JP7116419B2 - 粒子測定装置、較正方法、および測定装置 - Google Patents
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Description
21 画像解析部
22 粒子径解析部
Claims (7)
- 目的粒子の粒子径を測定する粒子測定装置において、
(a)較正モードにおいて、粘度が未知の分散媒内の較正用粒子について所定時間間隔で得られた複数の撮像画像を取得し、取得した前記複数の撮像画像における前記較正用粒子の輝点の画素単位の変位に基づいて前記較正用粒子の輝点の平均二乗変位を特定し、(b)測定モードにおいて、前記較正モードの前記分散媒と同じ温度の同じ物質の分散媒内の前記目的粒子について所定時間間隔で得られた複数の撮像画像を取得し、前記測定モードで取得した前記複数の撮像画像における前記目的粒子の輝点の画素単位の変位に基づいて前記目的粒子の輝点の平均二乗変位を特定する画像解析部と、
(c)解析モードにおいて、前記較正用粒子の輝点の平均二乗変位および前記較正用粒子の粒子径に基づいて、前記目的粒子の輝点の平均二乗変位から前記目的粒子の粒子径を導出する粒子径解析部と、
を備えることを特徴とする粒子測定装置。 - 前記画像解析部は、(a)前記較正モードにおいて、前記分散媒の流速分布に基づいて前記較正用粒子の輝点の変位を補正して、前記較正用粒子の輝点の平均二乗変位を特定し、(b)前記測定モードにおいて、前記分散媒の流速分布に基づいて前記目的粒子の輝点の変位を補正して、前記目的粒子の輝点の平均二乗変位を特定することを特徴とする請求項1記載の粒子測定装置。
- 前記粒子径解析部は、導出した前記粒子径を、所定の複数の粒子径範囲のいずれかに分類して、前記所定の複数の粒子径範囲のそれぞれについての粒子数を計数することを特徴とする請求項1または請求項2記載の粒子測定装置。
- 分散媒内の目的粒子の粒子径を測定する粒子測定装置において、
所定時間間隔で得られた複数の撮像画像を取得し、(a)較正モードにおいて、前記複数の撮像画像における較正用粒子の輝点の画素単位の変位に基づいて前記較正用粒子の輝点の平均二乗変位を特定し、(b)測定モードにおいて、前記複数の撮像画像における前記目的粒子の輝点の画素単位の変位に基づいて前記目的粒子の輝点の平均二乗変位を特定する画像解析部と、
(c)解析モードにおいて、前記較正用粒子の輝点の平均二乗変位および前記較正用粒子の粒子径に基づいて、前記目的粒子の輝点の平均二乗変位から前記目的粒子の粒子径を導出する粒子径解析部と、
を備え、
前記画像解析部は、所定時間間隔で得られた複数の撮像画像を取得し、(a)較正モードにおいて、前記複数の撮像画像における較正用粒子の輝点の画素単位の変位に基づいて前記較正用粒子の輝点の平均二乗変位を特定し、前記較正用粒子の輝点の平均二乗変位と前記較正用粒子の粒子径との積を装置定数として計算し、(b)測定モードにおいて、前記複数の撮像画像における目的粒子の輝点の画素単位の変位に基づいて前記目的粒子の平均二乗変位を特定し、
前記粒子径解析部は、(c)解析モードにおいて、前記装置定数を前記目的粒子の輝点の平均二乗変位で除算して前記目的粒子の粒子径を導出すること、
を特徴とする粒子測定装置。 - 前記画像解析部は、前記撮像画像内の複数の位置における前記較正用粒子の輝点の平均二乗変位をそれぞれ特定し、
前記粒子径解析部は、前記撮像画像内の複数の位置における前記装置定数の二次元分布に基づいて、前記撮像画像内の前記目的粒子の輝点の位置での粒子径を導出すること、
を特徴とする請求項4記載の粒子測定装置。 - 撮像装置で分散媒内の目的粒子を撮像して前記目的粒子の粒子径を測定する粒子測定装置の較正方法において、
較正モードにおいて、粘度が未知の分散媒内の較正用粒子について所定時間間隔で得られた複数の撮像画像を取得し、前記粒子測定装置で、取得した前記複数の撮像画像における前記較正用粒子の輝点の画素単位の変位に基づいて前記較正用粒子の輝点の平均二乗変位を特定し、
測定モードにおいて、前記較正モードの前記分散媒と同じ温度の同じ物質の分散媒内の前記目的粒子について所定時間間隔で得られた複数の撮像画像を取得し、前記較正用粒子の輝点の平均二乗変位と前記較正用粒子の粒子径とに基づいて、前記粒子測定装置で、前記測定モードで取得した前記複数の撮像画像における前記目的粒子の輝点の画素単位の変位に基づいて特定される前記目的粒子の輝点の平均二乗変位から、前記目的粒子の粒子径を算出できるようにすること、
を特徴とする較正方法。 - 前記分散媒の流速分布に基づいて前記較正用粒子の輝点の変位を補正して、前記較正用粒子の輝点の平均二乗変位を特定することを特徴とする請求項6記載の較正方法。
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JP2018188919A JP7116419B2 (ja) | 2018-10-04 | 2018-10-04 | 粒子測定装置、較正方法、および測定装置 |
CN201980065132.3A CN112840199A (zh) | 2018-10-04 | 2019-09-30 | 粒子测定装置、校正方法以及测定装置 |
US17/276,847 US11774340B2 (en) | 2018-10-04 | 2019-09-30 | Particle measuring device, calibration method, and measuring device |
PCT/JP2019/038490 WO2020071306A1 (ja) | 2018-10-04 | 2019-09-30 | 粒子測定装置、較正方法、および測定装置 |
KR1020217007722A KR20210066809A (ko) | 2018-10-04 | 2019-09-30 | 입자 측정 장치, 교정 방법, 및 측정 장치 |
EP19869892.0A EP3862742A4 (en) | 2018-10-04 | 2019-09-30 | PARTICLE MEASUREMENT DEVICE, CALIBRATION METHOD AND MEASUREMENT DEVICE |
TW108135884A TWI810375B (zh) | 2018-10-04 | 2019-10-03 | 粒子測定裝置、校正方法以及測定裝置 |
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IT202000031394A1 (it) * | 2020-12-18 | 2022-06-18 | Nuova Ompi Srl | Apparato e metodo per ispezionare contenitori cilindrici trasparenti contenenti prodotti gel o viscosi trasparenti o semi trasparenti, in particolare per applicazioni medicali |
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