CN117784387A - 用于自动映射基板上的流动对象的方法和系统 - Google Patents

用于自动映射基板上的流动对象的方法和系统 Download PDF

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Publication number
CN117784387A
CN117784387A CN202310507825.1A CN202310507825A CN117784387A CN 117784387 A CN117784387 A CN 117784387A CN 202310507825 A CN202310507825 A CN 202310507825A CN 117784387 A CN117784387 A CN 117784387A
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China
Prior art keywords
objects
substrate
computing system
coordinates
deformation
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CN202310507825.1A
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English (en)
Chinese (zh)
Inventor
马修·C·普特曼
约翰·B·普特曼
约翰·克鲁克尚克
朱莉·奥兰多
阿黛尔·弗兰克尔
布兰登·斯科特
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Nano Electronic Imaging Co ltd
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Nano Electronic Imaging Co ltd
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Application filed by Nano Electronic Imaging Co ltd filed Critical Nano Electronic Imaging Co ltd
Publication of CN117784387A publication Critical patent/CN117784387A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/20—Analysis of motion
    • G06T7/246—Analysis of motion using feature-based methods, e.g. the tracking of corners or segments
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/20—Image preprocessing
    • G06V10/255—Detecting or recognising potential candidate objects based on visual cues, e.g. shapes
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V20/00—Scenes; Scene-specific elements
    • G06V20/60—Type of objects
    • G06V20/69—Microscopic objects, e.g. biological cells or cellular parts
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10056—Microscopic image
    • G06T2207/10061—Microscopic image from scanning electron microscope
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20084—Artificial neural networks [ANN]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30004—Biomedical image processing
    • G06T2207/30024—Cell structures in vitro; Tissue sections in vitro
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30141—Printed circuit board [PCB]

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biomedical Technology (AREA)
  • General Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • Quality & Reliability (AREA)
  • Image Processing (AREA)
  • Microscoopes, Condenser (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN202310507825.1A 2018-10-19 2019-09-26 用于自动映射基板上的流动对象的方法和系统 Pending CN117784387A (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US16/164,990 US10481379B1 (en) 2018-10-19 2018-10-19 Method and system for automatically mapping fluid objects on a substrate
US16/164,990 2018-10-19
PCT/US2019/053187 WO2020081211A1 (en) 2018-10-19 2019-09-26 Method and system for automatically mapping fluid objects on a substrate
CN201980068775.3A CN112912783B (zh) 2018-10-19 2019-09-26 用于自动映射基板上的流动对象的方法和系统

Related Parent Applications (1)

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CN201980068775.3A Division CN112912783B (zh) 2018-10-19 2019-09-26 用于自动映射基板上的流动对象的方法和系统

Publications (1)

Publication Number Publication Date
CN117784387A true CN117784387A (zh) 2024-03-29

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CN201980068775.3A Active CN112912783B (zh) 2018-10-19 2019-09-26 用于自动映射基板上的流动对象的方法和系统

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US (5) US10481379B1 (https=)
EP (1) EP3867686B1 (https=)
JP (2) JP7226852B2 (https=)
KR (1) KR102706113B1 (https=)
CN (2) CN117784387A (https=)
TW (2) TWI833822B (https=)
WO (1) WO2020081211A1 (https=)

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Also Published As

Publication number Publication date
JP2023052869A (ja) 2023-04-12
US20220276481A1 (en) 2022-09-01
JP7553978B2 (ja) 2024-09-19
JP2022502796A (ja) 2022-01-11
US20200124837A1 (en) 2020-04-23
EP3867686B1 (en) 2025-03-19
US11333876B2 (en) 2022-05-17
WO2020081211A1 (en) 2020-04-23
US10809516B2 (en) 2020-10-20
US11815673B2 (en) 2023-11-14
KR102706113B1 (ko) 2024-09-12
US12174361B2 (en) 2024-12-24
KR20210077735A (ko) 2021-06-25
US20210026125A1 (en) 2021-01-28
TW202028802A (zh) 2020-08-01
US10481379B1 (en) 2019-11-19
TWI833822B (zh) 2024-03-01
TW202422151A (zh) 2024-06-01
CN112912783B (zh) 2023-05-30
EP3867686A1 (en) 2021-08-25
CN112912783A (zh) 2021-06-04
EP3867686A4 (en) 2022-08-17
US20240160002A1 (en) 2024-05-16
JP7226852B2 (ja) 2023-02-21

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