TWI701444B - 感測電路 - Google Patents

感測電路 Download PDF

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Publication number
TWI701444B
TWI701444B TW106127049A TW106127049A TWI701444B TW I701444 B TWI701444 B TW I701444B TW 106127049 A TW106127049 A TW 106127049A TW 106127049 A TW106127049 A TW 106127049A TW I701444 B TWI701444 B TW I701444B
Authority
TW
Taiwan
Prior art keywords
signal
circuit
physical quantity
control circuit
outputs
Prior art date
Application number
TW106127049A
Other languages
English (en)
Chinese (zh)
Other versions
TW201807417A (zh
Inventor
挽地友生
有山稔
矢野宏伯
Original Assignee
日商艾普凌科有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商艾普凌科有限公司 filed Critical 日商艾普凌科有限公司
Publication of TW201807417A publication Critical patent/TW201807417A/zh
Application granted granted Critical
Publication of TWI701444B publication Critical patent/TWI701444B/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3187—Built-in tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2829—Testing of circuits in sensor or actuator systems

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Measuring Magnetic Variables (AREA)
  • Electronic Switches (AREA)
  • Tests Of Electronic Circuits (AREA)
TW106127049A 2016-08-26 2017-08-10 感測電路 TWI701444B (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2016165827 2016-08-26
JP2016-165827 2016-08-26
JP2017-132422 2017-07-06
JP2017132422A JP6883482B2 (ja) 2016-08-26 2017-07-06 センサ回路

Publications (2)

Publication Number Publication Date
TW201807417A TW201807417A (zh) 2018-03-01
TWI701444B true TWI701444B (zh) 2020-08-11

Family

ID=61567306

Family Applications (1)

Application Number Title Priority Date Filing Date
TW106127049A TWI701444B (zh) 2016-08-26 2017-08-10 感測電路

Country Status (3)

Country Link
JP (1) JP6883482B2 (enExample)
KR (1) KR102303877B1 (enExample)
TW (1) TWI701444B (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7465173B2 (ja) 2020-08-03 2024-04-10 エイブリック株式会社 磁気センサ回路
JP7641796B2 (ja) 2021-03-30 2025-03-07 エイブリック株式会社 センサ装置

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW559970B (en) * 2001-04-05 2003-11-01 Kawasaki Microelectronics Inc Test circuit, semiconductor product wafer having the test circuit, and method of monitoring manufacturing process using the test circuit
CN1136460C (zh) * 1998-03-31 2004-01-28 株式会社日立制作所 电流积算值检测装置和电流检测装置及采用它们的电池组
TW200704946A (en) * 2005-06-15 2007-02-01 Cypress Semiconductor Corp System and method for monitoring a power supply level
US20080103705A1 (en) * 2006-10-27 2008-05-01 Dirk Hammerschmidt Online Testing Of A Signal Path By Means Of At Least Two Test Signals
TW200900713A (en) * 2007-06-27 2009-01-01 Advantest Corp Detection apparatus and test apparatus
TW201200888A (en) * 2010-06-25 2012-01-01 Princeton Technology Corp Controlling circuit used for analog measure module and controlling module thereof
TW201222214A (en) * 2010-11-23 2012-06-01 Samsung Mobile Display Co Ltd Power converter, display device including power converter, system including display device, and method of driving display device
US20120218005A1 (en) * 2011-02-25 2012-08-30 Qualcomm Incorporated Semiconductor Device Having On-Chip Voltage Regulator

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6337270A (ja) * 1986-07-31 1988-02-17 Fujitsu Ltd 半導体装置
JPH1116395A (ja) * 1997-06-25 1999-01-22 Mitsubishi Electric Corp 半導体記憶装置
JP3672082B2 (ja) * 2000-09-14 2005-07-13 理研計器株式会社 熱線式ガスセンサーを用いたガス検知警報装置
JP2006153699A (ja) * 2004-11-30 2006-06-15 Matsushita Electric Ind Co Ltd 磁界検出装置
JP4756701B2 (ja) * 2006-12-13 2011-08-24 三洋電機株式会社 電源電圧検出回路
JP4786608B2 (ja) * 2007-07-30 2011-10-05 パナソニック株式会社 磁界検出装置
JP2007322442A (ja) * 2007-09-07 2007-12-13 Matsushita Electric Ind Co Ltd 流量計測装置
US8120354B2 (en) * 2008-05-01 2012-02-21 Broadband Discovery Systems, Inc. Self-calibrating magnetic field monitor
JP5206487B2 (ja) * 2009-02-25 2013-06-12 富士通セミコンダクター株式会社 半導体集積回路の制御方法および半導体集積回路
KR101204205B1 (ko) * 2011-05-13 2012-11-26 삼성전기주식회사 관성 센서 구동 장치 및 방법
JP5957242B2 (ja) * 2012-03-01 2016-07-27 アズビル株式会社 超音波流量計簡易診断装置
US8943377B2 (en) * 2012-08-15 2015-01-27 International Business Machines Corporation On-chip detection of types of operations tested by an LBIST

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1136460C (zh) * 1998-03-31 2004-01-28 株式会社日立制作所 电流积算值检测装置和电流检测装置及采用它们的电池组
TW559970B (en) * 2001-04-05 2003-11-01 Kawasaki Microelectronics Inc Test circuit, semiconductor product wafer having the test circuit, and method of monitoring manufacturing process using the test circuit
TW200704946A (en) * 2005-06-15 2007-02-01 Cypress Semiconductor Corp System and method for monitoring a power supply level
US20080103705A1 (en) * 2006-10-27 2008-05-01 Dirk Hammerschmidt Online Testing Of A Signal Path By Means Of At Least Two Test Signals
TW200900713A (en) * 2007-06-27 2009-01-01 Advantest Corp Detection apparatus and test apparatus
TW201200888A (en) * 2010-06-25 2012-01-01 Princeton Technology Corp Controlling circuit used for analog measure module and controlling module thereof
TW201222214A (en) * 2010-11-23 2012-06-01 Samsung Mobile Display Co Ltd Power converter, display device including power converter, system including display device, and method of driving display device
US20120218005A1 (en) * 2011-02-25 2012-08-30 Qualcomm Incorporated Semiconductor Device Having On-Chip Voltage Regulator

Also Published As

Publication number Publication date
TW201807417A (zh) 2018-03-01
JP6883482B2 (ja) 2021-06-09
KR20180023852A (ko) 2018-03-07
KR102303877B1 (ko) 2021-09-17
JP2018036252A (ja) 2018-03-08

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