publication Number Publication Date
JP2020198499A JP2020198499A (ja) 2020-12-10
JP2020198499A5 JP2020198499A5 (cg-RX-API-DMAC7.html) 2022-03-25
JP7403238B2 true JP7403238B2 (ja) 2023-12-22

Family

ID=73553393

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019102665A Active JP7403238B2 (ja) 2019-05-31 2019-05-31 電子回路およびセンサシステム

Country Status (5)

Country Link
US (1) US12047062B2 (cg-RX-API-DMAC7.html)
JP (1) JP7403238B2 (cg-RX-API-DMAC7.html)
CN (1) CN113796009B (cg-RX-API-DMAC7.html)
DE (1) DE112020002140T5 (cg-RX-API-DMAC7.html)
WO (1) WO2020241046A1 (cg-RX-API-DMAC7.html)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021095602A1 (ja) * 2019-11-14 2021-05-20 三菱電機株式会社 半導体装置
DE112021007598T5 (de) * 2021-04-26 2024-02-22 Mitsubishi Electric Corporation Halbleitergerät
CN117526231B (zh) * 2024-01-08 2024-03-26 赛卓电子科技(上海)股份有限公司 一种断线保护电路及传感器

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004294069A (ja) 2003-03-25 2004-10-21 Denso Corp 物理量センサ装置
JP2005252968A (ja) 2004-03-08 2005-09-15 Denso Corp 過電流保護回路
JP2008029067A (ja) 2006-07-19 2008-02-07 Elm Technology Corp ２次電池用保護回路を有するバッテリーパック
JP2010216996A (ja) 2009-03-17 2010-09-30 Ricoh Co Ltd 半導体装置および該半導体装置の検査方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3287624B2 (ja) * 1993-01-11 2002-06-04 三菱電機株式会社 半導体センサ
JPH08146069A (ja) * 1994-11-18 1996-06-07 Nissan Motor Co Ltd 断線自動検知装置
JP3382528B2 (ja) * 1998-01-23 2003-03-04 キヤノン株式会社 カレントミラー回路
JP4089125B2 (ja) * 2000-04-12 2008-05-28 株式会社デンソー 電気負荷駆動装置
JP4300773B2 (ja) * 2002-08-22 2009-07-22 トヨタ自動車株式会社 異常検出装置
JP4082261B2 (ja) * 2003-03-31 2008-04-30 株式会社デンソー センサ装置用断線検出回路
JP4398312B2 (ja) * 2004-07-06 2010-01-13 矢崎総業株式会社 半導体スイッチの制御装置
JP4665725B2 (ja) * 2005-11-14 2011-04-06 株式会社デンソー 物理量検出装置
JP2007295209A (ja) * 2006-04-25 2007-11-08 Renesas Technology Corp アナログスイッチ回路
JP2011089849A (ja) * 2009-10-21 2011-05-06 Asahi Kasei Electronics Co Ltd 断線検出装置
JP2013016959A (ja) * 2011-07-01 2013-01-24 Sanken Electric Co Ltd 負荷駆動回路
JP5768016B2 (ja) * 2012-07-25 2015-08-26 日立オートモティブシステムズ株式会社 センサ装置
JP2016070835A (ja) * 2014-09-30 2016-05-09 パナソニックＩｐマネジメント株式会社 検出装置及び検出システム
JP6405998B2 (ja) 2014-12-25 2018-10-17 サンケン電気株式会社 負荷駆動回路
JP6585827B2 (ja) * 2016-03-31 2019-10-02 日立オートモティブシステムズ株式会社 センサ装置
JP7035317B2 (ja) * 2016-04-06 2022-03-15 株式会社デンソー 回転検出装置、および、これを用いた電動パワーステアリング装置
CN109075580B (zh) 2016-04-13 2022-01-14 株式会社东芝 电池模块

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004294069A (ja) 2003-03-25 2004-10-21 Denso Corp 物理量センサ装置
JP2005252968A (ja) 2004-03-08 2005-09-15 Denso Corp 過電流保護回路
JP2008029067A (ja) 2006-07-19 2008-02-07 Elm Technology Corp ２次電池用保護回路を有するバッテリーパック
JP2010216996A (ja) 2009-03-17 2010-09-30 Ricoh Co Ltd 半導体装置および該半導体装置の検査方法

Also Published As

Publication number Publication date
WO2020241046A1 (ja) 2020-12-03
DE112020002140T5 (de) 2022-01-13
US20220216867A1 (en) 2022-07-07
US12047062B2 (en) 2024-07-23
JP2020198499A (ja) 2020-12-10
CN113796009A (zh) 2021-12-14
CN113796009B (zh) 2024-12-20

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