JP6883482B2 - センサ回路 - Google Patents

センサ回路 Download PDF

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Publication number
JP6883482B2
JP6883482B2 JP2017132422A JP2017132422A JP6883482B2 JP 6883482 B2 JP6883482 B2 JP 6883482B2 JP 2017132422 A JP2017132422 A JP 2017132422A JP 2017132422 A JP2017132422 A JP 2017132422A JP 6883482 B2 JP6883482 B2 JP 6883482B2
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JP
Japan
Prior art keywords
signal
circuit
control circuit
physical quantity
clock control
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2017132422A
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English (en)
Japanese (ja)
Other versions
JP2018036252A5 (enExample
JP2018036252A (ja
Inventor
友生 挽地
友生 挽地
稔 有山
稔 有山
宏伯 矢野
宏伯 矢野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ablic Inc
Original Assignee
Ablic Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ablic Inc filed Critical Ablic Inc
Priority to TW106127049A priority Critical patent/TWI701444B/zh
Priority to KR1020170107292A priority patent/KR102303877B1/ko
Priority to US15/685,473 priority patent/US10191124B2/en
Priority to CN201710741669.XA priority patent/CN107783065B/zh
Publication of JP2018036252A publication Critical patent/JP2018036252A/ja
Publication of JP2018036252A5 publication Critical patent/JP2018036252A5/ja
Application granted granted Critical
Publication of JP6883482B2 publication Critical patent/JP6883482B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3187—Built-in tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2829—Testing of circuits in sensor or actuator systems

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Measuring Magnetic Variables (AREA)
  • Electronic Switches (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2017132422A 2016-08-26 2017-07-06 センサ回路 Active JP6883482B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
TW106127049A TWI701444B (zh) 2016-08-26 2017-08-10 感測電路
KR1020170107292A KR102303877B1 (ko) 2016-08-26 2017-08-24 센서 회로
US15/685,473 US10191124B2 (en) 2016-08-26 2017-08-24 Sensor circuit
CN201710741669.XA CN107783065B (zh) 2016-08-26 2017-08-25 传感器电路

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016165827 2016-08-26
JP2016165827 2016-08-26

Publications (3)

Publication Number Publication Date
JP2018036252A JP2018036252A (ja) 2018-03-08
JP2018036252A5 JP2018036252A5 (enExample) 2020-07-30
JP6883482B2 true JP6883482B2 (ja) 2021-06-09

Family

ID=61567306

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017132422A Active JP6883482B2 (ja) 2016-08-26 2017-07-06 センサ回路

Country Status (3)

Country Link
JP (1) JP6883482B2 (enExample)
KR (1) KR102303877B1 (enExample)
TW (1) TWI701444B (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7465173B2 (ja) 2020-08-03 2024-04-10 エイブリック株式会社 磁気センサ回路
JP7641796B2 (ja) 2021-03-30 2025-03-07 エイブリック株式会社 センサ装置

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6337270A (ja) * 1986-07-31 1988-02-17 Fujitsu Ltd 半導体装置
JPH1116395A (ja) * 1997-06-25 1999-01-22 Mitsubishi Electric Corp 半導体記憶装置
TW419592B (en) * 1998-03-31 2001-01-21 Hitachi Maxell Current accumulating value detecting apparatus, current detecting apparatus and the battery set used
JP3672082B2 (ja) * 2000-09-14 2005-07-13 理研計器株式会社 熱線式ガスセンサーを用いたガス検知警報装置
TW559970B (en) * 2001-04-05 2003-11-01 Kawasaki Microelectronics Inc Test circuit, semiconductor product wafer having the test circuit, and method of monitoring manufacturing process using the test circuit
JP2006153699A (ja) * 2004-11-30 2006-06-15 Matsushita Electric Ind Co Ltd 磁界検出装置
US7295051B2 (en) * 2005-06-15 2007-11-13 Cypress Semiconductor Corp. System and method for monitoring a power supply level
DE102006050832B4 (de) * 2006-10-27 2012-07-26 Infineon Technologies Ag In-Betrieb-Test eines Signalpfades mittels wenigstens zweier Testsignale
JP4756701B2 (ja) * 2006-12-13 2011-08-24 三洋電機株式会社 電源電圧検出回路
DE112007003570T5 (de) * 2007-06-27 2010-08-26 Advantest Corp. Erfassungsgerät und Prüfgerät
JP4786608B2 (ja) * 2007-07-30 2011-10-05 パナソニック株式会社 磁界検出装置
JP2007322442A (ja) * 2007-09-07 2007-12-13 Matsushita Electric Ind Co Ltd 流量計測装置
US8120354B2 (en) * 2008-05-01 2012-02-21 Broadband Discovery Systems, Inc. Self-calibrating magnetic field monitor
JP5206487B2 (ja) * 2009-02-25 2013-06-12 富士通セミコンダクター株式会社 半導体集積回路の制御方法および半導体集積回路
TWI408390B (zh) * 2010-06-25 2013-09-11 Princeton Technology Corp 用於類比量測模組之控制電路與相關控制模組
KR101254263B1 (ko) * 2010-11-23 2013-04-12 삼성디스플레이 주식회사 전원 변환기, 직류-직류 변환기를 포함하는 표시 장치, 표시 장치를 포함하는 시스템 및 표시 장치의 구동 방법
US8760217B2 (en) * 2011-02-25 2014-06-24 Qualcomm Incorporated Semiconductor device having on-chip voltage regulator
KR101204205B1 (ko) * 2011-05-13 2012-11-26 삼성전기주식회사 관성 센서 구동 장치 및 방법
JP5957242B2 (ja) * 2012-03-01 2016-07-27 アズビル株式会社 超音波流量計簡易診断装置
US8943377B2 (en) * 2012-08-15 2015-01-27 International Business Machines Corporation On-chip detection of types of operations tested by an LBIST

Also Published As

Publication number Publication date
TW201807417A (zh) 2018-03-01
KR20180023852A (ko) 2018-03-07
TWI701444B (zh) 2020-08-11
KR102303877B1 (ko) 2021-09-17
JP2018036252A (ja) 2018-03-08

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