AT516575A3 - Backvorrichtung für einen Wafer, der mit einer ein Lösungsmittel enthaltenden Beschichtung beschichtet ist - Google Patents

Backvorrichtung für einen Wafer, der mit einer ein Lösungsmittel enthaltenden Beschichtung beschichtet ist

Info

Publication number
AT516575A3
AT516575A3 ATA50893/2015A AT508932015A AT516575A3 AT 516575 A3 AT516575 A3 AT 516575A3 AT 508932015 A AT508932015 A AT 508932015A AT 516575 A3 AT516575 A3 AT 516575A3
Authority
AT
Austria
Prior art keywords
wafer
solvent
purge gas
coating containing
baking apparatus
Prior art date
Application number
ATA50893/2015A
Other languages
English (en)
Other versions
AT516575B1 (de
AT516575A2 (de
Original Assignee
Suss Microtec Lithography Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suss Microtec Lithography Gmbh filed Critical Suss Microtec Lithography Gmbh
Publication of AT516575A2 publication Critical patent/AT516575A2/de
Publication of AT516575A3 publication Critical patent/AT516575A3/de
Application granted granted Critical
Publication of AT516575B1 publication Critical patent/AT516575B1/de

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/67034Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment
    • H01L21/67103Apparatus for thermal treatment mainly by conduction
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27BFURNACES, KILNS, OVENS, OR RETORTS IN GENERAL; OPEN SINTERING OR LIKE APPARATUS
    • F27B17/00Furnaces of a kind not covered by any preceding group
    • F27B17/0016Chamber type furnaces
    • F27B17/0025Especially adapted for treating semiconductor wafers
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27BFURNACES, KILNS, OVENS, OR RETORTS IN GENERAL; OPEN SINTERING OR LIKE APPARATUS
    • F27B3/00Hearth-type furnaces, e.g. of reverberatory type; Tank furnaces
    • F27B3/02Hearth-type furnaces, e.g. of reverberatory type; Tank furnaces of single-chamber fixed-hearth type
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27DDETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
    • F27D3/00Charging; Discharging; Manipulation of charge
    • F27D3/0084Charging; Manipulation of SC or SC wafers
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/16Coating processes; Apparatus therefor
    • G03F7/168Finishing the coated layer, e.g. drying, baking, soaking
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment
    • H01L21/67109Apparatus for thermal treatment mainly by convection
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/6719Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the processing chambers, e.g. modular processing chambers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05DPROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05D3/00Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials
    • B05D3/02Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by baking
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27DDETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
    • F27D7/00Forming, maintaining, or circulating atmospheres in heating chambers
    • F27D7/02Supplying steam, vapour, gases, or liquids
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Power Engineering (AREA)
  • Mechanical Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • Coating Apparatus (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)

Abstract

Es wird eine Backvorrichtung (10) für einen Wafer (14) beschrieben, der mit einer ein Lösungsmittel enthaltenden Beschichtung (15) beschichtet ist, wobei die Backvorrichtung eine Backkammer (16), einen Träger (12) für den Wafer (14), einen Einlass (30) für ein Spülgas und eine Ausleitung (40) für das Spülgas aufweist, das mit aus der Beschichtung (15) verdampftem Lösungsmittel beladen ist. Der Einlass ist als Diffusionselement (30) ausgebildet, das über dem Wafer (14) angeordnet ist, damit das Spülgas gleichmäßig über im Wesentlichen die gesamte Oberfläche des Wafers (14) eingeleitet wird, und die Ausleitung ist als Ausleitungsring (40) ausgebildet, der das Diffusionselement (30) radial umgibt und an einer Decke (22) der Backkammer (16) angeordnet ist.
ATA50893/2015A 2014-11-25 2015-10-20 Backvorrichtung für einen Wafer, der mit einer ein Lösungsmittel enthaltenden Beschichtung beschichtet ist AT516575B1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102014117228.0A DE102014117228B4 (de) 2014-11-25 2014-11-25 Backvorrichtung für einen Wafer, der mit einer ein Lösungsmittel enthaltenden Beschichtung beschichtet ist

Publications (3)

Publication Number Publication Date
AT516575A2 AT516575A2 (de) 2016-06-15
AT516575A3 true AT516575A3 (de) 2017-11-15
AT516575B1 AT516575B1 (de) 2022-07-15

Family

ID=55914101

Family Applications (1)

Application Number Title Priority Date Filing Date
ATA50893/2015A AT516575B1 (de) 2014-11-25 2015-10-20 Backvorrichtung für einen Wafer, der mit einer ein Lösungsmittel enthaltenden Beschichtung beschichtet ist

Country Status (7)

Country Link
US (1) US10825701B2 (de)
JP (1) JP6900146B2 (de)
KR (1) KR102256154B1 (de)
CN (1) CN105618352A (de)
AT (1) AT516575B1 (de)
DE (1) DE102014117228B4 (de)
TW (1) TWI713472B (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20180000928A (ko) * 2016-06-24 2018-01-04 세메스 주식회사 가열 처리 유닛, 이를 갖는 베이크 장치 및 이를 이용한 기판 처리 방법
JP6872328B2 (ja) * 2016-09-06 2021-05-19 株式会社Screenホールディングス 減圧乾燥装置、減圧乾燥システム、減圧乾燥方法
JP6829053B2 (ja) * 2016-11-09 2021-02-10 コマツ産機株式会社 マシンルーム
CN107362953A (zh) * 2017-09-01 2017-11-21 深圳市华星光电半导体显示技术有限公司 光阻烘烤设备
US11779871B2 (en) * 2018-12-21 2023-10-10 Xia Tai Xin Semiconductor (Qing Dao) Ltd. Exhaust module for wafer baking apparatus and wafer processing system having the same
CN109830451B (zh) * 2019-01-23 2021-07-23 武汉华星光电半导体显示技术有限公司 基板干燥装置
CN113249707A (zh) * 2021-04-21 2021-08-13 拓荆科技股份有限公司 一种薄膜沉积装置和薄膜沉积方法

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5595602A (en) * 1995-08-14 1997-01-21 Motorola, Inc. Diffuser for uniform gas distribution in semiconductor processing and method for using the same
WO1999056307A1 (en) * 1998-04-28 1999-11-04 Applied Materials, Inc. Improved heater for use in substrate processing apparatus to deposit tungsten
US20050244759A1 (en) * 2004-04-30 2005-11-03 Myoung-Kuy Lee Bake apparatus for use in spin-coating equipment
US20060151462A1 (en) * 2004-12-30 2006-07-13 Samsung Electronics Co., Ltd. Semiconductor wafer baking apparatus
KR100763698B1 (ko) * 2006-07-20 2007-10-04 동부일렉트로닉스 주식회사 반도체 소자 제조를 위한 베이크 유닛
US20110092075A1 (en) * 2009-10-16 2011-04-21 Kunihiko Suzuki Manufacturing apparatus and method for semiconductor device
US20130078816A1 (en) * 2011-09-27 2013-03-28 Hitachi Kokusai Electric Inc. Substrate Processing Apparatus, Method of Manufacturing Semiconductor Device and Non-Transitory Computer-Readable Recording Medium

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3405454A (en) * 1965-12-06 1968-10-15 Arde Inc Waste management system
US4793283A (en) * 1987-12-10 1988-12-27 Sarkozy Robert F Apparatus for chemical vapor deposition with clean effluent and improved product yield
US4820371A (en) 1987-12-15 1989-04-11 Texas Instruments Incorporated Apertured ring for exhausting plasma reactor gases
JPH0645335A (ja) 1992-07-24 1994-02-18 Nec Corp 半導体装置の配線修正装置
JP2909944B2 (ja) * 1992-09-28 1999-06-23 東京エレクトロン株式会社 処理装置
JP2586600Y2 (ja) * 1992-11-19 1998-12-09 大日本スクリーン製造株式会社 基板加熱処理装置
US6248168B1 (en) * 1997-12-15 2001-06-19 Tokyo Electron Limited Spin coating apparatus including aging unit and solvent replacement unit
JP2000124096A (ja) * 1998-10-16 2000-04-28 Matsushita Electric Ind Co Ltd 熱処理炉装置
US6143079A (en) * 1998-11-19 2000-11-07 Asm America, Inc. Compact process chamber for improved process uniformity
JP2002313701A (ja) * 2001-04-16 2002-10-25 Canon Inc 加熱装置
US7138336B2 (en) * 2001-08-06 2006-11-21 Asm Genitech Korea Ltd. Plasma enhanced atomic layer deposition (PEALD) equipment and method of forming a conducting thin film using the same thereof
JP3764357B2 (ja) * 2001-08-23 2006-04-05 東京エレクトロン株式会社 加熱処理装置
US7256370B2 (en) * 2002-03-15 2007-08-14 Steed Technology, Inc. Vacuum thermal annealer
JP4066255B2 (ja) * 2002-09-27 2008-03-26 東京エレクトロン株式会社 基板の処理装置及び基板の処理方法
KR20080014778A (ko) * 2005-04-18 2008-02-14 호쿠리쿠세이케고교 가부시키가이샤 샤워 플레이트 및 그 제조 방법
JP4601070B2 (ja) 2006-01-17 2010-12-22 東京エレクトロン株式会社 熱処理装置
US7351936B1 (en) * 2007-01-22 2008-04-01 Taiwan Semiconductor Manufacturing Company Method and apparatus for preventing baking chamber exhaust line clog
JP4930495B2 (ja) * 2008-12-04 2012-05-16 東京エレクトロン株式会社 基板加熱装置及び基板加熱方法

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5595602A (en) * 1995-08-14 1997-01-21 Motorola, Inc. Diffuser for uniform gas distribution in semiconductor processing and method for using the same
WO1999056307A1 (en) * 1998-04-28 1999-11-04 Applied Materials, Inc. Improved heater for use in substrate processing apparatus to deposit tungsten
US20050244759A1 (en) * 2004-04-30 2005-11-03 Myoung-Kuy Lee Bake apparatus for use in spin-coating equipment
US20060151462A1 (en) * 2004-12-30 2006-07-13 Samsung Electronics Co., Ltd. Semiconductor wafer baking apparatus
KR100763698B1 (ko) * 2006-07-20 2007-10-04 동부일렉트로닉스 주식회사 반도체 소자 제조를 위한 베이크 유닛
US20110092075A1 (en) * 2009-10-16 2011-04-21 Kunihiko Suzuki Manufacturing apparatus and method for semiconductor device
US20130078816A1 (en) * 2011-09-27 2013-03-28 Hitachi Kokusai Electric Inc. Substrate Processing Apparatus, Method of Manufacturing Semiconductor Device and Non-Transitory Computer-Readable Recording Medium

Also Published As

Publication number Publication date
KR102256154B1 (ko) 2021-05-26
TW201631286A (zh) 2016-09-01
AT516575B1 (de) 2022-07-15
US10825701B2 (en) 2020-11-03
JP6900146B2 (ja) 2021-07-07
KR20160062702A (ko) 2016-06-02
TWI713472B (zh) 2020-12-21
US20160148823A1 (en) 2016-05-26
CN105618352A (zh) 2016-06-01
DE102014117228A1 (de) 2016-05-25
AT516575A2 (de) 2016-06-15
DE102014117228B4 (de) 2022-10-20
JP2016119452A (ja) 2016-06-30

Similar Documents

Publication Publication Date Title
AT516575A3 (de) Backvorrichtung für einen Wafer, der mit einer ein Lösungsmittel enthaltenden Beschichtung beschichtet ist
PH12017501628A1 (en) Wafer dryer apparatus and method
CL2019001161A1 (es) Articulo de suministro de aerosol
GB2556582A (en) Microfluidic devices and methods of use thereof
CA3002817A1 (en) Illumination device for a fluid delivery apparatus
JP2016219803A5 (de)
JP2016119452A5 (de)
WO2015145122A3 (en) Method for coating a filter substrate
TW201612953A (en) Substrate support with more uniform edge purge
TWM389934U (en) Atomic layer deposition chamber and components
RU2015142107A (ru) Способ и устройство для защиты внутренних поверхностей насоса посредством атомно-слоевого покрытия
WO2016156495A3 (en) Article for use with apparatus for heating smokable material
WO2020089180A9 (de) Beschichtungsvorrichtung, prozesskammer, sowie verfahren zum beschichten eines substrats und substrat beschichtet mit zumindest einer materialschicht
TW201611899A (en) Coating device
CH710182A8 (de) Turbinenkomponente mit gestuften Öffnungen.
DK2707127T3 (da) Indretning til kontinuerlig behandling af faste stoffer i et fluid-bed-apparat
PH12017500672B1 (en) Spray nozzle apparatus for spray-drying applications
MX2017007584A (es) Un eductor controlable espacialmente para manejar aditivos solidos y procesos que lo usan.
FR3037511B1 (fr) Dispositif de revetement d'un carter annulaire de turbomachine
WO2016072850A3 (en) Atomic layer deposition apparatus and method for processing substrates using an apparatus
MX2017015935A (es) Sistema y metodo para mejorar el flujo de aire de enfriamiento.
SG11201811727WA (en) Method and device for producing coated semiconductor wafers
WO2017122963A3 (ko) 에피텍셜 웨이퍼 제조 방법
SG10201902318UA (en) Coating liquid for forming n-type oxide semiconductor film, method for producing n-type oxide semiconductor film, and method for producing field-effect transistor
SG11202011520TA (en) Upper electrode assembly, reaction chamber and atomic layer deposition device