JP7334791B2 - 検査用コネクタ及び検査用ユニット - Google Patents

検査用コネクタ及び検査用ユニット Download PDF

Info

Publication number
JP7334791B2
JP7334791B2 JP2021552408A JP2021552408A JP7334791B2 JP 7334791 B2 JP7334791 B2 JP 7334791B2 JP 2021552408 A JP2021552408 A JP 2021552408A JP 2021552408 A JP2021552408 A JP 2021552408A JP 7334791 B2 JP7334791 B2 JP 7334791B2
Authority
JP
Japan
Prior art keywords
outer conductor
conductor
plunger
inspection
barrel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2021552408A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2021075455A1 (enrdf_load_stackoverflow
JPWO2021075455A5 (enrdf_load_stackoverflow
Inventor
真一 剱崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Publication of JPWO2021075455A1 publication Critical patent/JPWO2021075455A1/ja
Publication of JPWO2021075455A5 publication Critical patent/JPWO2021075455A5/ja
Application granted granted Critical
Publication of JP7334791B2 publication Critical patent/JP7334791B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
    • H01R24/66—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure with pins, blades or analogous contacts and secured to apparatus or structure, e.g. to a wall

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
JP2021552408A 2019-10-18 2020-10-14 検査用コネクタ及び検査用ユニット Active JP7334791B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019191499 2019-10-18
JP2019191499 2019-10-18
PCT/JP2020/038752 WO2021075455A1 (ja) 2019-10-18 2020-10-14 検査用コネクタ及び検査用ユニット

Publications (3)

Publication Number Publication Date
JPWO2021075455A1 JPWO2021075455A1 (enrdf_load_stackoverflow) 2021-04-22
JPWO2021075455A5 JPWO2021075455A5 (enrdf_load_stackoverflow) 2022-05-27
JP7334791B2 true JP7334791B2 (ja) 2023-08-29

Family

ID=75537488

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021552408A Active JP7334791B2 (ja) 2019-10-18 2020-10-14 検査用コネクタ及び検査用ユニット

Country Status (3)

Country Link
JP (1) JP7334791B2 (enrdf_load_stackoverflow)
CN (1) CN217507692U (enrdf_load_stackoverflow)
WO (1) WO2021075455A1 (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7563627B2 (ja) * 2021-11-12 2024-10-08 株式会社村田製作所 測定用プローブ
CN118501512A (zh) * 2024-05-17 2024-08-16 昆山雷匠通信科技有限公司 测试连接器

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002501289A (ja) 1998-01-05 2002-01-15 ライカ エレクトロニクス インターナショナル、 インコーポレイテッド 同軸接点組立体装置
JP2008166121A (ja) 2006-12-28 2008-07-17 Toyo Denshi Giken Kk 同軸プローブと、プローブ収納ボードと、ケーブル保持ボードと、コンタクト機と、ケーブル保持ボードの製造方法
JP2012038499A (ja) 2010-08-05 2012-02-23 Jsr Corp 電線被覆層形成用放射線硬化性樹脂組成物

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6082271U (ja) * 1983-11-09 1985-06-07 株式会社アドバンテスト 同軸プロ−ブコンタクト
JPS60207343A (ja) * 1984-03-31 1985-10-18 Yokowo Mfg Co Ltd 回路基板等の検査装置
JP2002228682A (ja) * 2001-02-02 2002-08-14 Tokyo Electron Ltd プローブ
JP2012099246A (ja) * 2010-10-29 2012-05-24 Murata Mfg Co Ltd 検査用同軸コネクタ及びプローブ
JP2012181119A (ja) * 2011-03-02 2012-09-20 Ibiden Co Ltd 基板の検査装置及びその検査装置の製造方法
JP2015102435A (ja) * 2013-11-26 2015-06-04 株式会社村田製作所 検査装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002501289A (ja) 1998-01-05 2002-01-15 ライカ エレクトロニクス インターナショナル、 インコーポレイテッド 同軸接点組立体装置
JP2008166121A (ja) 2006-12-28 2008-07-17 Toyo Denshi Giken Kk 同軸プローブと、プローブ収納ボードと、ケーブル保持ボードと、コンタクト機と、ケーブル保持ボードの製造方法
JP2012038499A (ja) 2010-08-05 2012-02-23 Jsr Corp 電線被覆層形成用放射線硬化性樹脂組成物

Also Published As

Publication number Publication date
JPWO2021075455A1 (enrdf_load_stackoverflow) 2021-04-22
CN217507692U (zh) 2022-09-27
WO2021075455A1 (ja) 2021-04-22

Similar Documents

Publication Publication Date Title
US7332923B2 (en) Test probe for high-frequency measurement
KR100855208B1 (ko) 고성능 테스터 인터페이스 모듈
JP4921344B2 (ja) 検査ソケット
JP7327659B2 (ja) 検査用コネクタ及び検査用ユニット
TWM521829U (zh) 纜線總成
JP7334791B2 (ja) 検査用コネクタ及び検査用ユニット
JP2019138768A (ja) プローブ
US11719762B2 (en) Probe fitting structure and probe
JP3226821U (ja) 多極コネクタを測定するためのプローブ
TW201112534A (en) Connector, cable assembly, and semiconductor testing device
JP7243860B2 (ja) 検査用プローブ装置及びコネクタ検査方法
JP7298770B2 (ja) 検査用コネクタ
CN215340281U (zh) 用于校准探测器的校准适配器、探测器组件以及适配器
KR102777517B1 (ko) 측정 유닛
JP7509159B2 (ja) 検査用コネクタ
JP2012052992A (ja) ケーブル検査用アダプタ
JP2023084007A (ja) 検査用コネクタ
JP2006032208A (ja) 電気コネクタ
US20240347943A1 (en) Electrical connector, connection structure, and method for manufacturing electrical connector
WO2023047618A1 (ja) 検査用コネクタ
JP2025011485A (ja) 検査用プローブ
JP2022116470A (ja) プローブ装置
JP2023133153A (ja) 検査用コネクタ
JP2023157109A (ja) 同軸コネクタ
CN119447754A (zh) 同轴衰减组件及其制造方法

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20220314

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20220314

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20230425

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20230621

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20230718

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20230731

R150 Certificate of patent or registration of utility model

Ref document number: 7334791

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150