JP7226852B2 - 基板上の流動的対象を自動的にマッピングするための方法およびシステム - Google Patents

基板上の流動的対象を自動的にマッピングするための方法およびシステム Download PDF

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JP7226852B2
JP7226852B2 JP2021521121A JP2021521121A JP7226852B2 JP 7226852 B2 JP7226852 B2 JP 7226852B2 JP 2021521121 A JP2021521121 A JP 2021521121A JP 2021521121 A JP2021521121 A JP 2021521121A JP 7226852 B2 JP7226852 B2 JP 7226852B2
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substrate
objects
identification module
stage
mapping information
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JP2022502796A (ja
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シー プットマン，マシュー
ビー プットマン，ジョン
クルックシャンク，ジョン
オーランド，ジュリー
フランクル，アデル
スコット，ブランドン
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Nanotronics Imaging Inc
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/20—Analysis of motion
    • G06T7/246—Analysis of motion using feature-based methods, e.g. the tracking of corners or segments
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/20—Image preprocessing
    • G06V10/255—Detecting or recognising potential candidate objects based on visual cues, e.g. shapes
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V20/00—Scenes; Scene-specific elements
    • G06V20/60—Type of objects
    • G06V20/69—Microscopic objects, e.g. biological cells or cellular parts
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10056—Microscopic image
    • G06T2207/10061—Microscopic image from scanning electron microscope
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20084—Artificial neural networks [ANN]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30004—Biomedical image processing
    • G06T2207/30024—Cell structures in vitro; Tissue sections in vitro
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30141—Printed circuit board [PCB]

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biomedical Technology (AREA)
  • General Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • Quality & Reliability (AREA)
  • Image Processing (AREA)
  • Microscoopes, Condenser (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2021521121A 2018-10-19 2019-09-26 基板上の流動的対象を自動的にマッピングするための方法およびシステム Active JP7226852B2 (ja)

Priority Applications (1)

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JP2023014817A JP7553978B2 (ja) 2018-10-19 2023-02-02 基板上の流動的対象を自動的にマッピングするための方法およびシステム

Applications Claiming Priority (3)

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US16/164,990 US10481379B1 (en) 2018-10-19 2018-10-19 Method and system for automatically mapping fluid objects on a substrate
US16/164,990 2018-10-19
PCT/US2019/053187 WO2020081211A1 (en) 2018-10-19 2019-09-26 Method and system for automatically mapping fluid objects on a substrate

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JP7226852B2 true JP7226852B2 (ja) 2023-02-21

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US (5) US10481379B1 (https=)
EP (1) EP3867686B1 (https=)
JP (2) JP7226852B2 (https=)
KR (1) KR102706113B1 (https=)
CN (2) CN117784387A (https=)
TW (2) TWI833822B (https=)
WO (1) WO2020081211A1 (https=)

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US10481379B1 (en) 2018-10-19 2019-11-19 Nanotronics Imaging, Inc. Method and system for automatically mapping fluid objects on a substrate
JP7506523B2 (ja) * 2020-05-20 2024-06-26 株式会社エビデント 顕微鏡システム、制御方法、プログラム
CN111766694A (zh) * 2020-07-20 2020-10-13 深圳市创能亿科科技开发有限公司 显微镜切片位置的采集方法和系统
US11556223B2 (en) 2020-08-27 2023-01-17 Ebay Inc. Automatic feedback system using visual interactions
US12266143B2 (en) 2021-04-12 2025-04-01 Kla Corporation Salient feature point based image alignment
CN114047129B (zh) * 2021-11-24 2025-02-07 东莞市东宇阳电子科技发展有限公司 自动拍摄mlcc产品切面图像的装置及方法
EP4197485B1 (en) * 2021-12-20 2024-08-21 3Shape A/S System for scanning multiple dental objects
KR102805720B1 (ko) * 2022-03-15 2025-05-13 중앙대학교 산학협력단 기계학습을 이용한 led칩 유체 자가 배열 장치, 시스템 및 방법

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JP2023052869A (ja) 2023-04-12
US20220276481A1 (en) 2022-09-01
JP7553978B2 (ja) 2024-09-19
JP2022502796A (ja) 2022-01-11
US20200124837A1 (en) 2020-04-23
EP3867686B1 (en) 2025-03-19
US11333876B2 (en) 2022-05-17
WO2020081211A1 (en) 2020-04-23
US10809516B2 (en) 2020-10-20
US11815673B2 (en) 2023-11-14
KR102706113B1 (ko) 2024-09-12
US12174361B2 (en) 2024-12-24
KR20210077735A (ko) 2021-06-25
CN117784387A (zh) 2024-03-29
US20210026125A1 (en) 2021-01-28
TW202028802A (zh) 2020-08-01
US10481379B1 (en) 2019-11-19
TWI833822B (zh) 2024-03-01
TW202422151A (zh) 2024-06-01
CN112912783B (zh) 2023-05-30
EP3867686A1 (en) 2021-08-25
CN112912783A (zh) 2021-06-04
EP3867686A4 (en) 2022-08-17
US20240160002A1 (en) 2024-05-16

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