JP6881923B2 - 部品を基板上に取り付ける装置 - Google Patents
部品を基板上に取り付ける装置 Download PDFInfo
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- 239000000758 substrate Substances 0.000 claims description 57
- 230000003287 optical effect Effects 0.000 claims description 33
- 238000001514 detection method Methods 0.000 claims description 7
- 239000000463 material Substances 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 230000008901 benefit Effects 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/04—Mounting of components, e.g. of leadless components
- H05K13/046—Surface mounting
- H05K13/0465—Surface mounting by soldering
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/008—Systems specially adapted to form image relays or chained systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/10—Beam splitting or combining systems
- G02B27/14—Beam splitting or combining systems operating by reflection only
- G02B27/149—Beam splitting or combining systems operating by reflection only using crossed beamsplitting surfaces, e.g. cross-dichroic cubes or X-cubes
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/18—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form
- G05B19/406—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by monitoring or safety
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67144—Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/75—Apparatus for connecting with bump connectors or layer connectors
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N7/00—Television systems
- H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
- H05K13/0812—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines the monitoring devices being integrated in the mounting machine, e.g. for monitoring components, leads, component placement
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
- H05K13/0815—Controlling of component placement on the substrate during or after manufacturing
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/45—Nc applications
- G05B2219/45031—Manufacturing semiconductor wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
- H01L2224/7565—Means for transporting the components to be connected
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
- H01L2224/757—Means for aligning
- H01L2224/75753—Means for optical alignment, e.g. sensors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
- H01L2224/758—Means for moving parts
- H01L2224/75821—Upper part of the bonding apparatus, i.e. bonding head
- H01L2224/75824—Translational mechanism
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Optics & Photonics (AREA)
- Operations Research (AREA)
- Human Computer Interaction (AREA)
- Automation & Control Theory (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Supply And Installment Of Electrical Components (AREA)
- Wire Bonding (AREA)
- Die Bonding (AREA)
Description
α<90°−arcsin(n(空気)/n(偏向プリズム18))
ここで、n(空気)は、空気の屈折率を示し、n(偏向プリズム18)は、偏向プリズム18の材料の屈折率を示している。
β<90°−arcsin(n(空気)/n(偏向プリズム24))
−ボンディングヘッドに把持されている部品の正確な位置及び基板の所定の部分の正確な位置を求めるためには1個のカメラだけが必要である。
−第1の光偏向システムは、カメラの光軸をボンディングヘッドの把持軸線に近づけ、したがって、機械の動作範囲を広げる。
−第1の光偏向システムは、部品の下側からカメラまでの光路長を短くし、したがって、カメラの焦点面の調整に必要な高さH1と高さH2との差を少なくすることにつながる。
−第2の光偏向システムによって、記録のためにボンディングヘッドを停止させる必要なしに、移動中の部品の下側の記録が可能になる。これは、部品が第2の光偏向システムの所定の動作領域内に位置している限り、部品の下側の画像が見かけ上は停止しているからである。
−第1の光偏向システムは、ボンディングヘッドに高い剛性で接続されており、第2の光偏向システムは、機械上で静止しているように配置されている。したがって、一方または他方の偏向システムまたはそれらの一部をボンディングプロセス中に変位させる必要はない。
−高さH1及びH2は、要素24又は要素30、31、及び32の形状寸法及び材料の選択によって取り付け装置の特定の要件に対して調整可能である。
Claims (5)
- 部品(1)を基板(3)上に取り付ける装置であって、
前記基板(3)用の支持部(4)であって、表面が基板平面(14)を定めている前記支持部(4)と、
ボンディングヘッド(6)を備えているピックアンドプレースシステム(5)であって、取り上げ場所で前記ボンディングヘッド(6)を使用して前記部品(1)を取り上げて、前記部品(1)を前記基板(3)の所定の部分(2)上に配置するように設定されているピックアンドプレースシステム(5)と、
前記ボンディングヘッド(6)に保持されている前記部品(1)の位置を検出し、また、前記部品(1)を取り付ける前記基板(3)の前記所定の部分(2)の位置を検出するカメラ(7)と、
第1の光偏向システム(8)と、
第2の光偏向システム(9)と、
を有し、
前記カメラ(7)は光軸(16)を有し、
前記ピックアンドプレースシステム(5)は、前記第1の光偏向システム(8)、前記カメラ(7)、及び前記ボンディングヘッド(6)が締結されている変位可能キャリッジ(13)を有し、
前記第2の光偏向システム(9)は、前記装置上に静止態様で配置されており、
前記第1の光偏向システム(8)及び前記カメラ(7)は前記基板(3)の前記所定の部分(2)の画像を記録する第1の画像検出システムを構成し、前記第1の画像検出システムの物体側光軸(17)は前記ボンディングヘッド(6)の把持軸線(15)と前記カメラ(7)の光軸(16)との間の距離よりも短い、前記ボンディングヘッド(6)の前記把持軸線(15)からの距離(D)の位置で延びており、
前記第1の光偏向システム(8)、前記第2の光偏向システム(9)、及び前記カメラ(7)は、前記部品(1)の下側の画像を記録する第2の画像検出システムを構成し、
前記装置は、前記部品(1)の画像の記録のために、前記第2の光偏向システム(9)の上方での移動中に前記部品(1)の下側が前記カメラ(7)の焦点面内に位置するように、前記第2の光偏向システム(9)の上方での、前記基板平面(14)の上方の所定の高さH1での前記部品(1)の前記取り上げ場所から前記基板(3)の前記所定の部分(2)までの搬送の間に、前記キャリッジ(13)を移動するようにプログラムされており、
前記基板(3)の前記所定の部分(2)の画像の記録のために、前記基板(3)の前記所定の部分(2)が前記カメラ(7)の前記焦点面内に位置するように、前記キャリッジ(13)を前記基板平面(14)の上方の所定の高さH2に持ち上げるようにプログラムされており、2個の前記高さH1及び前記高さH2は、前記部品(1)の下側と前記カメラ(7)との間の光線経路の光学的距離と前記基板(3)の前記所定の部分(2)と前記カメラ(7)との間の光線経路の光学的距離とが等しい大きさになるように寸法が設定されている、装置。 - 前記第1の光偏向システム(8)は、偏向プリズム(18)と鏡(19)とを有している、請求項1に記載の装置。
- 前記第1の光偏向システム(8)は、2個の鏡(19、23)を有している、請求項1に記載の装置。
- 前記第2の光偏向システム(9)は、偏向プリズム(24)を有していて、前記偏向プリズム(24)は断面が2等辺三角形である、請求項1から3のいずれか1項に記載の装置。
- 前記第2の光偏向システム(9)は、ビームスプリッタキューブ(30)と、5角形プリズム(31)と、前記ビームスプリッタキューブ(30)と前記5角形プリズム(31)との間に継ぎ目なしに配置されている光学的透明体(32)とを有している、請求項1から3のいずれか1項に記載の装置。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CH01401/15 | 2015-09-28 | ||
CH01401/15A CH711570B1 (de) | 2015-09-28 | 2015-09-28 | Vorrichtung für die Montage von Bauelementen auf einem Substrat. |
Publications (3)
Publication Number | Publication Date |
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JP2017069554A JP2017069554A (ja) | 2017-04-06 |
JP2017069554A5 JP2017069554A5 (ja) | 2019-09-19 |
JP6881923B2 true JP6881923B2 (ja) | 2021-06-02 |
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Application Number | Title | Priority Date | Filing Date |
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JP2016178030A Active JP6881923B2 (ja) | 2015-09-28 | 2016-09-12 | 部品を基板上に取り付ける装置 |
Country Status (11)
Country | Link |
---|---|
US (1) | US10288413B2 (ja) |
JP (1) | JP6881923B2 (ja) |
KR (1) | KR102491721B1 (ja) |
CN (1) | CN106559977B (ja) |
CH (1) | CH711570B1 (ja) |
DE (1) | DE102016116235B4 (ja) |
FR (1) | FR3041860B1 (ja) |
MX (1) | MX365047B (ja) |
MY (1) | MY178737A (ja) |
SG (1) | SG10201607243PA (ja) |
TW (1) | TWI700515B (ja) |
Families Citing this family (9)
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US9929121B2 (en) * | 2015-08-31 | 2018-03-27 | Kulicke And Soffa Industries, Inc. | Bonding machines for bonding semiconductor elements, methods of operating bonding machines, and techniques for improving UPH on such bonding machines |
CH711570B1 (de) | 2015-09-28 | 2019-02-15 | Besi Switzerland Ag | Vorrichtung für die Montage von Bauelementen auf einem Substrat. |
JP7164314B2 (ja) * | 2017-04-28 | 2022-11-01 | ベシ スウィッツァーランド エージー | 部品を基板上に搭載する装置及び方法 |
US11011435B2 (en) * | 2018-11-20 | 2021-05-18 | Asm Technology Singapore Pte Ltd | Apparatus and method inspecting bonded semiconductor dice |
JP7299728B2 (ja) * | 2019-03-22 | 2023-06-28 | ファスフォードテクノロジ株式会社 | 半導体製造装置および半導体装置の製造方法 |
TWI775198B (zh) * | 2019-12-17 | 2022-08-21 | 日商新川股份有限公司 | 半導體裝置的製造裝置以及半導體裝置的製造方法 |
US20230266379A1 (en) * | 2020-08-24 | 2023-08-24 | Lg Electronics Inc. | Chip removing apparatus for repair process of micro-led display |
US12051604B2 (en) * | 2021-01-06 | 2024-07-30 | Samsung Electronics Co., Ltd. | Apparatus for manufacturing semiconductor device and method of manufacturing semiconductor device |
KR20230052969A (ko) * | 2021-01-18 | 2023-04-20 | 가부시키가이샤 신가와 | 위치 제어 장치, 위치 제어 방법, 위치 제어 프로그램을 저장한 기록 매체 및 본딩 장치 |
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JP4796461B2 (ja) * | 2006-09-05 | 2011-10-19 | ヤマハ発動機株式会社 | 実装機の部品管理装置および部品管理方法 |
KR101353470B1 (ko) | 2006-10-09 | 2014-01-22 | 삼성테크윈 주식회사 | 부품 실장기용 부품 인식 장치 |
NL1032761C2 (nl) * | 2006-10-27 | 2008-04-29 | Assembleon Bv | Inrichting geschikt voor het plaatsen van een component op een substraat. |
DE102010013505A1 (de) * | 2010-03-31 | 2011-10-06 | Rohwedder Ag | Vorrichtung zum Erfassen eines sich bewegenden Objektes |
JP2012008261A (ja) * | 2010-06-23 | 2012-01-12 | Hamamatsu Photonics Kk | 画像生成装置 |
JP5701067B2 (ja) * | 2011-01-06 | 2015-04-15 | 富士機械製造株式会社 | 部品補給時の案内装置 |
JP2014007328A (ja) * | 2012-06-26 | 2014-01-16 | Shibuya Kogyo Co Ltd | ボンディング装置 |
JP6120516B2 (ja) * | 2012-10-03 | 2017-04-26 | 富士機械製造株式会社 | 部品補給システム |
JP6093214B2 (ja) * | 2013-03-19 | 2017-03-08 | ヤマハ発動機株式会社 | 部品実装装置 |
CH711570B1 (de) | 2015-09-28 | 2019-02-15 | Besi Switzerland Ag | Vorrichtung für die Montage von Bauelementen auf einem Substrat. |
-
2015
- 2015-09-28 CH CH01401/15A patent/CH711570B1/de not_active IP Right Cessation
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2016
- 2016-08-31 DE DE102016116235.3A patent/DE102016116235B4/de active Active
- 2016-08-31 FR FR1658082A patent/FR3041860B1/fr active Active
- 2016-08-31 SG SG10201607243PA patent/SG10201607243PA/en unknown
- 2016-09-01 MY MYPI2016703193A patent/MY178737A/en unknown
- 2016-09-12 JP JP2016178030A patent/JP6881923B2/ja active Active
- 2016-09-26 MX MX2016012518A patent/MX365047B/es active IP Right Grant
- 2016-09-26 KR KR1020160122945A patent/KR102491721B1/ko active IP Right Grant
- 2016-09-26 CN CN201610885117.1A patent/CN106559977B/zh active Active
- 2016-09-26 TW TW105131023A patent/TWI700515B/zh active
- 2016-09-28 US US15/278,529 patent/US10288413B2/en active Active
Also Published As
Publication number | Publication date |
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DE102016116235A1 (de) | 2017-03-30 |
KR20170037837A (ko) | 2017-04-05 |
CH711570A1 (en) | 2017-03-31 |
CN106559977B (zh) | 2020-02-07 |
TWI700515B (zh) | 2020-08-01 |
KR102491721B1 (ko) | 2023-01-25 |
CH711570B1 (de) | 2019-02-15 |
SG10201607243PA (en) | 2017-04-27 |
FR3041860A1 (fr) | 2017-03-31 |
CN106559977A (zh) | 2017-04-05 |
MY178737A (en) | 2020-10-20 |
FR3041860B1 (fr) | 2018-11-16 |
JP2017069554A (ja) | 2017-04-06 |
DE102016116235B4 (de) | 2021-01-07 |
US10288413B2 (en) | 2019-05-14 |
TW201721222A (zh) | 2017-06-16 |
US20170092613A1 (en) | 2017-03-30 |
MX2016012518A (es) | 2017-03-27 |
MX365047B (es) | 2019-03-29 |
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