JP6900146B2 - 溶媒含有コーティングでコーティングされたウエハのためのベーキングデバイス - Google Patents
溶媒含有コーティングでコーティングされたウエハのためのベーキングデバイス Download PDFInfo
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- JP6900146B2 JP6900146B2 JP2015204572A JP2015204572A JP6900146B2 JP 6900146 B2 JP6900146 B2 JP 6900146B2 JP 2015204572 A JP2015204572 A JP 2015204572A JP 2015204572 A JP2015204572 A JP 2015204572A JP 6900146 B2 JP6900146 B2 JP 6900146B2
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- exhaust
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- 239000002904 solvent Substances 0.000 title claims description 54
- 238000000576 coating method Methods 0.000 title claims description 21
- 235000012431 wafers Nutrition 0.000 title description 46
- 238000010926 purge Methods 0.000 claims description 62
- 238000009792 diffusion process Methods 0.000 claims description 24
- 239000011248 coating agent Substances 0.000 claims description 18
- 238000009826 distribution Methods 0.000 claims description 7
- 238000010438 heat treatment Methods 0.000 claims description 6
- 230000002776 aggregation Effects 0.000 description 6
- 238000005054 agglomeration Methods 0.000 description 5
- 238000001704 evaporation Methods 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000008020 evaporation Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 230000004520 agglutination Effects 0.000 description 2
- 238000005553 drilling Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000004931 aggregating effect Effects 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67103—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/67034—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F27—FURNACES; KILNS; OVENS; RETORTS
- F27B—FURNACES, KILNS, OVENS, OR RETORTS IN GENERAL; OPEN SINTERING OR LIKE APPARATUS
- F27B17/00—Furnaces of a kind not covered by any preceding group
- F27B17/0016—Chamber type furnaces
- F27B17/0025—Especially adapted for treating semiconductor wafers
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F27—FURNACES; KILNS; OVENS; RETORTS
- F27B—FURNACES, KILNS, OVENS, OR RETORTS IN GENERAL; OPEN SINTERING OR LIKE APPARATUS
- F27B3/00—Hearth-type furnaces, e.g. of reverberatory type; Tank furnaces
- F27B3/02—Hearth-type furnaces, e.g. of reverberatory type; Tank furnaces of single-chamber fixed-hearth type
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F27—FURNACES; KILNS; OVENS; RETORTS
- F27D—DETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
- F27D3/00—Charging; Discharging; Manipulation of charge
- F27D3/0084—Charging; Manipulation of SC or SC wafers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
- G03F7/168—Finishing the coated layer, e.g. drying, baking, soaking
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67109—Apparatus for thermal treatment mainly by convection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/6719—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the processing chambers, e.g. modular processing chambers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D3/00—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials
- B05D3/02—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by baking
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F27—FURNACES; KILNS; OVENS; RETORTS
- F27D—DETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
- F27D7/00—Forming, maintaining, or circulating atmospheres in heating chambers
- F27D7/02—Supplying steam, vapour, gases, or liquids
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
- Coating Apparatus (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
Description
Claims (9)
- 溶媒を含むコーティング(15)でコーティングされたウエハ(14)のためのベーキングデバイス(10)であって、
ベーキングチャンバ(16)、ウエハ(14)のためのサポート(12)、パージガスのための導入口(30)、およびコーティング(15)から蒸発した溶媒が加えられたパージガスのための排気(40)を有し、
導入口は、ウエハ(14)の上方に配置された拡散要素(30)として形成されて、実質的にウエハ(14)の表面全体の上にパージガスを均一に供給し、
排気は、拡散要素(30)を半径方向に囲み、ベーキングチャンバ(16)の天井(22)に配置された排気リング(40)として形成され、
環状の排気チャネル(42)は、排気リング(40)の背後に形成され、
放出システムは、排気チャネルを排出システムに接続し、放出システムは、均等に分布した位置(48)で排気チャネル(42)に接続された複数の排出チャネル(44)を含み、
排気チャネルと排出チャネルは、天井要素と一体化され、天井要素は、ベーキングチャンバの天井を形成し、拡散要素を中央に含むベーキングデバイス。 - 拡散要素(30)は、その表面上に分布した多くの導入開口部を有する請求項1に記載のデバイス。
- 拡散要素(30)は、所定のガス多孔性を有する焼結プレートである請求項2に記載のデバイス。
- 分配チャンバ(32)は、拡散要素(30)の背後に形成される請求項1〜3のいずれかに記載のデバイス。
- 排気リング(40)は、ウエハ(14)の半径方向に外方に配置される請求項1〜4のいずれかに記載のデバイス。
- 排気リング(40)の直径は、ウエハサポート(12)の直径にほぼ対応する請求項1〜5のいずれかに記載のデバイス。
- ベーキングチャンバ(16)への追加のパージガス導入口(36)は、ウエハサポート(12)の外周に沿って形成される請求項1〜6のいずれかに記載のデバイス。
- 加熱システム(25)は、ベーキングチャンバ(16)の少なくとも1つの表面のために形成された請求項1〜7のいずれかに記載のデバイス。
- 加熱システム(24)は、ウエハサポート(12)に組み込まれた請求項1〜8のいずれかに記載のデバイス。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102014117228.0 | 2014-11-25 | ||
DE102014117228.0A DE102014117228B4 (de) | 2014-11-25 | 2014-11-25 | Backvorrichtung für einen Wafer, der mit einer ein Lösungsmittel enthaltenden Beschichtung beschichtet ist |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2016119452A JP2016119452A (ja) | 2016-06-30 |
JP2016119452A5 JP2016119452A5 (ja) | 2018-08-09 |
JP6900146B2 true JP6900146B2 (ja) | 2021-07-07 |
Family
ID=55914101
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2015204572A Active JP6900146B2 (ja) | 2014-11-25 | 2015-10-16 | 溶媒含有コーティングでコーティングされたウエハのためのベーキングデバイス |
Country Status (7)
Country | Link |
---|---|
US (1) | US10825701B2 (ja) |
JP (1) | JP6900146B2 (ja) |
KR (1) | KR102256154B1 (ja) |
CN (1) | CN105618352A (ja) |
AT (1) | AT516575B1 (ja) |
DE (1) | DE102014117228B4 (ja) |
TW (1) | TWI713472B (ja) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20180000928A (ko) * | 2016-06-24 | 2018-01-04 | 세메스 주식회사 | 가열 처리 유닛, 이를 갖는 베이크 장치 및 이를 이용한 기판 처리 방법 |
JP6872328B2 (ja) * | 2016-09-06 | 2021-05-19 | 株式会社Screenホールディングス | 減圧乾燥装置、減圧乾燥システム、減圧乾燥方法 |
JP6829053B2 (ja) * | 2016-11-09 | 2021-02-10 | コマツ産機株式会社 | マシンルーム |
CN107362953A (zh) * | 2017-09-01 | 2017-11-21 | 深圳市华星光电半导体显示技术有限公司 | 光阻烘烤设备 |
US11779871B2 (en) * | 2018-12-21 | 2023-10-10 | Xia Tai Xin Semiconductor (Qing Dao) Ltd. | Exhaust module for wafer baking apparatus and wafer processing system having the same |
CN109830451B (zh) * | 2019-01-23 | 2021-07-23 | 武汉华星光电半导体显示技术有限公司 | 基板干燥装置 |
CN113249707A (zh) * | 2021-04-21 | 2021-08-13 | 拓荆科技股份有限公司 | 一种薄膜沉积装置和薄膜沉积方法 |
KR20220145984A (ko) * | 2021-04-22 | 2022-11-01 | 삼성전자주식회사 | 베이크 장치 |
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2014
- 2014-11-25 DE DE102014117228.0A patent/DE102014117228B4/de active Active
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2015
- 2015-10-16 JP JP2015204572A patent/JP6900146B2/ja active Active
- 2015-10-20 TW TW104134347A patent/TWI713472B/zh active
- 2015-10-20 AT ATA50893/2015A patent/AT516575B1/de active
- 2015-11-23 US US14/948,877 patent/US10825701B2/en active Active
- 2015-11-23 KR KR1020150163960A patent/KR102256154B1/ko active IP Right Grant
- 2015-11-24 CN CN201510829006.4A patent/CN105618352A/zh active Pending
Also Published As
Publication number | Publication date |
---|---|
TW201631286A (zh) | 2016-09-01 |
US20160148823A1 (en) | 2016-05-26 |
AT516575B1 (de) | 2022-07-15 |
AT516575A2 (de) | 2016-06-15 |
TWI713472B (zh) | 2020-12-21 |
KR20160062702A (ko) | 2016-06-02 |
DE102014117228A1 (de) | 2016-05-25 |
CN105618352A (zh) | 2016-06-01 |
US10825701B2 (en) | 2020-11-03 |
AT516575A3 (de) | 2017-11-15 |
JP2016119452A (ja) | 2016-06-30 |
KR102256154B1 (ko) | 2021-05-26 |
DE102014117228B4 (de) | 2022-10-20 |
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