JP7151061B2 - 故障判定回路、物理量検出装置、電子機器、移動体及び故障判定方法 - Google Patents

故障判定回路、物理量検出装置、電子機器、移動体及び故障判定方法 Download PDF

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JP7151061B2
JP7151061B2 JP2017062944A JP2017062944A JP7151061B2 JP 7151061 B2 JP7151061 B2 JP 7151061B2 JP 2017062944 A JP2017062944 A JP 2017062944A JP 2017062944 A JP2017062944 A JP 2017062944A JP 7151061 B2 JP7151061 B2 JP 7151061B2
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signal
conversion unit
digital
physical quantity
circuit
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JP2018166274A (ja
JP2018166274A5 (https=
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憲行 村嶋
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Seiko Epson Corp
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Seiko Epson Corp
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Priority to JP2017062944A priority Critical patent/JP7151061B2/ja
Priority to CN201810187467.XA priority patent/CN108663584A/zh
Priority to CN202511720370.7A priority patent/CN121499963A/zh
Priority to US15/927,424 priority patent/US10256832B2/en
Publication of JP2018166274A publication Critical patent/JP2018166274A/ja
Publication of JP2018166274A5 publication Critical patent/JP2018166274A5/ja
Priority to JP2022098683A priority patent/JP7323015B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H03M1/1076—Detection or location of converter hardware failure, e.g. power supply failure, open or short circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/257—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques using analogue/digital converters of the type with comparison of different reference values with the value of voltage or current, e.g. using step-by-step method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M3/00—Conversion of analogue values to or from differential modulation
    • H03M3/02—Delta modulation, i.e. one-bit differential modulation
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M3/00—Conversion of analogue values to or from differential modulation
    • H03M3/30—Delta-sigma modulation
    • H03M3/378—Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2829—Testing of circuits in sensor or actuator systems
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M3/00—Conversion of analogue values to or from differential modulation
    • H03M3/30—Delta-sigma modulation
    • H03M3/458—Analogue/digital converters using delta-sigma modulation as an intermediate step

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Gyroscopes (AREA)
  • Analogue/Digital Conversion (AREA)
  • Compression, Expansion, Code Conversion, And Decoders (AREA)
JP2017062944A 2017-03-28 2017-03-28 故障判定回路、物理量検出装置、電子機器、移動体及び故障判定方法 Active JP7151061B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2017062944A JP7151061B2 (ja) 2017-03-28 2017-03-28 故障判定回路、物理量検出装置、電子機器、移動体及び故障判定方法
CN201810187467.XA CN108663584A (zh) 2017-03-28 2018-03-07 故障判定电路及方法、检测装置、电子设备、移动体
CN202511720370.7A CN121499963A (zh) 2017-03-28 2018-03-07 故障判定电路及方法、检测装置、电子设备、移动体
US15/927,424 US10256832B2 (en) 2017-03-28 2018-03-21 Failure determination circuit, physical quantity measurement device, electronic apparatus, vehicle, and failure determination method
JP2022098683A JP7323015B2 (ja) 2017-03-28 2022-06-20 物理量処理回路、物理量検出装置、電子機器、及び移動体

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017062944A JP7151061B2 (ja) 2017-03-28 2017-03-28 故障判定回路、物理量検出装置、電子機器、移動体及び故障判定方法

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JP2022098683A Division JP7323015B2 (ja) 2017-03-28 2022-06-20 物理量処理回路、物理量検出装置、電子機器、及び移動体

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JP2018166274A JP2018166274A (ja) 2018-10-25
JP2018166274A5 JP2018166274A5 (https=) 2020-05-07
JP7151061B2 true JP7151061B2 (ja) 2022-10-12

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US (1) US10256832B2 (https=)
JP (1) JP7151061B2 (https=)
CN (2) CN121499963A (https=)

Families Citing this family (10)

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Publication number Priority date Publication date Assignee Title
JP7165080B2 (ja) * 2019-03-18 2022-11-02 セイコーエプソン株式会社 物理量検出回路、物理量センサー、電子機器、移動体及び物理量センサーの故障診断方法
JP7068220B2 (ja) * 2019-03-18 2022-05-16 ファナック株式会社 操作スイッチに応じたディジタル信号を出力するディジタル信号出力装置
US12102437B2 (en) 2019-03-27 2024-10-01 Nitto Denko Corporation Data acquisition device and biosensor
JP7243485B2 (ja) * 2019-06-27 2023-03-22 セイコーエプソン株式会社 物理量検出回路、物理量センサー、電子機器、移動体及び物理量センサーの故障診断方法
JP7322681B2 (ja) * 2019-12-02 2023-08-08 株式会社アイシン 静電容量センサ
JP7322718B2 (ja) * 2020-01-17 2023-08-08 セイコーエプソン株式会社 物理量検出回路、物理量センサー、電子機器、移動体及び物理量検出回路の動作方法
JP7375572B2 (ja) * 2020-01-24 2023-11-08 セイコーエプソン株式会社 物理量検出回路、物理量センサー、電子機器、移動体及び物理量センサーの故障診断方法
CN113433850B (zh) * 2021-06-04 2022-06-03 电子科技大学 一种fpga异态逻辑修复方法
EP4517348A4 (en) * 2022-04-28 2026-02-18 Astemo Ltd Semiconductor Diagnostic System
TW202536442A (zh) * 2024-03-01 2025-09-16 群光電能科技股份有限公司 能源量測裝置

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JP2000151405A (ja) 1998-11-11 2000-05-30 Mitsubishi Electric Corp Ａｄ変換器内蔵シングルチップマイクロコンピュータ及びその故障検出方法
JP2011147063A (ja) 2010-01-18 2011-07-28 Yokogawa Electric Corp アナログデジタル変換装置
WO2015053205A1 (ja) 2013-10-10 2015-04-16 日立オートモティブシステムズ株式会社 電子制御装置
JP2016174335A (ja) 2015-03-18 2016-09-29 日本信号株式会社 アナログ信号入力装置
JP2016189515A (ja) 2015-03-30 2016-11-04 セイコーエプソン株式会社 回路装置、電子機器及び移動体

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JP2000151405A (ja) 1998-11-11 2000-05-30 Mitsubishi Electric Corp Ａｄ変換器内蔵シングルチップマイクロコンピュータ及びその故障検出方法
JP2011147063A (ja) 2010-01-18 2011-07-28 Yokogawa Electric Corp アナログデジタル変換装置
WO2015053205A1 (ja) 2013-10-10 2015-04-16 日立オートモティブシステムズ株式会社 電子制御装置
JP2016174335A (ja) 2015-03-18 2016-09-29 日本信号株式会社 アナログ信号入力装置
JP2016189515A (ja) 2015-03-30 2016-11-04 セイコーエプソン株式会社 回路装置、電子機器及び移動体

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Publication number Publication date
JP2018166274A (ja) 2018-10-25
CN121499963A (zh) 2026-02-10
US20180287625A1 (en) 2018-10-04
CN108663584A (zh) 2018-10-16
US10256832B2 (en) 2019-04-09

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