JP7236444B2 - 電力インタフェース - Google Patents
電力インタフェース Download PDFInfo
- Publication number
- JP7236444B2 JP7236444B2 JP2020541510A JP2020541510A JP7236444B2 JP 7236444 B2 JP7236444 B2 JP 7236444B2 JP 2020541510 A JP2020541510 A JP 2020541510A JP 2020541510 A JP2020541510 A JP 2020541510A JP 7236444 B2 JP7236444 B2 JP 7236444B2
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- JP
- Japan
- Prior art keywords
- elastic member
- support member
- flexible sheet
- fixed
- power interface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06727—Cantilever beams
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
- G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Geometry (AREA)
- Optics & Photonics (AREA)
- Measuring Leads Or Probes (AREA)
- Insulated Conductors (AREA)
- Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
- Control Of Eletrric Generators (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Description
Claims (10)
- 支持部材と、
前記支持部材に固定されて、上下方向に弾性力を与えるための弾性部材と、
前記弾性部材の上に配置される第1の接続端子と、
前記第1の接続端子と電気的に接続される第2の接続端子と、
前記弾性部材の歪み範囲を制限するように、前記弾性部材に固定される第1の領域と前記支持部材に固定される第2の領域を持つ可撓性シートと、
を備え、
前記可撓性シートは、可撓性シート全領域のうち前記弾性部材に固定される前記第1の領域と前記支持部材に固定される前記第2の領域を除く残りの領域において前記弾性部材及び支持部材と接触されないように配置され、
前記弾性部材は、前記支持部材上において直立するように長さ及び幅が決定される、
電力インタフェース。 - 前記第1の接続端子は、前記弾性部材の歪みにつれて移動自在となるように前記弾性部材の上に配置される請求項1に記載の電力インタフェース。
- 前記可撓性シートは、前記第1の接続端子の移動につれて歪まれる請求項1に記載の電力インタフェース。
- 前記第1の接続端子及び第2の接続端子は、前記可撓性シートの上に所定の接触面積を有するパッド状に形成される請求項1に記載の電力インタフェース。
- 前記支持部材は、
前記可撓性シートの固定される位置が、前記弾性部材の固定される位置よりも上部となるように形成される段付き部を備える請求項1に記載の電力インタフェース。 - 前記可撓性シートは、
前記弾性部材の上端の外側において下向きに折り曲げられて形成される請求項1に記載の電力インタフェース。 - 支持部材と、
前記支持部材に固定されて、上下方向に弾性力を与えるための複数の弾性部材と、
前記複数の弾性部材の上にそれぞれ配置される複数の第1の接続端子と、
前記複数の第1の接続端子とそれぞれ電気的に接続される複数の第2の接続端子と、
前記複数の弾性部材の歪み範囲を制限するように、前記複数の弾性部材に固定される第1の領域と前記支持部材に固定される第2の領域を持つ可撓性シートと、
を備え、
前記可撓性シートは、
可撓性シート全領域のうち前記複数の弾性部材に固定される前記第1の領域と前記支持部材に固定される前記第2の領域を除く残りの領域において前記複数の弾性部材及び支持部材と接触されないように配置され、
前記可撓性シートは、
前記複数の第1の接続端子の間においてそれぞれ少なくとも一部の領域が切り欠かれて形成される切欠部を備える、
電力インタフェース。 - 前記複数の第1の接続端子の移動範囲を制限するように前記複数の第1の接続端子同士をそれぞれ連結する可撓性連結シートをさらに備える請求項7に記載の電力インタフェース。
- 前記可撓性連結シートは、
前記複数の第1の接続端子同士間の長さよりも長く形成される請求項8に記載の電力インタフェース。 - 前記支持部材に固定されて、前記複数の第2の接続端子にそれぞれ試験電流を印加するためのプリント回路基板をさらに備える請求項7に記載の電力インタフェース。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020180016201A KR102447833B1 (ko) | 2018-02-09 | 2018-02-09 | 전력 인터페이스 |
KR10-2018-0016201 | 2018-02-09 | ||
PCT/KR2019/001548 WO2019156490A1 (ko) | 2018-02-09 | 2019-02-07 | 전력 인터페이스 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2021513644A JP2021513644A (ja) | 2021-05-27 |
JPWO2019156490A5 JPWO2019156490A5 (ja) | 2022-01-17 |
JP7236444B2 true JP7236444B2 (ja) | 2023-03-09 |
Family
ID=67549506
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2020541510A Active JP7236444B2 (ja) | 2018-02-09 | 2019-02-07 | 電力インタフェース |
Country Status (6)
Country | Link |
---|---|
US (1) | US11293943B2 (ja) |
JP (1) | JP7236444B2 (ja) |
KR (1) | KR102447833B1 (ja) |
CN (1) | CN111684289B (ja) |
TW (1) | TWI825070B (ja) |
WO (1) | WO2019156490A1 (ja) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011106980A (ja) | 2009-11-18 | 2011-06-02 | Advantest Corp | プローブカード |
JP2011133330A (ja) | 2009-12-24 | 2011-07-07 | Ngk Insulators Ltd | 接続装置 |
Family Cites Families (28)
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TWI288958B (en) * | 2002-03-18 | 2007-10-21 | Nanonexus Inc | A miniaturized contact spring |
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TWI252925B (en) * | 2004-07-05 | 2006-04-11 | Yulim Hitech Inc | Probe card for testing a semiconductor device |
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-
2018
- 2018-02-09 KR KR1020180016201A patent/KR102447833B1/ko active IP Right Grant
-
2019
- 2019-02-01 TW TW108104313A patent/TWI825070B/zh active
- 2019-02-07 CN CN201980012021.6A patent/CN111684289B/zh active Active
- 2019-02-07 WO PCT/KR2019/001548 patent/WO2019156490A1/ko active Application Filing
- 2019-02-07 JP JP2020541510A patent/JP7236444B2/ja active Active
- 2019-02-07 US US16/964,196 patent/US11293943B2/en active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011106980A (ja) | 2009-11-18 | 2011-06-02 | Advantest Corp | プローブカード |
JP2011133330A (ja) | 2009-12-24 | 2011-07-07 | Ngk Insulators Ltd | 接続装置 |
Also Published As
Publication number | Publication date |
---|---|
CN111684289A (zh) | 2020-09-18 |
TWI825070B (zh) | 2023-12-11 |
TW201935779A (zh) | 2019-09-01 |
JP2021513644A (ja) | 2021-05-27 |
US20210033641A1 (en) | 2021-02-04 |
US11293943B2 (en) | 2022-04-05 |
KR20190096582A (ko) | 2019-08-20 |
KR102447833B1 (ko) | 2022-09-27 |
WO2019156490A1 (ko) | 2019-08-15 |
CN111684289B (zh) | 2023-03-31 |
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