DE112020002140T5 - Elektronische schaltung und sensorsystem - Google Patents
Elektronische schaltung und sensorsystem Download PDFInfo
- Publication number
- DE112020002140T5 DE112020002140T5 DE112020002140.8T DE112020002140T DE112020002140T5 DE 112020002140 T5 DE112020002140 T5 DE 112020002140T5 DE 112020002140 T DE112020002140 T DE 112020002140T DE 112020002140 T5 DE112020002140 T5 DE 112020002140T5
- Authority
- DE
- Germany
- Prior art keywords
- circuit
- power supply
- voltage
- electronic circuit
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010248 power generation Methods 0.000 claims abstract description 5
- 230000007423 decrease Effects 0.000 claims description 12
- 238000001514 detection method Methods 0.000 claims description 6
- 238000012545 processing Methods 0.000 claims description 5
- 238000000034 method Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 18
- 238000006243 chemical reaction Methods 0.000 description 17
- 239000004065 semiconductor Substances 0.000 description 11
- 239000000758 substrate Substances 0.000 description 4
- 230000003071 parasitic effect Effects 0.000 description 3
- BUHVIAUBTBOHAG-FOYDDCNASA-N (2r,3r,4s,5r)-2-[6-[[2-(3,5-dimethoxyphenyl)-2-(2-methylphenyl)ethyl]amino]purin-9-yl]-5-(hydroxymethyl)oxolane-3,4-diol Chemical compound COC1=CC(OC)=CC(C(CNC=2C=3N=CN(C=3N=CN=2)[C@H]2[C@@H]([C@H](O)[C@@H](CO)O2)O)C=2C(=CC=CC=2)C)=C1 BUHVIAUBTBOHAG-FOYDDCNASA-N 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- ORQBXQOJMQIAOY-UHFFFAOYSA-N nobelium Chemical compound [No] ORQBXQOJMQIAOY-UHFFFAOYSA-N 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
- H03K17/6871—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors the output circuit comprising more than one controlled field-effect transistor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2829—Testing of circuits in sensor or actuator systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Logic Circuits (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Electronic Switches (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019-102665 | 2019-05-31 | ||
| JP2019102665A JP7403238B2 (ja) | 2019-05-31 | 2019-05-31 | 電子回路およびセンサシステム |
| PCT/JP2020/015264 WO2020241046A1 (ja) | 2019-05-31 | 2020-04-03 | 電子回路およびセンサシステム |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE112020002140T5 true DE112020002140T5 (de) | 2022-01-13 |
Family
ID=73553393
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE112020002140.8T Pending DE112020002140T5 (de) | 2019-05-31 | 2020-04-03 | Elektronische schaltung und sensorsystem |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US12047062B2 (cg-RX-API-DMAC7.html) |
| JP (1) | JP7403238B2 (cg-RX-API-DMAC7.html) |
| CN (1) | CN113796009B (cg-RX-API-DMAC7.html) |
| DE (1) | DE112020002140T5 (cg-RX-API-DMAC7.html) |
| WO (1) | WO2020241046A1 (cg-RX-API-DMAC7.html) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2021095602A1 (ja) * | 2019-11-14 | 2021-05-20 | 三菱電機株式会社 | 半導体装置 |
| DE112021007598T5 (de) * | 2021-04-26 | 2024-02-22 | Mitsubishi Electric Corporation | Halbleitergerät |
| CN117526231B (zh) * | 2024-01-08 | 2024-03-26 | 赛卓电子科技(上海)股份有限公司 | 一种断线保护电路及传感器 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016122965A (ja) | 2014-12-25 | 2016-07-07 | サンケン電気株式会社 | 負荷駆動回路 |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3287624B2 (ja) * | 1993-01-11 | 2002-06-04 | 三菱電機株式会社 | 半導体センサ |
| JPH08146069A (ja) * | 1994-11-18 | 1996-06-07 | Nissan Motor Co Ltd | 断線自動検知装置 |
| JP3382528B2 (ja) * | 1998-01-23 | 2003-03-04 | キヤノン株式会社 | カレントミラー回路 |
| JP4089125B2 (ja) * | 2000-04-12 | 2008-05-28 | 株式会社デンソー | 電気負荷駆動装置 |
| JP4300773B2 (ja) * | 2002-08-22 | 2009-07-22 | トヨタ自動車株式会社 | 異常検出装置 |
| JP4296811B2 (ja) | 2003-03-25 | 2009-07-15 | 株式会社デンソー | 物理量センサ装置 |
| JP4082261B2 (ja) * | 2003-03-31 | 2008-04-30 | 株式会社デンソー | センサ装置用断線検出回路 |
| JP4186846B2 (ja) | 2004-03-08 | 2008-11-26 | 株式会社デンソー | 過電流保護回路 |
| JP4398312B2 (ja) * | 2004-07-06 | 2010-01-13 | 矢崎総業株式会社 | 半導体スイッチの制御装置 |
| JP4665725B2 (ja) * | 2005-11-14 | 2011-04-06 | 株式会社デンソー | 物理量検出装置 |
| JP2007295209A (ja) * | 2006-04-25 | 2007-11-08 | Renesas Technology Corp | アナログスイッチ回路 |
| JP2008029067A (ja) | 2006-07-19 | 2008-02-07 | Elm Technology Corp | ２次電池用保護回路を有するバッテリーパック |
| JP2010216996A (ja) | 2009-03-17 | 2010-09-30 | Ricoh Co Ltd | 半導体装置および該半導体装置の検査方法 |
| JP2011089849A (ja) * | 2009-10-21 | 2011-05-06 | Asahi Kasei Electronics Co Ltd | 断線検出装置 |
| JP2013016959A (ja) * | 2011-07-01 | 2013-01-24 | Sanken Electric Co Ltd | 負荷駆動回路 |
| JP5768016B2 (ja) * | 2012-07-25 | 2015-08-26 | 日立オートモティブシステムズ株式会社 | センサ装置 |
| JP2016070835A (ja) * | 2014-09-30 | 2016-05-09 | パナソニックＩｐマネジメント株式会社 | 検出装置及び検出システム |
| JP6585827B2 (ja) * | 2016-03-31 | 2019-10-02 | 日立オートモティブシステムズ株式会社 | センサ装置 |
| JP7035317B2 (ja) * | 2016-04-06 | 2022-03-15 | 株式会社デンソー | 回転検出装置、および、これを用いた電動パワーステアリング装置 |
| CN109075580B (zh) | 2016-04-13 | 2022-01-14 | 株式会社东芝 | 电池模块 |
-
2019
- 2019-05-31 JP JP2019102665A patent/JP7403238B2/ja active Active
-
2020
- 2020-04-03 WO PCT/JP2020/015264 patent/WO2020241046A1/ja not_active Ceased
- 2020-04-03 US US17/595,051 patent/US12047062B2/en active Active
- 2020-04-03 DE DE112020002140.8T patent/DE112020002140T5/de active Pending
- 2020-04-03 CN CN202080034215.9A patent/CN113796009B/zh active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016122965A (ja) | 2014-12-25 | 2016-07-07 | サンケン電気株式会社 | 負荷駆動回路 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2020241046A1 (ja) | 2020-12-03 |
| US20220216867A1 (en) | 2022-07-07 |
| US12047062B2 (en) | 2024-07-23 |
| JP2020198499A (ja) | 2020-12-10 |
| CN113796009A (zh) | 2021-12-14 |
| CN113796009B (zh) | 2024-12-20 |
| JP7403238B2 (ja) | 2023-12-22 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R012 | Request for examination validly filed |