JP7153791B2 - 電圧検出システム - Google Patents
電圧検出システム Download PDFInfo
- Publication number
- JP7153791B2 JP7153791B2 JP2021514522A JP2021514522A JP7153791B2 JP 7153791 B2 JP7153791 B2 JP 7153791B2 JP 2021514522 A JP2021514522 A JP 2021514522A JP 2021514522 A JP2021514522 A JP 2021514522A JP 7153791 B2 JP7153791 B2 JP 7153791B2
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- voltage
- detector
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- voltage detector
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/26—Power supply means, e.g. regulation thereof
- G06F1/32—Means for saving power
- G06F1/3203—Power management, i.e. event-based initiation of a power-saving mode
- G06F1/3234—Power saving characterised by the action undertaken
- G06F1/325—Power saving in peripheral device
- G06F1/3275—Power saving in memory, e.g. RAM, cache
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0038—Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing pulses or pulse trains according to amplitude)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16528—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values using digital techniques or performing arithmetic operations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
- G01R19/16552—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies in I.C. power supplies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/2513—Arrangements for monitoring electric power systems, e.g. power lines or loads; Logging
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/26—Power supply means, e.g. regulation thereof
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/26—Power supply means, e.g. regulation thereof
- G06F1/32—Means for saving power
- G06F1/3203—Power management, i.e. event-based initiation of a power-saving mode
- G06F1/3234—Power saving characterised by the action undertaken
- G06F1/3296—Power saving characterised by the action undertaken by lowering the supply or operating voltage
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/30—Power supply circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/143—Detection of memory cassette insertion or removal; Continuity checks of supply or ground lines; Detection of supply variations, interruptions or levels ; Switching between alternative supplies
- G11C5/144—Detection of predetermined disconnection or reduction of power supply, e.g. power down or power standby
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/023—Generators characterised by the type of circuit or by the means used for producing pulses by the use of differential amplifiers or comparators, with internal or external positive feedback
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
Description
Claims (7)
- 外部の電子システムが動作するために受け取る電源電圧を入力電圧として、前記入力電圧が第1の電圧レベルに到達したかどうかを、前記第1の電圧レベルに対応する基準電圧と比較することで検出する第1の電圧検出器と、
前記入力電圧が第2の電圧レベルに到達したかどうかを、前記第2の電圧レベルに対応する基準電圧と比較することで検出する第2の電圧検出器と、
前記入力電圧が第3の電圧レベルに到達したかどうかを、前記第3の電圧レベルに対応する基準電圧と比較することで検出する第3の電圧検出器と、を備える電圧検出システムであって、
前記第1の電圧検出器は、前記第1の電圧検出器の検出結果に応じて、前記第2の電圧検出器の状態及び前記第3の電圧検出器の状態を制御する制御信号であって、前記検出結果が、前記入力電圧が第1の電圧レベルに到達したことを示す場合、前記第2の電圧検出器及び前記第3の電圧検出器をオフ状態にする、制御信号を前記第2の電圧検出器及び前記第3の電圧検出器に出力する、
電圧検出システム。 - 前記第2の電圧レベルは前記第1の電圧レベルよりも低い、
請求項1に記載の電圧検出システム。 - 前記第3の電圧レベルは前記第1の電圧レベルよりも低い、
請求項1に記載の電圧検出システム。 - 前記第1の電圧検出器は、前記入力電圧が前記第1の電圧レベル未満である場合に、前記第2の電圧検出器をオン状態にする前記制御信号を出力する、
請求項1に記載の電圧検出システム。 - 前記第2の電圧検出器がオン状態のときに出力した出力信号であって、前記入力電圧が第2の電圧レベルに到達したかどうかに基づく出力信号を外部に出力するためのラッチ回路を備え、
前記第1の電圧検出器は、前記入力電圧が前記第1の電圧レベルを超えている場合に、前記出力信号をそのまま維持して出力させるラッチ信号を前記ラッチ回路に出力する、
請求項1に記載の電圧検出システム。 - 前記ラッチ回路は、前記第1の電圧検出器から前記ラッチ信号を受信し、かつ、前記第2の電圧検出器がオン状態のときに出力した、前記入力電圧が第2の電圧レベルに到達したかどうかを示すフラグ信号を前記第2の電圧検出器から受信することにより、前記第2の電圧検出器の前記出力信号を生成する、
請求項5に記載の電圧検出システム。 - 前記入力電圧は、ある電源からの電源電圧である、
請求項1に記載の電圧検出システム。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/CN2018/106957 WO2020056725A1 (en) | 2018-09-21 | 2018-09-21 | Voltage detection system |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2021536017A JP2021536017A (ja) | 2021-12-23 |
JP7153791B2 true JP7153791B2 (ja) | 2022-10-14 |
Family
ID=65221744
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2021514522A Active JP7153791B2 (ja) | 2018-09-21 | 2018-09-21 | 電圧検出システム |
Country Status (7)
Country | Link |
---|---|
US (1) | US10594302B1 (ja) |
EP (1) | EP3811088B1 (ja) |
JP (1) | JP7153791B2 (ja) |
KR (1) | KR102548611B1 (ja) |
CN (1) | CN109313225B (ja) |
TW (1) | TWI671530B (ja) |
WO (1) | WO2020056725A1 (ja) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000155140A (ja) | 1998-11-20 | 2000-06-06 | Nec Corp | 電圧検出回路 |
US20120092046A1 (en) | 2010-10-14 | 2012-04-19 | Dong Li | Low power power-on-reset (por) circuit |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3359613B2 (ja) | 1999-04-14 | 2002-12-24 | 松下電器産業株式会社 | 電圧検出回路および電圧検出方法 |
KR100463201B1 (ko) * | 2002-05-28 | 2004-12-23 | 삼성전자주식회사 | 파워 검출 회로, 이를 이용한 플래시 메모리 장치, 그 플래시 메모리 장치의 파워-온 독출 신호 발생 방법 및 플래시 메모리 장치의 안정적인 파워-온 독출 방법 |
US7293188B2 (en) * | 2002-11-12 | 2007-11-06 | Freescale Semiconductor, Inc. | Low voltage detection system |
KR100562636B1 (ko) * | 2003-12-30 | 2006-03-20 | 주식회사 하이닉스반도체 | 반도체 메모리 소자의 파워업 회로 |
JP4284247B2 (ja) | 2004-08-13 | 2009-06-24 | 株式会社東芝 | 不揮発性半導体記憶装置 |
JP4786369B2 (ja) * | 2006-02-23 | 2011-10-05 | 富士通セミコンダクター株式会社 | 電源検出回路 |
CN101369399B (zh) * | 2007-08-13 | 2011-10-12 | 普诚科技股份有限公司 | 电路测试装置 |
JP5251499B2 (ja) * | 2008-12-26 | 2013-07-31 | 富士通セミコンダクター株式会社 | 半導体装置、半導体装置の起動制御方法、及びシステム |
JP2010178438A (ja) | 2009-01-27 | 2010-08-12 | Sanyo Electric Co Ltd | スイッチング電源制御回路 |
KR20130061678A (ko) | 2010-04-16 | 2013-06-11 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 전원 회로 |
US9369124B2 (en) * | 2011-04-07 | 2016-06-14 | Nxp B.V. | Power-on-reset circuit with low power consumption |
US9036445B1 (en) * | 2014-02-06 | 2015-05-19 | SK Hynix Inc. | Semiconductor devices |
CN106664011B (zh) | 2014-08-26 | 2019-06-11 | 东芝存储器株式会社 | 电压产生电路 |
CN107329879B (zh) * | 2017-07-05 | 2020-08-28 | 英业达科技有限公司 | 电压监控电路与电压监控方法 |
-
2018
- 2018-09-21 KR KR1020217001232A patent/KR102548611B1/ko active IP Right Grant
- 2018-09-21 CN CN201880001771.9A patent/CN109313225B/zh active Active
- 2018-09-21 EP EP18934037.5A patent/EP3811088B1/en active Active
- 2018-09-21 WO PCT/CN2018/106957 patent/WO2020056725A1/en unknown
- 2018-09-21 JP JP2021514522A patent/JP7153791B2/ja active Active
- 2018-10-03 US US16/151,305 patent/US10594302B1/en active Active
- 2018-11-05 TW TW107139179A patent/TWI671530B/zh active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000155140A (ja) | 1998-11-20 | 2000-06-06 | Nec Corp | 電圧検出回路 |
US20120092046A1 (en) | 2010-10-14 | 2012-04-19 | Dong Li | Low power power-on-reset (por) circuit |
Also Published As
Publication number | Publication date |
---|---|
EP3811088B1 (en) | 2023-06-14 |
US20200098437A1 (en) | 2020-03-26 |
KR102548611B1 (ko) | 2023-06-28 |
KR20210021043A (ko) | 2021-02-24 |
EP3811088A4 (en) | 2021-08-18 |
EP3811088A1 (en) | 2021-04-28 |
TW202012943A (zh) | 2020-04-01 |
CN109313225B (zh) | 2019-10-01 |
TWI671530B (zh) | 2019-09-11 |
US10594302B1 (en) | 2020-03-17 |
WO2020056725A1 (en) | 2020-03-26 |
CN109313225A (zh) | 2019-02-05 |
JP2021536017A (ja) | 2021-12-23 |
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