JPWO2021075455A1 - - Google Patents

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Publication number
JPWO2021075455A1
JPWO2021075455A1 JP2021552408A JP2021552408A JPWO2021075455A1 JP WO2021075455 A1 JPWO2021075455 A1 JP WO2021075455A1 JP 2021552408 A JP2021552408 A JP 2021552408A JP 2021552408 A JP2021552408 A JP 2021552408A JP WO2021075455 A1 JPWO2021075455 A1 JP WO2021075455A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021552408A
Other languages
Japanese (ja)
Other versions
JP7334791B2 (ja
JPWO2021075455A5 (enrdf_load_stackoverflow
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Publication date
Application filed filed Critical
Publication of JPWO2021075455A1 publication Critical patent/JPWO2021075455A1/ja
Publication of JPWO2021075455A5 publication Critical patent/JPWO2021075455A5/ja
Application granted granted Critical
Publication of JP7334791B2 publication Critical patent/JP7334791B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
    • H01R24/66—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure with pins, blades or analogous contacts and secured to apparatus or structure, e.g. to a wall

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
JP2021552408A 2019-10-18 2020-10-14 検査用コネクタ及び検査用ユニット Active JP7334791B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019191499 2019-10-18
JP2019191499 2019-10-18
PCT/JP2020/038752 WO2021075455A1 (ja) 2019-10-18 2020-10-14 検査用コネクタ及び検査用ユニット

Publications (3)

Publication Number Publication Date
JPWO2021075455A1 true JPWO2021075455A1 (enrdf_load_stackoverflow) 2021-04-22
JPWO2021075455A5 JPWO2021075455A5 (enrdf_load_stackoverflow) 2022-05-27
JP7334791B2 JP7334791B2 (ja) 2023-08-29

Family

ID=75537488

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021552408A Active JP7334791B2 (ja) 2019-10-18 2020-10-14 検査用コネクタ及び検査用ユニット

Country Status (3)

Country Link
JP (1) JP7334791B2 (enrdf_load_stackoverflow)
CN (1) CN217507692U (enrdf_load_stackoverflow)
WO (1) WO2021075455A1 (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7563627B2 (ja) * 2021-11-12 2024-10-08 株式会社村田製作所 測定用プローブ
CN118501512A (zh) * 2024-05-17 2024-08-16 昆山雷匠通信科技有限公司 测试连接器

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6082271U (ja) * 1983-11-09 1985-06-07 株式会社アドバンテスト 同軸プロ−ブコンタクト
JPS60207343A (ja) * 1984-03-31 1985-10-18 Yokowo Mfg Co Ltd 回路基板等の検査装置
JP2002501289A (ja) * 1998-01-05 2002-01-15 ライカ エレクトロニクス インターナショナル、 インコーポレイテッド 同軸接点組立体装置
JP2008166121A (ja) * 2006-12-28 2008-07-17 Toyo Denshi Giken Kk 同軸プローブと、プローブ収納ボードと、ケーブル保持ボードと、コンタクト機と、ケーブル保持ボードの製造方法
JP2012038499A (ja) * 2010-08-05 2012-02-23 Jsr Corp 電線被覆層形成用放射線硬化性樹脂組成物

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002228682A (ja) * 2001-02-02 2002-08-14 Tokyo Electron Ltd プローブ
JP2012099246A (ja) * 2010-10-29 2012-05-24 Murata Mfg Co Ltd 検査用同軸コネクタ及びプローブ
JP2012181119A (ja) * 2011-03-02 2012-09-20 Ibiden Co Ltd 基板の検査装置及びその検査装置の製造方法
JP2015102435A (ja) * 2013-11-26 2015-06-04 株式会社村田製作所 検査装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6082271U (ja) * 1983-11-09 1985-06-07 株式会社アドバンテスト 同軸プロ−ブコンタクト
JPS60207343A (ja) * 1984-03-31 1985-10-18 Yokowo Mfg Co Ltd 回路基板等の検査装置
JP2002501289A (ja) * 1998-01-05 2002-01-15 ライカ エレクトロニクス インターナショナル、 インコーポレイテッド 同軸接点組立体装置
JP2008166121A (ja) * 2006-12-28 2008-07-17 Toyo Denshi Giken Kk 同軸プローブと、プローブ収納ボードと、ケーブル保持ボードと、コンタクト機と、ケーブル保持ボードの製造方法
JP2012038499A (ja) * 2010-08-05 2012-02-23 Jsr Corp 電線被覆層形成用放射線硬化性樹脂組成物

Also Published As

Publication number Publication date
JP7334791B2 (ja) 2023-08-29
CN217507692U (zh) 2022-09-27
WO2021075455A1 (ja) 2021-04-22

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