JP6842443B2 - プラズマ処理装置及びプラズマを生成する方法 - Google Patents
プラズマ処理装置及びプラズマを生成する方法 Download PDFInfo
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- JP6842443B2 JP6842443B2 JP2018119084A JP2018119084A JP6842443B2 JP 6842443 B2 JP6842443 B2 JP 6842443B2 JP 2018119084 A JP2018119084 A JP 2018119084A JP 2018119084 A JP2018119084 A JP 2018119084A JP 6842443 B2 JP6842443 B2 JP 6842443B2
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- Prior art keywords
- frequency power
- signal
- pulsed
- high frequency
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-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32174—Circuits specially adapted for controlling the RF discharge
- H01J37/32183—Matching circuits
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32137—Radio frequency generated discharge controlling of the discharge by modulation of energy
- H01J37/32146—Amplitude modulation, includes pulsing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32715—Workpiece holder
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
- H10P50/20—Dry etching; Plasma etching; Reactive-ion etching
- H10P50/24—Dry etching; Plasma etching; Reactive-ion etching of semiconductor materials
- H10P50/242—Dry etching; Plasma etching; Reactive-ion etching of semiconductor materials of Group IV materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/002—Cooling arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/32—Processing objects by plasma generation
- H01J2237/33—Processing objects by plasma generation characterised by the type of processing
- H01J2237/334—Etching
- H01J2237/3341—Reactive etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32623—Mechanical discharge control means
- H01J37/32642—Focus rings
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Mechanical Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Electromagnetism (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Plasma Technology (AREA)
- Drying Of Semiconductors (AREA)
- Chemical Vapour Deposition (AREA)
- Treatment Of Fiber Materials (AREA)
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018119084A JP6842443B2 (ja) | 2018-06-22 | 2018-06-22 | プラズマ処理装置及びプラズマを生成する方法 |
| PCT/JP2019/022954 WO2019244698A1 (ja) | 2018-06-22 | 2019-06-10 | プラズマ処理装置及びプラズマを生成する方法 |
| US16/645,188 US10978274B2 (en) | 2018-06-22 | 2019-06-10 | Plasma processing apparatus and method for generating plasma |
| CN201980004388.3A CN111052874B (zh) | 2018-06-22 | 2019-06-10 | 等离子体处理装置和生成等离子体的方法 |
| KR1020207006605A KR102723098B1 (ko) | 2018-06-22 | 2019-06-10 | 플라즈마 처리 장치 및 플라즈마를 생성하는 방법 |
| TW108120965A TWI812738B (zh) | 2018-06-22 | 2019-06-18 | 電漿處理裝置及電漿產生方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018119084A JP6842443B2 (ja) | 2018-06-22 | 2018-06-22 | プラズマ処理装置及びプラズマを生成する方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2019220435A JP2019220435A (ja) | 2019-12-26 |
| JP2019220435A5 JP2019220435A5 (https=) | 2021-02-04 |
| JP6842443B2 true JP6842443B2 (ja) | 2021-03-17 |
Family
ID=68983385
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018119084A Active JP6842443B2 (ja) | 2018-06-22 | 2018-06-22 | プラズマ処理装置及びプラズマを生成する方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US10978274B2 (https=) |
| JP (1) | JP6842443B2 (https=) |
| KR (1) | KR102723098B1 (https=) |
| CN (1) | CN111052874B (https=) |
| TW (1) | TWI812738B (https=) |
| WO (1) | WO2019244698A1 (https=) |
Families Citing this family (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10510575B2 (en) | 2017-09-20 | 2019-12-17 | Applied Materials, Inc. | Substrate support with multiple embedded electrodes |
| US11476145B2 (en) | 2018-11-20 | 2022-10-18 | Applied Materials, Inc. | Automatic ESC bias compensation when using pulsed DC bias |
| JP7451540B2 (ja) | 2019-01-22 | 2024-03-18 | アプライド マテリアルズ インコーポレイテッド | パルス状電圧波形を制御するためのフィードバックループ |
| US11508554B2 (en) | 2019-01-24 | 2022-11-22 | Applied Materials, Inc. | High voltage filter assembly |
| KR102593142B1 (ko) * | 2020-05-19 | 2023-10-25 | 세메스 주식회사 | 기판 처리 장치 및 그의 페라이트 코어 온도 제어 방법 |
| US11462389B2 (en) | 2020-07-31 | 2022-10-04 | Applied Materials, Inc. | Pulsed-voltage hardware assembly for use in a plasma processing system |
| JP7479255B2 (ja) * | 2020-09-14 | 2024-05-08 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| WO2022072234A1 (en) * | 2020-09-29 | 2022-04-07 | Lam Research Corporation | Synchronization of rf generators |
| US11798790B2 (en) | 2020-11-16 | 2023-10-24 | Applied Materials, Inc. | Apparatus and methods for controlling ion energy distribution |
| US11901157B2 (en) | 2020-11-16 | 2024-02-13 | Applied Materials, Inc. | Apparatus and methods for controlling ion energy distribution |
| US11495470B1 (en) | 2021-04-16 | 2022-11-08 | Applied Materials, Inc. | Method of enhancing etching selectivity using a pulsed plasma |
| US11791138B2 (en) | 2021-05-12 | 2023-10-17 | Applied Materials, Inc. | Automatic electrostatic chuck bias compensation during plasma processing |
| US11948780B2 (en) | 2021-05-12 | 2024-04-02 | Applied Materials, Inc. | Automatic electrostatic chuck bias compensation during plasma processing |
| US11967483B2 (en) | 2021-06-02 | 2024-04-23 | Applied Materials, Inc. | Plasma excitation with ion energy control |
| US12525433B2 (en) | 2021-06-09 | 2026-01-13 | Applied Materials, Inc. | Method and apparatus to reduce feature charging in plasma processing chamber |
| US12525441B2 (en) | 2021-06-09 | 2026-01-13 | Applied Materials, Inc. | Plasma chamber and chamber component cleaning methods |
| US12148595B2 (en) | 2021-06-09 | 2024-11-19 | Applied Materials, Inc. | Plasma uniformity control in pulsed DC plasma chamber |
| US11810760B2 (en) | 2021-06-16 | 2023-11-07 | Applied Materials, Inc. | Apparatus and method of ion current compensation |
| US11569066B2 (en) | 2021-06-23 | 2023-01-31 | Applied Materials, Inc. | Pulsed voltage source for plasma processing applications |
| US11776788B2 (en) | 2021-06-28 | 2023-10-03 | Applied Materials, Inc. | Pulsed voltage boost for substrate processing |
| US11476090B1 (en) | 2021-08-24 | 2022-10-18 | Applied Materials, Inc. | Voltage pulse time-domain multiplexing |
| US12106938B2 (en) | 2021-09-14 | 2024-10-01 | Applied Materials, Inc. | Distortion current mitigation in a radio frequency plasma processing chamber |
| US11694876B2 (en) * | 2021-12-08 | 2023-07-04 | Applied Materials, Inc. | Apparatus and method for delivering a plurality of waveform signals during plasma processing |
| US11990319B2 (en) * | 2022-01-05 | 2024-05-21 | Applied Materials, Inc. | Methods and apparatus for processing a substrate |
| US11972924B2 (en) | 2022-06-08 | 2024-04-30 | Applied Materials, Inc. | Pulsed voltage source for plasma processing applications |
| US12315732B2 (en) | 2022-06-10 | 2025-05-27 | Applied Materials, Inc. | Method and apparatus for etching a semiconductor substrate in a plasma etch chamber |
| US12586768B2 (en) | 2022-08-10 | 2026-03-24 | Applied Materials, Inc. | Pulsed voltage compensation for plasma processing applications |
| US12272524B2 (en) | 2022-09-19 | 2025-04-08 | Applied Materials, Inc. | Wideband variable impedance load for high volume manufacturing qualification and on-site diagnostics |
| US12111341B2 (en) | 2022-10-05 | 2024-10-08 | Applied Materials, Inc. | In-situ electric field detection method and apparatus |
| JP2024062195A (ja) * | 2022-10-24 | 2024-05-09 | 東京エレクトロン株式会社 | 周波数可変電源及びプラズマ処理装置 |
Family Cites Families (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10241895A (ja) | 1996-11-04 | 1998-09-11 | Applied Materials Inc | プラズマシース発生高調波をフィルタリングすることによるプラズマプロセス効率の改善 |
| JP3629705B2 (ja) | 1997-06-06 | 2005-03-16 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| JP4120051B2 (ja) * | 1998-07-31 | 2008-07-16 | 株式会社日立国際電気 | 高周波共振装置 |
| JP3027572B1 (ja) * | 1998-12-24 | 2000-04-04 | 日本高周波株式会社 | プラズマ処理用インピーダンス測定装置 |
| WO2005015964A1 (ja) * | 2003-08-07 | 2005-02-17 | Hitachi Kokusai Electric Inc. | 基板処理装置及び基板処理方法 |
| JP3998630B2 (ja) * | 2003-11-19 | 2007-10-31 | 株式会社東芝 | 電力増幅器 |
| JP4879548B2 (ja) * | 2005-09-30 | 2012-02-22 | 株式会社ダイヘン | 高周波電源装置 |
| JP2007134849A (ja) * | 2005-11-09 | 2007-05-31 | Nagano Japan Radio Co | 増幅装置 |
| JP5210659B2 (ja) * | 2008-02-28 | 2013-06-12 | 株式会社日立ハイテクノロジーズ | プラズマ処理装置 |
| JP5319150B2 (ja) * | 2008-03-31 | 2013-10-16 | 東京エレクトロン株式会社 | プラズマ処理装置及びプラズマ処理方法及びコンピュータ読み取り可能な記憶媒体 |
| JP4891384B2 (ja) * | 2009-12-10 | 2012-03-07 | 株式会社新川 | プラズマ発生装置 |
| JP5484375B2 (ja) * | 2011-02-17 | 2014-05-07 | 三菱電機株式会社 | プラズマ成膜装置及びプラズマ成膜方法 |
| JP2012174668A (ja) * | 2011-02-24 | 2012-09-10 | Mitsubishi Electric Corp | 高周波電力供給装置、プラズマ処理装置、及び半導体薄膜の製造方法 |
| JP5867701B2 (ja) * | 2011-12-15 | 2016-02-24 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| JP5808012B2 (ja) * | 2011-12-27 | 2015-11-10 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| US9462672B2 (en) * | 2012-02-22 | 2016-10-04 | Lam Research Corporation | Adjustment of power and frequency based on three or more states |
| US9171700B2 (en) * | 2012-06-15 | 2015-10-27 | COMET Technologies USA, Inc. | Plasma pulse tracking system and method |
| KR101768827B1 (ko) * | 2013-08-26 | 2017-08-17 | 가부시키가이샤 히다치 고쿠사이 덴키 | 플라즈마 생성용 전원 장치 및 플라즈마 생성용 전원 공급 방법 |
| JP6512962B2 (ja) * | 2014-09-17 | 2019-05-15 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| KR101677748B1 (ko) * | 2014-10-29 | 2016-11-29 | 삼성전자 주식회사 | 펄스 플라즈마 장치 및 펄스 플라즈마 장치 구동 방법 |
| CN105826154B (zh) | 2015-01-06 | 2017-12-19 | 北京北方华创微电子装备有限公司 | 针对脉冲射频电源的阻抗匹配方法及装置 |
| JP6396822B2 (ja) * | 2015-02-16 | 2018-09-26 | 東京エレクトロン株式会社 | プラズマ処理装置のサセプタの電位を制御する方法 |
| US9741539B2 (en) * | 2015-10-05 | 2017-08-22 | Applied Materials, Inc. | RF power delivery regulation for processing substrates |
| JP6541623B2 (ja) | 2016-06-20 | 2019-07-10 | 東京エレクトロン株式会社 | プラズマ処理装置、及び波形補正方法 |
| WO2018038398A1 (ko) * | 2016-08-25 | 2018-03-01 | 한국전기연구원 | 펄스 전원 보상 장치 및 이를 포함하는 고전압 펄스 전원 시스템. |
| JP6780007B2 (ja) * | 2016-09-28 | 2020-11-04 | 株式会社日立国際電気 | 高周波電源装置 |
| US10546724B2 (en) * | 2017-05-10 | 2020-01-28 | Mks Instruments, Inc. | Pulsed, bidirectional radio frequency source/load |
-
2018
- 2018-06-22 JP JP2018119084A patent/JP6842443B2/ja active Active
-
2019
- 2019-06-10 CN CN201980004388.3A patent/CN111052874B/zh active Active
- 2019-06-10 KR KR1020207006605A patent/KR102723098B1/ko active Active
- 2019-06-10 US US16/645,188 patent/US10978274B2/en active Active
- 2019-06-10 WO PCT/JP2019/022954 patent/WO2019244698A1/ja not_active Ceased
- 2019-06-18 TW TW108120965A patent/TWI812738B/zh active
Also Published As
| Publication number | Publication date |
|---|---|
| JP2019220435A (ja) | 2019-12-26 |
| TWI812738B (zh) | 2023-08-21 |
| US20200286714A1 (en) | 2020-09-10 |
| CN111052874B (zh) | 2023-02-28 |
| KR20210021441A (ko) | 2021-02-26 |
| KR102723098B1 (ko) | 2024-10-28 |
| TW202002727A (zh) | 2020-01-01 |
| CN111052874A (zh) | 2020-04-21 |
| US10978274B2 (en) | 2021-04-13 |
| WO2019244698A1 (ja) | 2019-12-26 |
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