KR102303877B1 - 센서 회로 - Google Patents

센서 회로 Download PDF

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Publication number
KR102303877B1
KR102303877B1 KR1020170107292A KR20170107292A KR102303877B1 KR 102303877 B1 KR102303877 B1 KR 102303877B1 KR 1020170107292 A KR1020170107292 A KR 1020170107292A KR 20170107292 A KR20170107292 A KR 20170107292A KR 102303877 B1 KR102303877 B1 KR 102303877B1
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KR
South Korea
Prior art keywords
signal
circuit
control circuit
physical quantity
clock control
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KR1020170107292A
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English (en)
Korean (ko)
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KR20180023852A (ko
Inventor
도모키 히키치
미노루 아리야마
히로노리 야노
Original Assignee
에이블릭 가부시키가이샤
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Publication of KR20180023852A publication Critical patent/KR20180023852A/ko
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Publication of KR102303877B1 publication Critical patent/KR102303877B1/ko
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3187—Built-in tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2829—Testing of circuits in sensor or actuator systems

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Measuring Magnetic Variables (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Electronic Switches (AREA)
KR1020170107292A 2016-08-26 2017-08-24 센서 회로 Active KR102303877B1 (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JPJP-P-2016-165827 2016-08-26
JP2016165827 2016-08-26
JPJP-P-2017-132422 2017-07-06
JP2017132422A JP6883482B2 (ja) 2016-08-26 2017-07-06 センサ回路

Publications (2)

Publication Number Publication Date
KR20180023852A KR20180023852A (ko) 2018-03-07
KR102303877B1 true KR102303877B1 (ko) 2021-09-17

Family

ID=61567306

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020170107292A Active KR102303877B1 (ko) 2016-08-26 2017-08-24 센서 회로

Country Status (3)

Country Link
JP (1) JP6883482B2 (enExample)
KR (1) KR102303877B1 (enExample)
TW (1) TWI701444B (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7465173B2 (ja) 2020-08-03 2024-04-10 エイブリック株式会社 磁気センサ回路
JP7641796B2 (ja) 2021-03-30 2025-03-07 エイブリック株式会社 センサ装置

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002090328A (ja) 2000-09-14 2002-03-27 Riken Keiki Co Ltd 熱線式ガスセンサーを用いたガス検知警報装置
JP2007322442A (ja) 2007-09-07 2007-12-13 Matsushita Electric Ind Co Ltd 流量計測装置
JP2008145400A (ja) 2006-12-13 2008-06-26 Sanyo Electric Co Ltd 電源電圧検出回路
US20100218057A1 (en) 2009-02-25 2010-08-26 Fujitsu Microelectronics Limited Control method for semiconductor integrated circuit and semiconductor integrated circuit
JP2013181826A (ja) 2012-03-01 2013-09-12 Azbil Corp 超音波流量計簡易診断装置
US20140053034A1 (en) 2012-08-15 2014-02-20 International Business Machines Corporation On-chip detection of types of operations tested by an lbist

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6337270A (ja) * 1986-07-31 1988-02-17 Fujitsu Ltd 半導体装置
JPH1116395A (ja) * 1997-06-25 1999-01-22 Mitsubishi Electric Corp 半導体記憶装置
TW419592B (en) * 1998-03-31 2001-01-21 Hitachi Maxell Current accumulating value detecting apparatus, current detecting apparatus and the battery set used
TW559970B (en) * 2001-04-05 2003-11-01 Kawasaki Microelectronics Inc Test circuit, semiconductor product wafer having the test circuit, and method of monitoring manufacturing process using the test circuit
JP2006153699A (ja) * 2004-11-30 2006-06-15 Matsushita Electric Ind Co Ltd 磁界検出装置
US7295051B2 (en) * 2005-06-15 2007-11-13 Cypress Semiconductor Corp. System and method for monitoring a power supply level
DE102006050832B4 (de) * 2006-10-27 2012-07-26 Infineon Technologies Ag In-Betrieb-Test eines Signalpfades mittels wenigstens zweier Testsignale
DE112007003570T5 (de) * 2007-06-27 2010-08-26 Advantest Corp. Erfassungsgerät und Prüfgerät
JP4786608B2 (ja) * 2007-07-30 2011-10-05 パナソニック株式会社 磁界検出装置
US8120354B2 (en) * 2008-05-01 2012-02-21 Broadband Discovery Systems, Inc. Self-calibrating magnetic field monitor
TWI408390B (zh) * 2010-06-25 2013-09-11 Princeton Technology Corp 用於類比量測模組之控制電路與相關控制模組
KR101254263B1 (ko) * 2010-11-23 2013-04-12 삼성디스플레이 주식회사 전원 변환기, 직류-직류 변환기를 포함하는 표시 장치, 표시 장치를 포함하는 시스템 및 표시 장치의 구동 방법
US8760217B2 (en) * 2011-02-25 2014-06-24 Qualcomm Incorporated Semiconductor device having on-chip voltage regulator
KR101204205B1 (ko) * 2011-05-13 2012-11-26 삼성전기주식회사 관성 센서 구동 장치 및 방법

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002090328A (ja) 2000-09-14 2002-03-27 Riken Keiki Co Ltd 熱線式ガスセンサーを用いたガス検知警報装置
JP2008145400A (ja) 2006-12-13 2008-06-26 Sanyo Electric Co Ltd 電源電圧検出回路
JP2007322442A (ja) 2007-09-07 2007-12-13 Matsushita Electric Ind Co Ltd 流量計測装置
US20100218057A1 (en) 2009-02-25 2010-08-26 Fujitsu Microelectronics Limited Control method for semiconductor integrated circuit and semiconductor integrated circuit
JP2013181826A (ja) 2012-03-01 2013-09-12 Azbil Corp 超音波流量計簡易診断装置
US20140053034A1 (en) 2012-08-15 2014-02-20 International Business Machines Corporation On-chip detection of types of operations tested by an lbist

Also Published As

Publication number Publication date
TW201807417A (zh) 2018-03-01
JP6883482B2 (ja) 2021-06-09
KR20180023852A (ko) 2018-03-07
TWI701444B (zh) 2020-08-11
JP2018036252A (ja) 2018-03-08

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